Memory cell of a semiconductor memory device

Claim 2

A memory cell in a semiconductor memory device comprising a plurality of memory cells, said memory cell comprising: a substrate; a transistor comprising first and second transistor electrodes and a ring-shaped gate electrode; a capacitor comprising first and second capacitor electrodes; an isolating region for isolating said memory cell from adjacent ones of said memory cells; and a gate insulator formed around said first transistor electrode and on a major surface of said substrate; wherein: said first transistor electrode is formed in said major surface of said substrate; said ring-shaped gate electrode is formed around said first transistor electrode on said major surface of said substrate and is separated from said first electrode by said gate insulator, an inner circumference of said ring-shaped gate electrode overlapping an outer circumference of said first transistor electrode through said gate insulator; said second transistor electrode is formed around said ring-shaped gate electrode in said major surface of said substrate, an inner circumference of said second transistor electrode overlapping an outer circumference of said ring-shaped gate electrode through said gate insulator; said capacitor is formed between said isolating region and said ring-shaped gate electrode and is connected electrically to said transistor; and wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell.

Claim 3

A memory cell according to claim 1, wherein said second transistor electrode also forms said first capacitor electrode.

Claim 4

A memory cell according to claim 1, wherein said first and second capacitor electrodes respectively comprise first and second cell plates on said major surface of said substrate through an insulator.

Claim 5

A memory cell according to claim 3, wherein a part of said first and second cell plates overlap said ring-shaped gate electrode.

Claim 6

A memory cell according to claim 1, wherein a trench is formed in said major surface of said substrate around a center of said memory cell, said trench having side walls and a bottom, said capacitor being formed in said trench.

Claim 7

A memory cell according to claim 5, wherein said trench is formed between said isolating region and said first transistor electrode.

Claim 8

A memory cell according to claim 5, wherein said second transistor electrode is formed in said trench, said first capacitor electrode being formed continuously from said second transistor electrode.

Claim 9

A memory cell according to claim 5, wherein said isolating region is formed in said bottom of said trench, such that adjacent ones of said memory cells have portions thereof formed in said trench.

Claim 10

A memory cell according to claim 5, wherein said capacitor comprises first and second cell plates, said first cell plate being formed along side walls and a bottom of said trench, said second cell plate being formed over said first cell plate, a dielectric material being interposed between said first and second cell plates.

Claim 11

A memory cell according to claim 9, wherein said second cell plate forms part of a capacitor for an adjacent one of said memory cells.

Claim 12

A memory cell according to claim 5, wherein at least a part of said ring-shaped gate electrode is formed in said trench, said second transistor electrode being formed along one of said side walls of said trench, said first capacitor electrode being formed continuously from said second transistor electrode.

Claim 13

A memory cell according to claim 11, wherein said isolating region is formed in said bottom of said trench, such that adjacent ones of said memory cells have portions thereof formed in said trench.

Claim 14

A memory cell according to claim 1, wherein said first transistor electrode is a source electrode.

Claim 15

A memory cell according to claim 1, wherein a side of said isolating region facing said memory cell has a hexagonal shape.

Claim 16

A memory cell according to claim 14, wherein said hexagonal shape includes first through sixth vertices, said first and fourth vertices being equidistant from a center of said hexagonal shape, said second and fifth vertices being equidistant from the center but farther from the center than said first and fourth vertices, and said third and sixth vertices being equidistant from the center.

Claim 17

A memory cell according to claim 1, wherein an outer surface of said capacitor region contacting said isolating region is circular in shape.

Claim 18

A memory cell according to claim 1, wherein one end of said first capacitor electrode extends over the ring-shaped gate electrode and the other end of said first capacitor electrode extends over said isolating region.

Claim 19

A memory cell according to claim 5, wherein at least a portion of said capacitor is formed along one of said side walls of said trench, one of said first and second capacitor electrodes being connected to said second transistor electrode

Claim 20

A memory cell according to claim 5, wherein said second transistor electrode also forms said first capacitor electrode, and is electrically connected to said first transistor electrode through a channel region formed directly under said gate electrode when said transistor is turned on, said second transistor electrode being formed along at least a portion of one of said side walls of said trench.

Claim 21

A memory cell according to claim 19, wherein said second capacitor electrode comprises a cell plate which is disposed over said first capacitor electrode through a dielectric layer.

Claim 22

A memory cell according to claim 11, wherein said ring-shaped gate electrode has a first portion formed on the major surface of said substrate through said gate insulator and a second portion, connected to said first portion, formed on one of said side walls of said trench through said gate insulator.

Claim 23

A memory cell according to claim 11, wherein said first transistor electrode is formed so as to have one end exposed along one of said side walls of said trench, and one end of said ring-shaped gate electrode is disposed directly over the exposed end of said first transistor electrode and another end of said ring-shaped gate electrode is disposed directly over one end of said second transistor electrode.

Claim 24

A memory cell according to claim 5, wherein said first and second capacitor electrodes respectively comprise first and second cell plates, said first cell plate being formed over side walls and a bottom of said trench through a first dielectric layer, said second cell plate being formed over said first cell plate through a second dielectric layer.

Claim 25

A random access memory device comprising: a substrate; a plurality of rows and columns; a plurality of bit lines disposed in each of said columns over said substrate; a plurality of memory cells disposed in each of said columns and each of said rows, each of said memory cells comprising a transistor and a capacitor, said transistor comprising first and second transistor electrodes and a ring-shaped gate electrode, said first transistor electrode comprising a first diffused region disposed at a center of said each of said memory cells in said substrate and being connected to a corresponding bit line, said ring-shaped gate electrode being formed around said first transistor electrode on the major surface of said substrate through a gate insulator and being connected to a corresponding work line, said gate insulator being formed in said major surface of said substrate, an inner circumference of said ring-shaped gate electrode overlapping an outer circumference of said first transistor electrode through said gate insulator, said second transistor electrode being formed around said ring-shaped gate electrode, an inner circumference of said second transistor electrode overlapping an outer circumference of said ring-shaped gate electrode through said gate insulator, said capacitor comprising first and second capacitor electrodes and also being formed around said ring-shaped gate electrode; and wherein: said first transistor electrode is formed in said major surface of said substrate; said ring-shaped gate electrode is formed around said first transistor electrode on said major surface of said substrate and is separated from said first electrode by said gate insulator, an inner circumference of said ring-shaped gate electrode overlapping an outer circumference of said first transistor electrode through said gate insulator; said second transistor electrode is formed around said ring-shaped gate electrode in said major surface of said substrate, an inner circumference of said second transistor electrode overlapping an outer circumference of said ring-shaped gate electrode through said gate insulator; said capacitor is formed between said isolating region and said ring-shaped gate electrode and is connected electrically to said transistor; and wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell. an isolating region formed in the major surface of said substrate for isolating said memory cells from each other; wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell.

Claim 26

A random access memory device comprising: a substrate; a plurality of rows and columns; a plurality of bit lines disposed in each of said columns over said substrate; a plurality of memory cells disposed in each of said columns and each of said rows, each of said memory cells comprising a transistor and a capacitor, said transistor comprising first and second transistor electrodes and a ring-shaped gate electrode, said first transistor electrode comprising a first diffused region disposed at a center of said each of said memory cells in said substrate and being connected to a corresponding bit line, said ring-shaped gate electrode being formed around said first transistor electrode on the major surface of said substrate through a gate insulator and being connected to a corresponding work line, said gate insulator being formed in said major surface of said substrate, an inner circumference of said ring-shaped gate electrode overlapping an outer circumference of said first transistor electrode through said gate insulator, said second transistor electrode being formed around said ring-shaped gate electrode, an inner circumference of said second transistor electrode overlapping an outer circumference of said ring-shaped gate electrode through said gate insulator, said capacitor comprising first and second capacitor electrodes and also being formed around said ring-shaped gate electrode; and wherein: said first transistor electrode is formed in said major surface of said substrate; said ring-shaped gate electrode is formed around said first transistor electrode on said major surface of said substrate and is separated from said first electrode by said gate insulator, an inner circumference of said ring-shaped gate electrode overlapping an outer circumference of said first transistor electrode through said gate insulator; said second transistor electrode is formed around said ring-shaped gate electrode in said major surface of said substrate, an inner circumference of said second transistor electrode overlapping an outer circumference of said ring-shaped gate electrode through said gate insulator; said capacitor is formed between said isolating region and said ring-shaped gate electrode and is connected electrically to said transistor; and wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell. an isolating region formed in the major surface of said substrate for isolating said memory cells from each other; wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell.

Claim 27

A random access memory device according to claim 24, further comprising at least one sense amplifier, wherein the bit line in each odd column and the bit line in each even column are connected to a corresponding sense amplifier.

Claim 28

A random access memory device according to claim 24, wherein the word line in each row is connected to one of the memory cells in each odd column and in each even column, and the word line in each even row is connected to another of the memory cells in each odd column and each even column.

Claim 29

A random access memory device according to claim 24, wherein each of said memory cells is hexagonal in shape and a line passing through a center of said isolating region around each memory cell forms a hexagon.

Claim 30

A random access memory device according to claim 27, wherein a length of each of said memory cells along a corresponding column is greater than a length along a corresponding row.

Claim 31

A random access memory device according to claim 24, wherein at least one trench is formed in the major surface of said substrate, said at least one trench having side walls and a bottom and being formed around said first transistor electrode of each of said memory cells, and wherein said capacitor is formed at least along one of said side walls.

Claim 32

A random access memory device according to claim 29, wherein said isolating region is formed in said bottom of said at least one trench, and said first capacitor electrode comprises a second diffused region formed at least along one of said side walls of said at least one trench, said first capacitor electrode being electrically connected to said first transistor electrode through a channel region formed directly under said gate electrode when said transistor is turned on, said second capacitor electrode comprising a cell plate formed over said first capacitor electrode and having a U-shaped cross section, said second capacitor electrode being formed along said side walls and said bottom of said at least one trench through a dielectric layer.

Claim 33

A random access memory device according to claim 24, wherein said each of said memory cells further includes a trench formed in the major surface of said substrate around said first transistor electrode, at least a portion of said ring-shaped gate electrode being formed on an upper portion of a side wall of said trench near said first transistor electrode, and wherein said capacitor is formed around said ring-shaped gate electrode at least along said side wall of said trench near said first transistor electrode.

Claim 34

A random access memory device according to claim 31, wherein said first capacitor electrode comprises a second diffused region formed in at least one of said side walls of said trench near said first diffused region of each memory cell, said first capacitor electrode being electrically connected to said first diffused region through a channel region formed directly under said gate electrode when said transistor is turned on, said second capacitor electrode being formed over said first capacitor electrode through a dielectric layer.

Claim 35

A random access memory device according to claim 32, wherein an outer boundary of said memory cell is hexagonal, and a center line passing through said isolating region around each of said memory cells forms a hexagon.

Claim 36

A random access memory device according to claim 32, wherein said isolating region is formed in said bottom of said at least one trench, such that adjacent ones of said memory cells have portions thereof formed in said trench.

Claim 37

A random access memory device according to claim 24, wherein said first transistor electrode is a source electrode.

Claim 38

A memory cell in a semiconductor memory device comprising a plurality of memory cells, said memory cell comprising: a substrate; a transistor comprising first and second transistor electrodes and a ring-shaped gate electrode; a capacitor comprising first and second capacitor electrodes; an isolating region for isolating said memory cell from adjacent ones of said memory cells; and a gate insulator formed around said first transistor electrode and on a major surface of said substrate; wherein: said first transistor electrode is formed in said major surface of said substrate; said ring-shaped gate electrode is formed around said first transistor electrode on said major surface of said substrate and is separated from said first electrode by said gate insulator, an inner circumference of said ring-shaped gate electrode overlapping an outer circumference of said first transistor electrode through said gate insulator; said second transistor electrode is formed around said ring-shaped gate electrode in said major surface of said substrate, an inner circumference of said second transistor electrode overlapping an outer circumference of said ring-shaped gate electrode through said gate insulator, and an outer circumference of said second transistor electrode touching an inner circumference of said isolating region; said first capacitor electrode is formed between said isolating region and said ring-shaped gate electrode and is connected electrically to said second transistor electrode, an inner end of said first capacitor electrode overlapping an outer end of said ring-shaped gate electrode through an insulator, an outer end of said first capacitor electrode overlapping an inner end of said isolated region; said second capacitor electrode is formed on said first capacitor electrode through another insulator; and wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell.

Claim 39

A memory cell in a semiconductor memory device comprising a plurality of memory cells, said memory cell comprising: a substrate; a transistor comprising first and second transistor electrodes and a ring-shaped gate electrode; a capacitor comprising first and second capacitor electrodes; an isolating region for isolating said memory cell from adjacent ones of said memory cells; and a gate insulator formed around said first transistor electrode and on a major surface of said substrate; wherein: said first transistor electrode is formed in said major surface of said substrate; said ring-shaped gate electrode is formed around said first transistor electrode on said major surface of said substrate and is separated from said first electrode by said gate insulator, an inner circumference of said ring-shaped gate electrode overlapping an outer circumference of said first transistor electrode through said gate insulator; said second transistor electrode is formed around said ring-shaped gate electrode in said major surface of said substrate, an inner circumference of said second transistor electrode overlapping an outer circumference of said ring-shaped gate electrode through said gate insulator, and an outer circumference of said second transistor electrode touching an inner circumference of said isolating region; said first capacitor electrode is formed between said isolating region and said ring-shaped gate electrode and is connected electrically to said second transistor electrode, an inner end of said first capacitor electrode overlapping an outer end of said ring-shaped gate electrode through an insulator, an outer end of said first capacitor electrode overlapping an inner end of said isolated region; said second capacitor electrode is formed on said first capacitor electrode through another insulator; and wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell.

Claim 40

A memory cell in a semiconductor memory device comprising a plurality of memory cells formed in a substrate, each said memory cell having a trench formed in a major surface of said substrate around a center of said memory cell, said trench having side walls and a bottom, said memory cell further comprising: a transistor comprising first and second transistor electrodes and a ring-shaped gate electrode; a capacitor comprising first and second capacitor electrodes; an isolating region for isolating said memory cell from adjacent ones of said memory cells; and a gate insulator formed around said first transistor electrode and on an upper part of one of said side walls of said trench; wherein: said first transistor electrode is formed in said major surface of said substrate, the outer end of said first transistor electrode being exposed at one of said side walls of said trench; said ring-shaped gate electrode is formed around said first transistor electrode and along one of said side walls of said trench, and is separated from said first electrode by said gate insulator; said second transistor electrode is formed around said ring-shaped gate electrode and along one of said side walls of said trench; said first capacitor electrode is formed between said isolating region and said second transistor electrode and along at least one of said side walls of said trench, and is connected electrically to said second transistor electrode; and said second capacitor electrode is formed over said first capacitor electrode through an insulator; and wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell.

Claim 41

A memory cell in a semiconductor memory device comprising a plurality of memory cells formed in a substrate, each said memory cell having a trench formed in a major surface of said substrate around a center of said memory cell, said trench having side walls and a bottom, said memory cell further comprising: a transistor comprising first and second transistor electrodes and a ring-shaped gate electrode; a capacitor comprising first and second capacitor electrodes; an isolating region for isolating said memory cell from adjacent ones of said memory cells; and a gate insulator formed around said first transistor electrode and on an upper part of one of said side walls of said trench; wherein: said first transistor electrode is formed in said major surface of said substrate, the outer end of said first transistor electrode being exposed at one of said side walls of said trench; said ring-shaped gate electrode is formed around said first transistor electrode and along one of said side walls of said trench, and is separated from said first electrode by said gate insulator; said second transistor electrode is formed around said ring-shaped gate electrode and along one of said side walls of said trench; said first capacitor electrode is formed between said isolating region and said second transistor electrode and along at least one of said side walls of said trench, and is connected electrically to said second transistor electrode; and said second capacitor electrode is formed over said first capacitor electrode through an insulator; and wherein said first and second transistor electrodes are shaped such that a current path between said first and second transistor electrodes is never parallel to a boundary between said isolating region and a remaining portion of said memory cell.