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Circuit board

Assignee: Toshiba Corp
•
Filing: 1989-01-24
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Granted: 1990-10-16
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Expires: 2009-01-24
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Abstract

Abstract Disclosed is an aluminum nitride thin film circuit board having an aluminum nitride substrate and a conductive thin film pattern formed on the substrate. The conductive thin film pattern has a multi-layer structure selected from the group consisting of Ti/Ni/Au, Ti/Pd/Au, Ti/Pt/Au, Ni/Au, Cr/Au, and Cr/Cu/Au, and a boundary layer of Al-N-M-O (M is Ti, Ni, or Cr) is formed between the substrate and the conductive thin film pattern. Since the boundary layer is formed, bonding properties between the substrate and the conductive thin film pattern are improved. In particular, when the boundary layer contains 0.02 to 30 atomic % of oxygen, a higher bonding strength can be obtained.

Inventors

  • 👤 Takaaki Yasumoto
  • 👤 Nobuo Iwase

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 18:13
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/38; H05K3/388; H10; H10W; H10W70/00; H10W70/60; H10W70/62; H10W70/66; H10W70/67; H10W70/69; H10W70/692; H05K1/00; H05K1/02; H05K1/03; H05K1/0306

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 68 words
An aluminum nitride thin film circuit board comprising an aluminum nitride substrate and a conductive thin film pattern formed on said substrate, wherein said conductive thin film pattern has a multi-layer structure selected from the group consisting of Ti/Ni/Au, Ti/Pd/Au, Ti/Pt/Au, Ni/Au, Cr/Au, and Cr/Cu/Au, and a boundary layer of Al-N-M-O (M is Ti, Ni, or Cr) is formed between said substrate and said conductive thin film pattern.
Claim 2
Dependent Claim 68 words
An aluminum nitride thin film circuit board comprising an aluminum nitride substrate and a conductive thin film pattern formed on said substrate, wherein said conductive thin film pattern has a multi-layer structure selected from the group consisting of Ti/Ni/Au, Ti/Pd/Au, Ti/Pt/Au, Ni/Au, Cr/Au, and Cr/Cu/Au, and a boundary layer of Al-N-M-O (M is Ti, Ni, or Cr) is formed between said substrate and said conductive thin film pattern.
Claim 3
Dependent Claim 19 words
A circuit board according to claim 1, wherein said boundary layer contains 0.02 to 30 atomic % of oxygen.
Claim 4
Dependent Claim 19 words
A circuit board according to claim 1, wherein said boundary layer has a thickness of 5 to 500 nm.
Claim 5
Dependent Claim 24 words
A circuit board according to claim 1, wherein said aluminum nitride substrate has an average linear surface roughness of not more than 800 nm.
Claim 6
Dependent Claim 26 words
A circuit board according to claim 1, wherein said aluminum nitride substrate comprises aluminum nitride crystals having an average particle size of 0.5 to 20 μm.
Claim 7
Dependent Claim 48 words
A circuit board according to claim 1, wherein said conductive thin film pattern comprises a bonding layer having a thickness of 10 to 900 nm, a barrier layer having a thickness of 50 to 1,000 nm, and a low-resistance layer having a thickness of 50 to 9,000 nm.
Claim 8
Dependent Claim 37 words
A circuit board according to claim 1, wherein said conductive thin film pattern comprises a bonding layer having a thickness of 10 to 900 nm and a low-resistance layer having a thickness of 50 to 9,000 nm.
Claim 9
Dependent Claim 43 words
An aluminum nitride thin film circuit board comprising an aluminum nitride substrate and a conductive thin film pattern formed on said substrate, wherein said conductive thin film pattern comprises a multi-layer structure selected from the group consisting of Ti/Ni/Au, Ni/Au, Cr/Au, and Cr/Cu/Au.
Claim 10
Dependent Claim 43 words
An aluminum nitride thin film circuit board comprising an aluminum nitride substrate and a conductive thin film pattern formed on said substrate, wherein said conductive thin film pattern comprises a multi-layer structure selected from the group consisting of Ti/Ni/Au, Ni/Au, Cr/Au, and Cr/Cu/Au.
Claim 11
Dependent Claim 24 words
A circuit board according to claim 8, wherein said aluminum nitride substrate has an average linear surface roughness of not more than 800 nm.
Claim 12
Dependent Claim 26 words
A circuit board according to claim 8, wherein said aluminum nitride substrate comprises aluminum nitride crystals having an average particle size of 0.5 to 20 μm.
Claim 13
Dependent Claim 48 words
A circuit board according to claim 8, wherein said conductive thin film pattern comprises a bonding layer having a thickness of 10 to 900 nm, a barrier layer having a thickness of 50 to 1,000 nm, and a low-resistance layer having a thickness of 50 to 9,000 nm.
Claim 14
Dependent Claim 37 words
A circuit board according to claim 8, wherein said conductive thin film pattern comprises a bonding layer having a thickness of 10 to 900 nm and a low-resistance layer having a thickness of 50 to 9,000 nm.

References Cited (Backward Citations)

US4470059A Cited
US4571610A Cited
US4477311A Cited
US4737757A Cited
US4724283A Cited
US4783716A Cited
JPS62182183A Cited
JPS62219693A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-10-15 1994-04-16 1994-10-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-10-15 1998-04-16 1998-10-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-10-15 2002-04-16 2002-10-16 $7700.00 Window Closed / Lapsed

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