Thin film transistor

Claim 2

A thin film field effect transistor of the type formed on a substantially planar substrate, said transistor comprising: a plurality of layers, said plurality of layers being contiguous and formed over said substrate to form a drain region layer, a source region layer and an electrically insulating layer between said source and drain regions layers; said plurality of layers having edge portions forming a plurality of surfaces which are non-parallel to said substrate; a deposited semiconductor material layer overlying said non-parallel surfaces and electrically coupled to said drain region layer and said source region layer along said non-parallel surfaces for forming a plurality of current conduction channels therebetween; a gate insulator disposed over said deposited semiconductor material layer; and a gate electrode separated from said deposited semiconductor material layer by said gate insulator.

Claim 3

The thin film field effect transistor as defined in claim 1 wherein said deposited semiconductor material layer includes silicon.

Claim 4

The thin film field effect transistor as defined in claim 2 wherein said deposited semiconductor material layer is an amorphous silicon alloy.

Claim 5

The thin film field effect transistor as defined in claim 3 wherein said amorphous silicon alloy includes hydrogen.

Claim 6

The thin film field effect transistor as define in claim 3 wherein said amorphous silicon alloy includes fluorine.

Claim 7

The thin film field effect transistor as defined in claim 1 further including carrier injection means electrically coupled to said drain region, said source region, and said semiconductor material for injecting current conduction carriers into said current conduction channels between said source region layer and said drain region layer.

Claim 8

The thin film field effect transistor as defined in claim 6 wherein said carrier injection means comprises a first layer of semiconductor material adjacent said drain region layer and a second layer of semiconductor material adjacent said source region layer.

Claim 9

The thin film field effect transistor as defined in claim 7 wherein said first and second layers of semiconductor material are formed from a doped semiconductor material.

Claim 10

The thin film field effect transistor as defined in claim 8 wherein said doped semiconductor material is n-type.

Claim 11

The thin film field effect transistor as defined in claim 8 wherein said doped semiconductor is p-type.

Claim 12

The thin film field effect transistor as defined in claim 8 wherein said doped semiconductor material comprises a doped amorphous silicon alloy.

Claim 13

The thin film field effect transistor as defined in claim 11 wherein said doped amorphous silicon alloy is n-type.

Claim 14

The thin film field effect transistor as defined in claim 11 wherein said doped amorphous silicon alloy is p-type.

Claim 15

The thin film field effect transistor as defined in claim 7 wherein said first layer of semiconductor material is disposed between said drain region layer and said insulating layer.

Claim 16

The thin film field effect transistor as defined in claim 1 wherein said electrically insulating layer is silicon oxide (SiO x ).

Claim 17

The thin film field effect transistor as defined in claim 1 wherein said drain and source region layers are formed from metal.

Claim 18

The thin film field effect transistor as defined in claim 16 wherein said metal is molybdenum.

Claim 19

A thin film field effect transistor of the type including a substrate, said transistor comprising: a plurality of layers of deposited material, said layers being contiguous and forming a drain region layer, a source region layer and an electrically insulating layer between said drain and source region layers; said drain region layer, source region layer, and electrically insulating layer forming a plurality of adjacently extending surfaces which are non-parallel to said substrate; a plurality of regions of deposited semiconductor material extending over said adjacently extending non-parallel surfaces to form a plurality of field controlled current conducting paths between said source region layer and drain region layer; a gate insulator overlying said regions of deposited semiconductor material; and a gate electrode overlying said gate insulator.

Claim 20

A thin film field effect transistor of the type including a substrate, said transistor comprising: a plurality of layers of deposited material, said layers being contiguous and forming a drain region layer, a source region layer and an electrically insulating layer between said drain and source region layers; said drain region layer, source region layer, and electrically insulating layer forming a plurality of adjacently extending surfaces which are non-parallel to said substrate; a plurality of regions of deposited semiconductor material extending over said adjacently extending non-parallel surfaces to form a plurality of field controlled current conducting paths between said source region layer and drain region layer; a gate insulator overlying said regions of deposited semiconductor material; and a gate electrode overlying said gate insulator.

Claim 21

The thin film field effect transistor as defined in claim 18 wherein said deposited semiconductor material includes silicon.

Claim 22

The thin film field effect transistor as defined in claim 19 wherein said deposited semiconductor material is an amorphous silicon alloy.

Claim 23

The thin film field effect transistor as defined in claim 20 wherein said amorphous silicon alloy includes hydrogen.

Claim 24

The thin film field effect transistor as defined in claim 20 wherein said amorphous silicon alloy includes fluorine.

Claim 25

The thin film field effect transistor as defined in claim 18 further including carrier injection means electrically coupled to said drain region layer, said source region layer, and said deposited semiconductor material for injecting current conduction carriers into said current conduction paths between said source region layer and said drain region layer.

Claim 26

The thin film field effect transistor as defined in claim 23 wherein said carrier injection means comprises a first layer of semiconductor material adjacent said drain region layer and a second layer of semiconductor material adjacent said source region layer.

Claim 27

The thin film field effect transistor as defined in claim 24 wherein said first and second layers of semiconductor material are formed from a doped semiconductor material.

Claim 28

The thin film field effect transistor as defined in claim 25 wherein said doped semiconductor material is n-type.

Claim 29

The thin film field effect transistor as defined in claim 25 wherein said doped semiconductor material is p-type.

Claim 30

The thin film field effect transistor as defined in claim 1, wherein the drain region layer is composed of a metal film on the substrate and a first impurity-doped semiconductor film of one conductivity type on the metal film, and the source region layer is composed of a second impurity-doped semiconductor film of the one conductivity type on the electrically insulating layer and a metal film on the second impurity-doped semiconductor film.

Claim 31

The thin film field effect transistor as defined in claim 28, wherein the deposited semiconductor material comprises an amorphous silicon film.

Claim 32

A thin film transistor comprising: an insulating substrate; a first main electrode formed on the insulating substrate and having a ring shape with an opening in the center portion thereof; a spacer insulator film formed on a portion of the first main electrode; a second main electrode formed on the spacer insulator film such that the second main electrode and spacer insulator film jointly define a stacked-layered structure overlying the ring-shaped first main electrode in the region adjacent the opening thereof; a high resistivity semiconductor film covering at least the side surface of the stacked-layered structure and being in contact with both said first and second main electrodes; a gate insulator film formed on the semiconductor film at least in the region where the semiconductor film covers the side surface of the stacked-layered structure; and a gate electrode formed on the gate insulator film at least in the region where the gate insulator film covers the semiconductor film on the side surface of the stacked-layered structure.

Claim 33

A thin film transistor comprising: an insulating substrate; a first main electrode formed on the insulating substrate and having a ring shape with an opening in the center portion thereof; a spacer insulator film formed on a portion of the first main electrode; a second main electrode formed on the spacer insulator film such that the second main electrode and spacer insulator film jointly define a stacked-layered structure overlying the ring-shaped first main electrode in the region adjacent the opening thereof; a high resistivity semiconductor film covering at least the side surface of the stacked-layered structure and being in contact with both said first and second main electrodes; a gate insulator film formed on the semiconductor film at least in the region where the semiconductor film covers the side surface of the stacked-layered structure; and a gate electrode formed on the gate insulator film at least in the region where the gate insulator film covers the semiconductor film on the side surface of the stacked-layered structure.

Claim 34

A thin film transistor according to claim 30; wherein the first main electrode, spacer insulator film and second main electrode have mutually superposed portions which jointly define the stacked-layered structure.

Claim 35

A thin film transistor according to claim 31; whrein the semiconductor film is effectively surrounded by the gate insulator film and the stacked-layered structure so as to shield the semiconductor film from externally irradiated light thereby eliminating the need for a separate light-shielding film to protect the semiconductor film.

Claim 36

A thin film transistor according to claim 32; wherein said high resistivity semiconductor film comprises an amorphous silicon film.

Claim 37

A thin film transistor according to claim 30; wherein the first main electrode is composed of a metal film on the insulating substrate and a first impurity-doped semiconductor film of one conductivity type of the metal film, and the second main electrode is composed of a second impurity-doped semiconductor film of one conductivity type on the spacer insulator film and a metal film on the second impurity-doped semiconductor film.

Claim 38

A thin film transistor according to claim 30; wherein said high resistivity semiconductor film comprises an amorphous silicon film.

Claim 39

A thin film transistor according to claim 30; wherein one of the first and second main electrodes comprises a source electrode and the other of the first and second main electrodes comprises a drain electrode.