US4925810A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Compound semiconductor device and a method of manufacturing the same
Assignee: Toyota Central R&D Labs Inc
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Filing: 1989-08-24
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Granted: 1990-05-15
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Expires: 2009-08-24
Abstract
Abstract A compound semiconductor device comprises a substrate formed from a single crystal of silicon, a layer of an insulator formed on a portion of a surface of the substrate, at least one layer of a high resistance compound semiconductor formed on the insulator layer, and at least one layer of a single crystal of a compound semiconductor formed on a different portion of the substrate surface from the insulator layer. The device can be manufactured by forming an insulator layer on one portion of a surface of a single crystal silicon substrate, and growing a compound semiconductor by epitaxy on the insulator layer and on the different portion from the insulator layer. One of useful applications is a hybrid semiconductor device having a compound semiconductor formed from e.g. GaAs on a silicon substrate.
Inventors
- 👤 Hiroyuki Kano
- 👤 Takatoshi Kato
- 👤 Masafumi Hashimoto
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 13:08
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/27; Y; Y10; Y10S; Y10S148/00; Y10S148/017; Y10S148/026; Y10S148/097; Y10S148/169; Y10S438/00; Y10S438/933; Y10S438/938; Y10S438/969
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
222 words
A method of manufacturing a compound semiconductor device comprising the steps of: forming a layer of an insulator on one portion of a surface of a substrate formed from a single crystal of silicon; removing an oxide on a different portion of said substrate surface from said insulator layer and some silicon atoms of said substrate surface under said oxide by heating said substrate at a temperature of at least 1000° C. in an ultrahigh vacuum having a maximum pressure of 10 -10 torr, maintaining said substrate at a temperature of at least 1,000° C. for a time longer than required to desorb an oxide, said time being sufficient to obtain a structure of bi-atomic steps on the substrate surface, lowering the temperature substantially to a range of 550° to 750° C. and then applying to said substrate a molecular beam of one compound semiconductor forming elements which is volatile at a temperature in the range of from 550°-750° C., and applying molecular beams of all of said compound semiconductor forming elements together to said substrate to grow a compound semiconductor by epitaxy, whereby a compound semiconductor layer having a regularly repeating arrangement of atoms is formed on a different portion of said substrate surface from said insulator layer, while a high resistance compound semiconductor layer is formed on said insulator layer.
Claim 2
Independent Claim
222 words
A method of manufacturing a compound semiconductor device comprising the steps of: forming a layer of an insulator on one portion of a surface of a substrate formed from a single crystal of silicon; removing an oxide on a different portion of said substrate surface from said insulator layer and some silicon atoms of said substrate surface under said oxide by heating said substrate at a temperature of at least 1000° C. in an ultrahigh vacuum having a maximum pressure of 10 -10 torr, maintaining said substrate at a temperature of at least 1,000° C. for a time longer than required to desorb an oxide, said time being sufficient to obtain a structure of bi-atomic steps on the substrate surface, lowering the temperature substantially to a range of 550° to 750° C. and then applying to said substrate a molecular beam of one compound semiconductor forming elements which is volatile at a temperature in the range of from 550°-750° C., and applying molecular beams of all of said compound semiconductor forming elements together to said substrate to grow a compound semiconductor by epitaxy, whereby a compound semiconductor layer having a regularly repeating arrangement of atoms is formed on a different portion of said substrate surface from said insulator layer, while a high resistance compound semiconductor layer is formed on said insulator layer.
Claim 3
Dependent Claim
21 words
A method as set forth in claim 1, wherein said compound semiconductor forming elements are mainly Group III and V elements.
Claim 4
Dependent Claim
38 words
A method as set forth in claim 1, wherein said single crystal of silicon has surface orientation (100), and the temperature at which said substrate is heated in an ultrahigh vacuum ranges from 1000° C. to 1050° C.
Claim 5
Dependent Claim
50 words
A method as set forth in claim 2, wherein at least one of Ga and Al is used as said Group III element, As is used as said Group V element, and at least one of GaAs and Al x Ga.sub.(1-x) As (0<×≦1) is grown by epitaxy on said substrate.
Claim 6
Dependent Claim
43 words
A method as set forth in claim 2, wherein the molecular beam of said Group V element has a flux ratio of 1 to 5 to that of said Group III element, and said epitaxy has a rate of 0.5 to 2 μm/h.
Claim 7
Dependent Claim
28 words
A method as set forth in claim 1, wherein said heating of said substrate in an ultrahigh vacuum and said epitaxy are carried out in different vacuum chambers.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-05-14 | 1993-11-13 | 1994-05-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-05-14 | 1997-11-13 | 1998-05-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-05-14 | 2001-11-13 | 2002-05-15 | $7700.00 | Window Closed / Lapsed |