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US4946802A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor laser device fabricating method

Assignee: Mitsubishi Electric Corp
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Filing: 1988-11-18
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Granted: 1990-08-07
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Expires: 2008-11-18
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Abstract

Abstract A high-power AlGaAs/GaAs laser device comprises: a ridge formed on the top surface of a substrate from one end to the opposite end, thereof wherein the width of the ridge is made narrower in regions near both the ends and wider in a middle region; a depression is formed in the wider region of the ridge; a clad layer is grown epitaxially over the top surface of the substrate; and an active layer is grown epitaxially on the clad layer, wherein the thickness of the active layer is thinner in portions just above the narrower ridge regions and relatively thicker in a portion just above the wider ridge region.

Inventors

  • 👤 Akihiro Shima
  • 👤 Wataru Susaki

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 14:05
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/10; H01S5/16; H01S5/1053; H01S5/1064; H01S5/20; H01S5/22; H01S5/2201; H01S5/223; H01S5/2232; H01S5/2234; H01S5/2235; Y; Y10; Y10S; Y10S148/00; Y10S148/095; Y10S148/11

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 142 words
A method for fabricating a semiconductor laser device, comprising the steps of: preparing a substrate; forming a ridge on a main surface of said substrate from one end to the opposite end, wherein width of said ridge is narrower in regions near both the ends and wider in a middle region; forming a depression in the wider region of said ridge; forming a narrow groove, narrower than said depression, along the surface of said ridge from said one end to said opposite end; forming a first clad layer over the main surface of said substrate; forming an active layer on said first clad layer, whereby thickness of said active layer is made thinner in portions just above said narrower ridge regions and made thicker in portion just above said wider ridge region; and forming a second clad layer on said active layer.
Claim 2
Independent Claim 142 words
A method for fabricating a semiconductor laser device, comprising the steps of: preparing a substrate; forming a ridge on a main surface of said substrate from one end to the opposite end, wherein width of said ridge is narrower in regions near both the ends and wider in a middle region; forming a depression in the wider region of said ridge; forming a narrow groove, narrower than said depression, along the surface of said ridge from said one end to said opposite end; forming a first clad layer over the main surface of said substrate; forming an active layer on said first clad layer, whereby thickness of said active layer is made thinner in portions just above said narrower ridge regions and made thicker in portion just above said wider ridge region; and forming a second clad layer on said active layer.
Claim 3
Dependent Claim 22 words
A method in accordance with claim 1, wherein said first clad layer and said active layer are grown by liquid phase epitaxy.
Claim 4
Dependent Claim 27 words
A method in accordance with claim 1 further comprising a step of forming a current-blocking layer which has a slit along the center axis of said ridge.
Claim 5
Dependent Claim 27 words
A method in accordance with claim 3, wherein said current-blocking layer is grown by liquid phase epitaxy and provided between said substrate and said first clad layer.
Claim 6
Dependent Claim 14 words
A method in accordance with claim 3, wherein said device of an A1GaAs/GaAs system.
Claim 7
Independent Claim 147 words
A method for fabricating a semiconductor laser device, comprising the steps of: preparing a substrate; forming a ridge on a main surface of said substrate from one end to the opposite end, wherein width of said ridge is narrower in regions near both the ends and wider in a middle region; forming a depression in the wider region of said ridge; forming a first clad layer over the main surface of said substrate; forming an active layer on said first clad layer, whereby thickness of said active layer is made thinner in portions just above said narrower ridge regions and made thicker in portion just above said wider ridge region; forming a second clad layer on said active layer; and forming a current-blocking layer which has a slit along the center axis of said ridge and wherein said current-blocking layer is provided on said second clad layer.
Claim 8
Independent Claim 147 words
A method for fabricating a semiconductor laser device, comprising the steps of: preparing a substrate; forming a ridge on a main surface of said substrate from one end to the opposite end, wherein width of said ridge is narrower in regions near both the ends and wider in a middle region; forming a depression in the wider region of said ridge; forming a first clad layer over the main surface of said substrate; forming an active layer on said first clad layer, whereby thickness of said active layer is made thinner in portions just above said narrower ridge regions and made thicker in portion just above said wider ridge region; forming a second clad layer on said active layer; and forming a current-blocking layer which has a slit along the center axis of said ridge and wherein said current-blocking layer is provided on said second clad layer.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-08-06 1994-02-05 1994-08-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-08-06 1998-02-05 1998-08-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-08-06 2002-02-05 2002-08-07 $7700.00 Window Closed / Lapsed

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