Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
188 words
A highly integrated circuit, especially for a multi-chip module, comprising: a flat semiconductor chip with a chip area and a plurality of chip connections arranged with a first grid spacing; a flat substrate with a top side and an underside and a substrate area which is greater than the chip area; on the top side of the substrate a mounting area, on which the semiconductor chip is arranged; the substrate projecting on all sides with a substrate edge beyond the semiconductor chip; and there being provided on the top side of the substrate first connecting areas with a second grid spacing which is essentially equal to the first grid spacing; and the chip connections being conductively connected to the first connecting areas; wherein the circuit is surrounded by an additional substrate edge provided for testing the semiconductor chip, where said additional substrate edge carries conductor tracks and test connections, extends beyond the chip area, and is separable after testing; and the circuit extends to a substrate area which is greater than the chip area, so that the substrate edge is of a width of only a few millimeters.
Claim 2
Dependent Claim
188 words
A highly integrated circuit, especially for a multi-chip module, comprising: a flat semiconductor chip with a chip area and a plurality of chip connections arranged with a first grid spacing; a flat substrate with a top side and an underside and a substrate area which is greater than the chip area; on the top side of the substrate a mounting area, on which the semiconductor chip is arranged; the substrate projecting on all sides with a substrate edge beyond the semiconductor chip; and there being provided on the top side of the substrate first connecting areas with a second grid spacing which is essentially equal to the first grid spacing; and the chip connections being conductively connected to the first connecting areas; wherein the circuit is surrounded by an additional substrate edge provided for testing the semiconductor chip, where said additional substrate edge carries conductor tracks and test connections, extends beyond the chip area, and is separable after testing; and the circuit extends to a substrate area which is greater than the chip area, so that the substrate edge is of a width of only a few millimeters.
Claim 3
Dependent Claim
148 words
A highly integrated circuit, especially for a multi-chip module, comprising: a flat semiconductor chip with a chip area and a plurality of chip connections arranged with a first grid spacing; a flat substrate with a top side and an underside and a substrate area which is greater than the chip area; on the top side of the substrate a mounting area, on which the semiconductor chip is arranged; the substrate projecting on all sides with a substrate edge beyond the semiconductor chip; and there being provided on the top side of the substrate first connecting areas with a second grid spacing which is essentially equal to the first grid spacing; and the chip connections being conductively connected to the first connecting areas; wherein the substrate edge has an edge width less than 2 millimeters; and connections for testing the semiconductor chip are provided outside of the substrate edge.
Claim 4
Dependent Claim
148 words
A highly integrated circuit, especially for a multi-chip module, comprising: a flat semiconductor chip with a chip area and a plurality of chip connections arranged with a first grid spacing; a flat substrate with a top side and an underside and a substrate area which is greater than the chip area; on the top side of the substrate a mounting area, on which the semiconductor chip is arranged; the substrate projecting on all sides with a substrate edge beyond the semiconductor chip; and there being provided on the top side of the substrate first connecting areas with a second grid spacing which is essentially equal to the first grid spacing; and the chip connections being conductively connected to the first connecting areas; wherein the substrate edge has an edge width less than 2 millimeters; and connections for testing the semiconductor chip are provided outside of the substrate edge.
Claim 5
Dependent Claim
57 words
A highly integrated circuit as claimed in claim 2, wherein on the top side of the substrate conductor tracks extend to the edges of the substrate starting from the first connecting areas; and there are provided at the edges of the substrate second connecting areas which are connected to the first connecting areas by the conductor tracks.
Claim 6
Dependent Claim
86 words
A highly integrated circuit as claimed in claim 2, wherein there are provided inside the mounting area in the substrate through-metallized through-holes which conductively connect the top side of the substrate to its underside, and have on the underside contact areas in the form of bumps; the through-holes are arranged with a third grid spacing which is considerably larger than the first grid spacing; and at least on the top side of the substrate conductor tracks extend to the through-holes starting from the first connecting areas.
Claim 7
Dependent Claim
39 words
A highly integrated circuit as claimed in either of claims 3 and 4, wherein the first connecting areas are connected to the chip connections by means of connecting wires and the semiconductor chip is covered by a sealing compound.
Claim 8
Dependent Claim
32 words
A highly integrated circuit as claimed in either of claims 3 or 4, wherein the first connecting areas are arranged in mirror-image fashion to the chip connections and are soldered directly thereto.
Claim 9
Dependent Claim
18 words
A highly integrated circuit as claimed in claim 1, wherein the edge width is less than 2 mm.
Claim 10
Dependent Claim
57 words
A highly integrated circuit as claimed in claim 1, wherein on the top side of the substrate conductor tracks extend to the edges of the substrate starting from the first connecting areas; and there are provided at the edges of the substrate second connecting areas which are connected to the first connecting areas by the conductor tracks.
Claim 11
Dependent Claim
86 words
A highly integrated circuit as claimed in claim 1, wherein there are provided inside the mounting area in the substrate through-metallized through-holes which conductively connect the top side of the substrate to its underside, and have on the underside contact areas in the form of bumps; the through-holes are arranged with a third grid spacing which is considerably larger than the first grid spacing; and at least on the top side of the substrate conductor tracks extend to the through-holes starting from the first connecting areas.
Claim 12
Dependent Claim
35 words
A highly integrated circuit as claimed in claim 8, wherein the first connecting areas are connected to the chip connections by means of connecting wires and the semiconductor chip is covered by a sealing compound.
Claim 13
Dependent Claim
35 words
A highly integrated circuit as claimed in claim 9, wherein the first connecting areas are connected to the chip connections by means of connecting wires and the semiconductor chip is covered by a sealing compound.
Claim 14
Dependent Claim
27 words
A highly integrated circuit as claimed in claim 9, wherein the first connecting areas are arranged in mirror-image fashion to the chip connections are soldered directly thereto.
Claim 15
Dependent Claim
28 words
A highly integrated circuit as claimed in claim 9, wherein the first connecting areas are arranged in mirror-image fashion to the chip connections and are soldered directly thereto.