Integrated circuit with improved battery protection

Claim 2

An integrated circuit, comprising: a power terminal, for connection to an external power supply; a battery terminal, for connection to a backup power supply, said battery terminal being directly connected to a first monocrystalline semiconductor region having a first conductivity type; said first region abutting a second monocrystalline semiconductor region having a second conductivity type which is opposite to said first conductivity type, said first and second regions defining a first junction therebetween; said second region being connected so that said first junction will be forward biased if the external power supply falls, so that the integrated circuit is being powered by said battery terminal; a second junction surrounding said first junction, said second junction being shorted out by an ohmic connection; whereby minority carriers which are injected in the vicinity of said first junction will be collected at said second junction.

Claim 3

The integrated circuit of claim 1, wherein said first region is completely enclosed, except for a surface for ohmic contact with said battery terminal, by said second region.

Claim 4

The integrated circuit of claim 1, wherein said first conductivity type is N-type, and said second conductivity type is P-type.

Claim 5

The integrated circuit of claim 1, wherein said first conductivity type is P-type, and said second conductivity type is N-type.

Claim 6

The integrated circuit of claim 1, wherein said first and second regions are respective doped portions of a common monocrystalline semiconductor body.

Claim 7

The integrated circuit of claim 1, wherein said integrated circuit is formed in an epitaxial semiconductor layer on a monocrystalline semiconductor body.

Claim 8

The integrated circuit of claim 1, wherein said second region is surrounded by a third region which has said first conductivity type, said second and third regions defining said second junction therebetween, said second and third regions being ohmically connected to each other.

Claim 9

The integrated circuit of claim 1, wherein said first region is surrounded by a third region which has said first conductivity type, said first and third regions defining said second junction therebetween, said first and third regions being ohmically connected to each other.

Claim 10

The integrated circuit of claim 1, wherein said ohmic connection which shorts out said second junction is also connected to a source of a substantially fixed reference voltage.

Claim 11

The integrated circuit of claim 1, wherein the entire length of said second junction is laterally flanked on two sides, at the surface of said semiconductor, by heavily doped diffusions which are ohmically connected to short out said second junction.

Claim 12

A CMOS integrated circuit, comprising: an extended region of N-type monocrystalline semiconductor material; a plurality of P-well regions within said extended region, and one or more N-channel field-effect transistors formed in ones of said P-well regions; one or more P-channel field-effect transistors formed in portions of said extended region; a power terminal, for connection to a positive external power supply voltage, said power terminal being operatively connected to said extended N-type region; a battery terminal, for connection to a positive backup power supply voltage, said battery terminal being connected to said extended region through a structure which includes: a first region which is P-type and which is directly connected to said battery terminal; a second region which is N-type and which surrounds said first region, said first and second regions defining a first junction therebetween; a third region which is P-type and which surrounds said second region, said second and third regions defining a second junction therebetween; said second and third regions being ohmically connected to each other and to said extended region; whereby minority carriers which are injected in the vicinity of said first junction will be collected at said second junction.

Claim 13

A CMOS integrated circuit, comprising: an extended region of N-type monocrystalline semiconductor material; a plurality of P-well regions within said extended region, and one or more N-channel field-effect transistors formed in ones of said P-well regions; one or more P-channel field-effect transistors formed in portions of said extended region; a power terminal, for connection to a positive external power supply voltage, said power terminal being operatively connected to said extended N-type region; a battery terminal, for connection to a positive backup power supply voltage, said battery terminal being connected to said extended region through a structure which includes: a first region which is P-type and which is directly connected to said battery terminal; a second region which is N-type and which surrounds said first region, said first and second regions defining a first junction therebetween; a third region which is P-type and which surrounds said second region, said second and third regions defining a second junction therebetween; said second and third regions being ohmically connected to each other and to said extended region; whereby minority carriers which are injected in the vicinity of said first junction will be collected at said second junction.

Claim 14

The integrated circuit of claim 11, wherein said first region is completely enclosed, except for a surface for ohmic contact with said battery terminal, by said second region.

Claim 15

The integrated circuit of claim 11, wherein said integrated circuit is formed in an epitaxial semiconductor layer on a monocrystalline semiconductor body.

Claim 16

The integrated circuit of claim 11, wherein said P-channel transistors are formed within N-well regions which are more heavily doped than said extended region.

Claim 17

The integrated circuit of claim 11, wherein said P-channel transistors are formed within a portion of said extended region.

Claim 18

The integrated circuit of claim 11, wherein said first region is more heavily doped than said third region.

Claim 19

The integrated circuit of claim 11, wherein said second region includes a shallow heavily doped N-type diffusion, at the surface thereof, which runs substantially parallel to said first junction for the whole length of said first junction.

Claim 20

The integrated circuit of claim 11, wherein said second region includes a shallow heavily doped N-type diffusion, at the surface thereof, which runs substantially parallel to said second junction for the whole length of said second junction.

Claim 21

The integrated circuit of claim 11, wherein said third region includes a shallow heavily doped P-type diffusion, at the surface thereof, which runs substantially parallel to said second junction for the whole length of said second junction.