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US4922324A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor integrated circuit device

Assignee: Toshiba Corp
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Filing: 1988-01-19
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Granted: 1990-05-01
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Expires: 2008-01-19
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Abstract

Abstract A semiconductor integrated circuit device has a package base and a cavity formed with a ground electrode layer thereon. A semiconductor integrated circuit chip is providing on the ground electrode layer. De-coupling capacitors are providing on the surface of the cavity. A ground metal plate and outer leads are formed on the surface of the bottom of the package base. A metal connector is providing through the package base to connect electrically and thermally, the ground electode layer and the ground metal plate.

Inventors

  • 👤 Toshio Sudo

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 22:42
CPC Classifications
H; H10; H10W; H10W44/00; H10W44/601; H10W40/00; H10W40/20; H10W40/22; H10W40/226; H10W40/228; H10W70/00; H10W70/60; H10W70/62; H10W70/63; H10W70/635; H10W70/67; H10W70/68; H10W70/682; H10W70/685; H10W72/00; H10W72/50; H10W72/541; H10W72/5449; H10W72/90; H10W72/931; H10W72/932; H10W90/00; H10W90/701; H10W90/731; H10W90/737; H10W90/751; H10W90/754; Y; Y10; Y10S; Y10S257/00; Y10S257/916

Claims Analysis

Total Claims: 18
Claim 1
Independent Claim 95 words
A semiconductor integrated circuit device comprising: a package base having a cavity; a ground electrode layer formed on the cavity; a semiconductor integrated circuit chip provided on the ground electrode layer; de-coupling capacitors provided on the cavity; bonding wires directly connecting the semiconductor integrated circuit chip to the de-coupling capacitors; a ground metal plate provided on the bottom surface of the package base; a metal connection means provided through the package base to connect the ground electrode layer and the ground metal plate; and outer leads provided on the bottom surface of the package base.
Claim 2
Dependent Claim 95 words
A semiconductor integrated circuit device comprising: a package base having a cavity; a ground electrode layer formed on the cavity; a semiconductor integrated circuit chip provided on the ground electrode layer; de-coupling capacitors provided on the cavity; bonding wires directly connecting the semiconductor integrated circuit chip to the de-coupling capacitors; a ground metal plate provided on the bottom surface of the package base; a metal connection means provided through the package base to connect the ground electrode layer and the ground metal plate; and outer leads provided on the bottom surface of the package base.
Claim 3
Dependent Claim 19 words
The semiconctor integrated circuit device according to claim 1, wherein de-coupling capacitors are arranged at corners of the cavity.
Claim 4
Dependent Claim 25 words
The semiconductor integrated circuit device according to claim 1, wherein the de-coupling capacitors are directly connected by the bonding wires to power supply voltage lines.
Claim 5
Dependent Claim 17 words
The semiconductor integrated circuit device according to claim 1, wherein the package base is made of ceramics.
Claim 6
Dependent Claim 24 words
The semiconductor integrated circuit device according to claim 1, wherein the metal connection means includes metal buried into through holes in the package base.
Claim 7
Dependent Claim 19 words
The semiconductor integrated circuit device according to claim 1, wherein the metal connection means is a unified ground electrode.
Claim 8
Dependent Claim 22 words
The semiconductor integrated circuit device according to claim 1, wherein the ground metal plate and the outer leads have the same height.
Claim 9
Dependent Claim 21 words
The semiconductor integrated circuit device according to claim 1, wherein the semiconductor integrated circuit chip is a GaAs logic integrated circuit.
Claim 10
Dependent Claim 164 words
A semiconductor integrated circuit device comprising: a ceramics base; a ground electrode layer formed on the surface of the ceramics base; a semiconductor integrated circuit chip provided on the ground electrode layer; a ground metal plate provided on the bottom surface of the ceramics base; a first insulating ring-shaped layer provided on the peripheral portion of the ceramics base so as to surround the semiconductor integrated circuit chip; signal wirings formed on the first insulating ring-shaped layer; de-coupling capacitors provided on the first insulating ring-shaped layer; first bonding wirings connecting terminals of the semiconductor integrated circuit chip and signal wirings, second bonding wirings directly connecting terminals of the semiconductor integrated circuit chip and the de-coupling capacitors; a second insulating ring-shaped layer provided on a peripheral portion of the first insulating ring-shaped layer; a metal sealing lid provided on the second insulating ring-shaped layer; and a metal connection means provided through the package base to connect the ground electrode layer and the ground metal plate.
Claim 11
Dependent Claim 164 words
A semiconductor integrated circuit device comprising: a ceramics base; a ground electrode layer formed on the surface of the ceramics base; a semiconductor integrated circuit chip provided on the ground electrode layer; a ground metal plate provided on the bottom surface of the ceramics base; a first insulating ring-shaped layer provided on the peripheral portion of the ceramics base so as to surround the semiconductor integrated circuit chip; signal wirings formed on the first insulating ring-shaped layer; de-coupling capacitors provided on the first insulating ring-shaped layer; first bonding wirings connecting terminals of the semiconductor integrated circuit chip and signal wirings, second bonding wirings directly connecting terminals of the semiconductor integrated circuit chip and the de-coupling capacitors; a second insulating ring-shaped layer provided on a peripheral portion of the first insulating ring-shaped layer; a metal sealing lid provided on the second insulating ring-shaped layer; and a metal connection means provided through the package base to connect the ground electrode layer and the ground metal plate.
Claim 12
Dependent Claim 22 words
The semiconductor integrated circuit device according to claim 9, wherein de-coupling capacitors are arranged on corners of the first insulating ling-shaped layer.
Claim 13
Dependent Claim 24 words
The semiconductor integrated circuit device according to claim 9, wherein the metal connection means includes metal buried into through holes of the package base.
Claim 14
Dependent Claim 19 words
The semiconductor integrated circuit device according to claim 9, wherein the metal connection means is a unified ground electrode.
Claim 15
Dependent Claim 22 words
The semiconductor integrated circuit device according to claim 9, wherein the ground metal plate and the outer lead have the same thickness.
Claim 16
Dependent Claim 21 words
The semiconductor integrated circuit device according to claim 9, wherein the semiconductor integrated circuit chip is a GaAs logic integrated circuit.
Claim 17
Dependent Claim 29 words
The semiconductor integrated circuit device according to claim 1, wherein the metal connection means is formed in a portion of the package base below the semiconductor integrated circuit chip.
Claim 18
Dependent Claim 29 words
The semiconductor integrated circuit device according to claim 9, wherein the metal connection means is formed in a portion of the ceramics base below the semiconductor integrated circuit chip.

References Cited (Backward Citations)

US4611882A Cited
US4551747A Cited
US4667219A Cited
US4705917A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-04-30 1993-10-30 1994-05-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-04-30 1997-10-30 1998-05-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-04-30 2001-10-30 2002-05-01 $7700.00 Window Closed / Lapsed

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