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US4963970A Expired / Lapsed US ⏱️ 0.0 years remaining

Vertical MOSFET device having protector

Assignee: Nissan Motor Co Ltd
•
Filing: 1989-01-04
•
Granted: 1990-10-16
•
Expires: 2009-01-04
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Abstract

Abstract A vertical MOSFET device including a semiconductor layer having a first conductivity type, in which a base region having a second conductivity type is formed in the semiconductor layer, and a source region having the first conductivity type is formed in the base region, in which a gate electrode is formed at least on the above described base region via an insulating gate film to form a channel between the semiconductor layer and the source region, and a protector having PN or Schottky junction, which is formed between the source region and the gate electrode and is thermally contacted with at least one of the other members.

Inventors

  • 👤 Kraisorn Throngnumchai
  • 👤 Koichi Murakami

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 05:20
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/101; H10D84/141; H10D84/143; H10D89/00; H10D89/60; H10D89/601; H10D89/611

Claims Analysis

Total Claims: 24
Claim 1
Independent Claim 145 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a polycrystalline silicon film of the first conductivity type; and a protector formed of a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 2
Dependent Claim 145 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a polycrystalline silicon film of the first conductivity type; and a protector formed of a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 3
Dependent Claim 145 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a polycrystalline silicon film of the first conductive type; and a protector formed of a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 4
Dependent Claim 145 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a polycrystalline silicon film of the first conductive type; and a protector formed of a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 5
Dependent Claim 139 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a metal film; and a protector formed of a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 6
Dependent Claim 139 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a metal film; and a protector formed of a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 7
Dependent Claim 139 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a metal film; and a protector formed of a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 8
Dependent Claim 139 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface area of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region, the gate electrode comprising a metal film; and a protector formed of a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising the gate electrode, in contact with the insulating gate film, and a polycrystalline silicon film of the second conductivity type, the protector thermally contacting at least the base region and the semiconductor layer.
Claim 9
Dependent Claim 140 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a polycrystalline silicon film of the first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 10
Dependent Claim 140 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a polycrystalline silicon film of the first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 11
Dependent Claim 140 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a polycrystalline silicon film of the first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 12
Dependent Claim 140 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a polycrystalline silicon film of the first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 13
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a metal film formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 14
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a metal film formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 15
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a metal film formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 16
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed at least on the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type, formed in the base region, and a metal film formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 17
Dependent Claim 138 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a region of a first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 18
Dependent Claim 138 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a region of a first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 19
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a metal film formed on the base contact region, the protector thermally contacting the base region formed on the semiconductor layer.
Claim 20
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a PN junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a metal film formed on the base contact region, the protector thermally contacting the base region formed on the semiconductor layer.
Claim 21
Dependent Claim 138 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a region of a first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 22
Dependent Claim 138 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a region of a first conductivity type formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 23
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a metal film formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.
Claim 24
Dependent Claim 134 words
A vertical MOSFET device, comprising: a semiconductor layer of a first conductivity type; a base region of a second conductivity type formed in a surface portion of the semiconductor layer; a source region of the first conductivity type formed in the base region; a gate electrode formed on at least the base region and the semiconductor layer, via an insulating gate film interposed therebetween, to form a channel between the semiconductor layer and the source region; and a protector having a Schottky junction, the protector being formed between the source region and the gate electrode, the protector comprising a base contact region of the second conductivity type formed in the base region and a metal film formed on the base contact region, the protector thermally contacting the base region formed in the semiconductor layer.

References Cited (Backward Citations)

US4492974A Cited
JPS5884461A Cited
JPS58223369A Cited
JPS60258967A Cited
EP0215493A1 Cited
JPS6381984A Cited
JPH01114077A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-10-15 1994-04-16 1994-10-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-10-15 1998-04-16 1998-10-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-10-15 2002-04-16 2002-10-16 $7700.00 Window Closed / Lapsed

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