Electrophoresis imaging system

Claim 1

An electrophoretic measuring system comprising, a gel electrophoresis unit having gel material and sample material thereon, a light source emitting a collimated beam, said beam being directed toward said electrophoresis unit, said beam passing through said gel and sample material on said unit, shearing interferometer means disposed in the path of said light beam for producing an interferogram representing the spatial rate of change of an index of refraction of said material on said unit, said shearing interferometer means including a pair of closely spaced first and second plates in the path of said light beam, said first plate being partially reflection and partially transmissive, said second plate being in communication with means for altering the separation between said first and second plates, means for forming an image of said interferogram, means for producing a data signal from said image representing said interferogram, and means for processing said data signal to obtain the concentration of sample material at each position on said unit, said means for processing including means for solving (a) a first equation: ##EQU4## obtained for a first plate separation Z 0 , (b) a second equation: ##EQU5## obtained for a second plate separation Z 0 +λ/4, and (c) a third equation: ##EQU6## obtained for a third plate separation Z 0 +λ/2, for Δ 0 (x), where I(x) is the light intensity of said interferogram, I 0 (x) is the light intensity of light reflected from said first plate, I 1 (x) is the light intensity of the light transmitted through said first plate and reflected from said second plate, Δ 0 (x) is an optical path difference for said light beam through said gel and sample material on said unit, x is the position with respect to said electrophoresis unit and λ is the wavelength of said light beam.

Claim 6

A method of measuring the positions of sample material components on a gel electrophoresis plate comprising, (a) illuminating a gel electrophoresis plate with a collimated light beam, said plate having gel material and sample material thereon, sample material on said plate being characterized by a different index of refraction than an index of refraction of gel material on said plate, the different indices of refraction creating optical path differences for said light beam passing through said gel and sample materials on said plate, said optical path differences modifying the phase of wavefronts of said light beam, (b) passing said modified light beam through a shearing interferometer, said shearing interferometer including a pair of closely spaced plates in the path of said modified light beam, said plates having an adjustable spacing, the passing of said modified light beam through said shearing interferometer causing (1) a splitting of said modified light beam into substantially identical first and second beams, (2) a spatial displacing of said second beam by a small distance with respect to said first beam, and (3) a recombining of said first beam with said displaced second beam, said splitting, displacing and recombining being performed by said pair of closely spaced plates, said interferometer thereby producing an interferogram representing the spatial rate of change of the index of refraction of material on said plate at every point of said plate, (c) scanning said interferogram with an image digitizer, said image digitizer producing a data signal corresponding to said interferogram, and (d) integrating said data signal over space, said integrating of said data signal including (1) solving a set of three equations for Δ 0 (x), where a first of said equations is ##EQU7## obtained for a first plate separation Z 0 , a second of said equations is ##EQU8## obtained for a second plate separation Z 0 +λ/4, and a third of said equations is ##EQU9## obtained for a third plate separation Z 0 +λ/2, where I(x) is the light intensity of said interferogram, I 0 (x) is the light intensity of light reflected from said first plate, I 1 (x) is the light intensity of light transmitted through said first plate and reflected from said second plate, Δ 0 (x) is an optical path difference for said light beam through said gel and sample material on said unit, x is the position with respect to said electrophoresis unit and λ is the wavelength of said light beam, and (2) integrating Δ 0 (x) over position x, said integrated signal representing phase values of said modified wavefronts, said phase values being proportional to a concentration of sample material relative to gel material at each point on said plate.

Claim 7

A method of measuring the positions of sample material components on a gel electrophoresis plate comprising, (a) illuminating a gel electrophoresis plate with a collimated light beam, said plate having gel material and sample material thereon, sample material on said plate being characterized by a different index of refraction than an index of refraction of gel material on said plate, the different indices of refraction creating optical path differences for said light beam passing through said gel and sample materials on said plate, said optical path differences modifying the phase of wavefronts of said light beam, (b) passing said modified light beam through a shearing interferometer, said shearing interferometer including a pair of closely spaced plates in the path of said modified light beam, said plates having an adjustable spacing, the passing of said modified light beam through said shearing interferometer causing (1) a splitting of said modified light beam into substantially identical first and second beams, (2) a spatial displacing of said second beam by a small distance with respect to said first beam, and (3) a recombining of said first beam with said displaced second beam, said splitting, displacing and recombining being performed by said pair of closely spaced plates, said interferometer thereby producing an interferogram representing the spatial rate of change of the index of refraction of material on said plate at every point of said plate, (c) scanning said interferogram with an image digitizer, said image digitizer producing a data signal corresponding to said interferogram, and (d) integrating said data signal over space, said integrating of said data signal including (1) solving a set of three equations for Δ 0 (x), where a first of said equations is ##EQU7## obtained for a first plate separation Z 0 , a second of said equations is ##EQU8## obtained for a second plate separation Z 0 +λ/4, and a third of said equations is ##EQU9## obtained for a third plate separation Z 0 +λ/2, where I(x) is the light intensity of said interferogram, I 0 (x) is the light intensity of light reflected from said first plate, I 1 (x) is the light intensity of light transmitted through said first plate and reflected from said second plate, Δ 0 (x) is an optical path difference for said light beam through said gel and sample material on said unit, x is the position with respect to said electrophoresis unit and λ is the wavelength of said light beam, and (2) integrating Δ 0 (x) over position x, said integrated signal representing phase values of said modified wavefronts, said phase values being proportional to a concentration of sample material relative to gel material at each point on said plate.