US4963501A
Expired / Lapsed
US
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Method of fabricating semiconductor devices with sub-micron linewidths
Assignee: Skyworks Solutions Inc
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Filing: 1989-09-25
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Granted: 1990-10-16
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Expires: 2009-09-25
Abstract
Abstract Methods for reducing linewidths of Field Effect Transistors (FETs) and making FETs with 0.5 to 0.15 mu m effective gate lengths are used separately or in a combined process sequence, that combines enhancement/depletion mode and microwave Metal-Semiconductors FETs (MESFETs) on the same GaAs chip. Photoresist linewidths are used to form dummy or substitutional gates using optical lithography with no deliberate overexposures. The dummy gate may be used as a mask for N+ implantation. The photoresist linewidth is then reduced in its lateral basewidth while preserving its height to basewidth aspect ratio in an isotropic oxygen plasma etch. A nonconformal dielectric film of silicon monoxide is deposited over the photoresist linewidth patterns. Dielectric reverse liftoff of the SiO pattern transfer dielectric provides a self-aligned stencil mask with respect to the N+/N- interfaces. The SiO stencil is also a dielectric spacer with respect to the N+/N- interfaces. The implantation profile's spatial variation with respect to the dielectric spacer dimension can be engineered to fabricate a lightly doped drain (LDD) MESFET. Finally, a Microwave Enhancement Depletion Integrated Circuit (MEDIC) process sequence mixes low threshold voltage digital MESFETs with higher threshold voltage microwave MESFETs.
Inventors
- 👤 Frank J. Ryan
- 👤 James W. Penney
- 👤 Aditya K. Gupta
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 22:13
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/061; H10D30/0612; H10D30/0614; H10D30/60; H10D30/80; H10D30/87; H10D64/00; H10D64/01; H10D64/012; H10D64/0124; H10D64/0125; H10D64/20; H10D64/27; H10D64/311; H10D64/411; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0135; H10D84/02; H10D84/05; Y; Y10; Y10S; Y10S148/00; Y10S148/015; Y10S148/111; Y10S148/131; Y10S148/14; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/951
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
202 words
A method of fabricating a semiconductor device, comprising the steps of: implanting a first dose of ions into a selected region of a semiconductor substrate to form a lightly doped layer; positioning a photoresist mask over said substrate to form masked and unmasked areas; implanting a second dose of ions into said selected region to form a heavily doped layer below said unmasked areas while retaining said lightly doped layer below said masked areas; reducing a basewidth of said photoresist mask to a range of approximately 1.0 to 0.1 micron by oxygen plasma etching, thereby forming expanded unmasked areas; depositing a nonconforming dielectric layer atop said masked and expanded unmasked areas; lifting off said etched photoresist mask, thereby leaving said dielectric layer atop only said expanded unmasked areas; removing any remaining dielectric dogears with a buffered HF dip; depositing an anneal encapsulant, annealing the semiconductor device, and removing said anneal encapsulant; etching said dielectric layer to expose portions of said lightly doped and said heavily doped layers, said exposed portions of said lightly doped layer having a dimension in the range of approximately 1.0 to 0.1 micron; and depositing metallization layers to contact said exposed lightly doped and heavily doped layers, respectively.
Claim 2
Independent Claim
202 words
A method of fabricating a semiconductor device, comprising the steps of: implanting a first dose of ions into a selected region of a semiconductor substrate to form a lightly doped layer; positioning a photoresist mask over said substrate to form masked and unmasked areas; implanting a second dose of ions into said selected region to form a heavily doped layer below said unmasked areas while retaining said lightly doped layer below said masked areas; reducing a basewidth of said photoresist mask to a range of approximately 1.0 to 0.1 micron by oxygen plasma etching, thereby forming expanded unmasked areas; depositing a nonconforming dielectric layer atop said masked and expanded unmasked areas; lifting off said etched photoresist mask, thereby leaving said dielectric layer atop only said expanded unmasked areas; removing any remaining dielectric dogears with a buffered HF dip; depositing an anneal encapsulant, annealing the semiconductor device, and removing said anneal encapsulant; etching said dielectric layer to expose portions of said lightly doped and said heavily doped layers, said exposed portions of said lightly doped layer having a dimension in the range of approximately 1.0 to 0.1 micron; and depositing metallization layers to contact said exposed lightly doped and heavily doped layers, respectively.
Claim 3
Dependent Claim
30 words
The method of claim 1, wherein the first implanting step comprises implanting the first dose of ions in a GaAs substrate to form an N- layer in said selected region.
Claim 4
Dependent Claim
26 words
The method of claim 2, wherein the step of positioning a photoresist mask includes positioning said mask to form a dummy gate atop said N- layer.
Claim 5
Dependent Claim
35 words
The method of claim 3, wherein the second implanting step comprises implanting the second dose of ions to form an N+ layer below said unmasked areas while retaining said N- layer below said dummy gate.
Claim 6
Dependent Claim
20 words
The method of claim 4, wherein the step of oxygen plasma etching includes reducing the basewidth of said dummy gate.
Claim 7
Dependent Claim
20 words
The method of claim 5, wherein the step of depositing a nonconforming dielectric comprises depositing a layer of silicon monoxide.
Claim 8
Dependent Claim
20 words
The method of claim 6, wherein the step of depositing an anneal encapsulant comprises depositing a layer of silicon dioxide.
Claim 9
Dependent Claim
25 words
The method of claim 1, wherein said steps of implanting ions comprise implanting ions in a GaAs substrate having a surface film of silicon nitride.
Claim 10
Dependent Claim
50 words
The method of claim 1, wherein the step of oxygen plasma etching comprises a first etching of said photoresist mask before said implanting of the second dose of ions to form said heavily doped layer, and a second etching of said photoresist mask after formation of said heavily doped layer.
Claim 11
Independent Claim
244 words
A method of fabricating a MESFET having a gate length in the range of approximately 1.0 to 0.1 micron, comprising the steps of: implanting a first dose of ions into a selected region of a semiconductor substrate to form a lightly doped layer in said selected region; positioning a photoresist mask to form masked and unmasked areas over said selected region, said masked area including a dummy gate atop said lightly doped layer; implanting a second dose of ions into said selected region to form a heavily doped layer below said unmasked areas while retaining said lightly doped layer below said dummy gate; reducing a basewidth of said dummy gate to a range of approximately 1.0 to 0.1 micron by oxygen plasma etching of said photoresist mask, thereby forming an expanded unmasked area over said selected region; depositing a nonconforming dielectric layer atop said masked and expanded unmasked areas; lifting off said etched photoresist mask and dummy gate, thereby leaving said dielectric layer atop only said expanded unmasked area; removing any remaining dielectric dogears with a buffered HF dip; depositing an anneal encapsulant, annealing the implanted substrate, and removing said anneal encapsulant; etching said dielectric layer to expose portions of said lightly doped and said heavily doped layers, said exposed portions of said lightly doped layer forming a gate length in the range of approximately 1.0 to 0.1 micron; and depositing metallization layers to contact said exposed lightly doped and heavily doped layers, respectively.
Claim 12
Independent Claim
244 words
A method of fabricating a MESFET having a gate length in the range of approximately 1.0 to 0.1 micron, comprising the steps of: implanting a first dose of ions into a selected region of a semiconductor substrate to form a lightly doped layer in said selected region; positioning a photoresist mask to form masked and unmasked areas over said selected region, said masked area including a dummy gate atop said lightly doped layer; implanting a second dose of ions into said selected region to form a heavily doped layer below said unmasked areas while retaining said lightly doped layer below said dummy gate; reducing a basewidth of said dummy gate to a range of approximately 1.0 to 0.1 micron by oxygen plasma etching of said photoresist mask, thereby forming an expanded unmasked area over said selected region; depositing a nonconforming dielectric layer atop said masked and expanded unmasked areas; lifting off said etched photoresist mask and dummy gate, thereby leaving said dielectric layer atop only said expanded unmasked area; removing any remaining dielectric dogears with a buffered HF dip; depositing an anneal encapsulant, annealing the implanted substrate, and removing said anneal encapsulant; etching said dielectric layer to expose portions of said lightly doped and said heavily doped layers, said exposed portions of said lightly doped layer forming a gate length in the range of approximately 1.0 to 0.1 micron; and depositing metallization layers to contact said exposed lightly doped and heavily doped layers, respectively.
Claim 13
Dependent Claim
50 words
The method of claim 10, wherein the step of oxygen plasma etching comprises a first etching of said dummy gate before said implanting of the second dose of ions to form said heavily doped layer, and a second etching of said photoresist mask after formation of said heavily doped layer.
Claim 14
Dependent Claim
30 words
The method of claim 11, wherein the first implanting step comprises implanting the first dose of ions in a GaAs substrate to form an N- layer in said selected region.
Claim 15
Dependent Claim
35 words
The method of claim 12, wherein the second implanting step comprises implanting the second dose of ions to form an N+ layer below said unmasked areas while retaining said N- layer below said dummy gate.
Claim 16
Dependent Claim
20 words
The method of claim 13, wherein the step of depositing a nonconforming dielectric comprises depositing a layer of silicon monoxide.
Claim 17
Dependent Claim
20 words
The method of claim 14, wherein the step of depositing an anneal encapsulant comprises depositing a layer of silicon dioxide.
Claim 18
Dependent Claim
25 words
The method of claim 10, wherein said steps of implanting ions comprise implanting ions in a GaAs substrate having a surface film of silicon nitride.
Claim 19
Independent Claim
264 words
A method of fabricating microwave and digital transistors on the same GaAs substrate, comprising the steps of: implanting a first dose of ions into a selected region of the substrate to form a lightly doped layer; positioning a photoresist mask to form masked and unmasked areas over the substrate, said masked areas including dummy gates atop said lightly doped layer; implanting a second dose of ions to form a heavily doped layer below said unmasked areas while retaining said lightly doped layer below said dummy gates; reducing a basewidth of selected dummy gates to a range of approximately 1.0 to 0.1 micron by a first oxygen plasma etching of said photoresist mask, thereby forming expanded unmasked areas; depositing a nonconforming dielectric layer atop said masked and expanded unmasked areas; lifting off said etched photoresist mask and dummy gates, thereby leaving said dielectric layer atop only said expanded unmasked areas; removing any remaining dielectric dogears with a buffered HF dip; depositing an anneal encapsulant, annealing the implanted substrate, and removing said anneal encapsulant; etching first selected areas to expose portions of said lightly doped and said heavily doped layers, said exposed portion of said lightly doped layer forming a digital transistor gate, said gate having a length in the range of approximately 1.0 to 0.1 micron; etching second selected areas to form a recess in said lightly doped layer, said recess forming a microwave transistor gate having a length in the range of approximately 1.0 to 0.1 micron; and depositing metallization layers to contact said exposed portions of said doped layers and said gates, respectively.
Claim 20
Independent Claim
264 words
A method of fabricating microwave and digital transistors on the same GaAs substrate, comprising the steps of: implanting a first dose of ions into a selected region of the substrate to form a lightly doped layer; positioning a photoresist mask to form masked and unmasked areas over the substrate, said masked areas including dummy gates atop said lightly doped layer; implanting a second dose of ions to form a heavily doped layer below said unmasked areas while retaining said lightly doped layer below said dummy gates; reducing a basewidth of selected dummy gates to a range of approximately 1.0 to 0.1 micron by a first oxygen plasma etching of said photoresist mask, thereby forming expanded unmasked areas; depositing a nonconforming dielectric layer atop said masked and expanded unmasked areas; lifting off said etched photoresist mask and dummy gates, thereby leaving said dielectric layer atop only said expanded unmasked areas; removing any remaining dielectric dogears with a buffered HF dip; depositing an anneal encapsulant, annealing the implanted substrate, and removing said anneal encapsulant; etching first selected areas to expose portions of said lightly doped and said heavily doped layers, said exposed portion of said lightly doped layer forming a digital transistor gate, said gate having a length in the range of approximately 1.0 to 0.1 micron; etching second selected areas to form a recess in said lightly doped layer, said recess forming a microwave transistor gate having a length in the range of approximately 1.0 to 0.1 micron; and depositing metallization layers to contact said exposed portions of said doped layers and said gates, respectively.
Claim 21
Dependent Claim
97 words
The method of claim 17, further comprising the steps of: implanting the first dose of ions to form an N- layer; implanting the second dose of ions to form an N++ layer; implanting a third dose of ions to form an N+ layer; reducing a basewidth of second selected dummy gates to a range of approximately 1.0 to 0.1 micron by a second oxygen plasma etching of said photoresist mask, thereby forming further expanded unmasked areas; and depositing a layer of silicon monoxide atop said masked and further expanded unmasked areas to form said nonconforming dielectric layer.
Claim 22
Dependent Claim
30 words
The method of claim 18, further comprising the step of performing a preliminary oxygen plasma etch of said photoresist mask before said step of implanting the second dose of ions.
Claim 23
Dependent Claim
25 words
The method of claim 18, wherein said steps of implanting ions comprise implanting ions in a GaAs substrate having a surface film of silicon nitride.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1993-10-15 | 1994-04-16 | 1994-10-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-10-15 | 1998-04-16 | 1998-10-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-10-15 | 2002-04-16 | 2002-10-16 | $7700.00 | Window Closed / Lapsed |