Dynamic latch circuit for preventing short-circuit current from flowing during absence of clock pulses when under test

Claim 2

A dynamic latch circuit comprising: a control terminal section for receiving a control clock signal formed of clock pulses which are generated at a predetermined frequency; a plurality of register sections each for detecting a voltage of an input signal, in response to each clock pulse, generated an output signal from a capacitive output node which is charged or discharged in accordance with the voltage of the input signal and is selectively set at one of first and second potentials; and voltage-generating means for detecting, based on a pulse interval of the control clock signal equivalent to the period of time elapsed from the trailing edge of the last generated clock pulse, that the supply of the clock pulses has been stopped, and for fixing the output nodes of said register sections at a predetermined one of said first and second potentials, upon detecting that the supply of the clock pulses has been stopped, said voltage-generating means having timer means for detecting that said pulse interval of the control clock signal exceeds a reference period equal to an interval determined by said predetermined frequency, a power-supply terminal set at the first potential, and a plurality of switching elements connected between the power-supply terminal and the respective capacitive output nodes of said register sections, said switching elements being turned on under the control of a signal output by said timer means which it is detected that the supply of the clock pulses has been stopped.

Claim 3

The dynamic latch circuit according to claim 1, wherein said register sections are connected in cascade, thereby constituting a shift register.

Claim 4

A dynamic latch circuit for preventing short-circuit current from flowing during absences of clock pulses when under test comprising: a first power-supply terminal set at a potential of a first level; a second power-supply terminal set at a potential of a second level; a control terminal section for receiving a control clock signal which is generated at a predetermined frequency, said control clock signal having potentials of third and fourth levels which are alternatively generated, and which are maintained at the potential of the third level when a test is performed; a register section connected between said first and second power-supply terminals to receive an input signal and the control clock signal from said control terminal section, for detecting a voltage of the input signal, in response to the control clock, and generated an output signal from a capacitive output node which is charged or discharged in accordance with the detected voltage and is selectively set at one of the potentials of the first and second levels; detection means connected to said control terminal section, for detecting that the control clock signal has been maintained at the potential of the third level and outputting a detection signal upon the detection; and switching means connected between said first power-supply terminal and said capacitive output node for receiving the detection signal from said detection means, and fixing a potential of said capacitive output node at the first level.

Claim 5

A dynamic latch circuit for preventing short-circuit current from flowing during absences of clock pulses when under test comprising: a first power-supply terminal set at a potential of a first level; a second power-supply terminal set at a potential of a second level; a control terminal section for receiving a control clock signal which is generated at a predetermined frequency, said control clock signal having potentials of third and fourth levels which are alternatively generated, and which are maintained at the potential of the third level when a test is performed; a register section connected between said first and second power-supply terminals to receive an input signal and the control clock signal from said control terminal section, for detecting a voltage of the input signal, in response to the control clock, and generated an output signal from a capacitive output node which is charged or discharged in accordance with the detected voltage and is selectively set at one of the potentials of the first and second levels; detection means connected to said control terminal section, for detecting that the control clock signal has been maintained at the potential of the third level and outputting a detection signal upon the detection; and switching means connected between said first power-supply terminal and said capacitive output node for receiving the detection signal from said detection means, and fixing a potential of said capacitive output node at the first level.

Claim 6

The dynamic latch circuit according to claim 3, further comprising an operation circuit which is connected between said first and second power-supply terminals to receive the output signal generated at said capacitive output node, and which operates in accordance with the output signal, wherein short-circuit current is prevented from flowing between said first and second power-supply terminals through said operation circuit by fixing the potential at said capacitive output node at the first level when said switching means is turned on.

Claim 7

The dynamic latch circuit according to claim 4, wherein said operation circuit comprises a CMOS inverter connected to said capacitive output node for functioning as an output buffer for said register section.

Claim 8

The dynamic latch circuit according to claim 5, wherein said detection means includes timer means for detecting when said pulse interval of said control clock signal exceeds a predetermined reference period equal to an interval determined by said frequency.

Claim 9

The dynamic latch circuit according to claim 6, wherein said time means includes capacitive means, charging means for charging the capacitive means, discharging means for discharging the capacitive means, in response to each clock pulse, and voltage-detecting means for detecting that the voltage of said capacitive means has reached a predetermined value after said reference period has elapsed.

Claim 10

The dynamic latch circuit according to claim 7, wherein said charging means includes resistor means for limiting current accumulated in said capacitive means.

Claim 11

The dynamic latch circuit according to claim 7, wherein said voltage-detecting means includes a CMOS inverter having a threshold voltage of said predetermined value.

Claim 12

The dynamic latch circuit according to claim 3, wherein said register section includes a CMOS clocked inverter which is enabled to output a high impedance during said pulse interval of said control clock signal.

Claim 13

A dynamic latch circuit for preventing short-circuit current from flowing during absences of clock pulses when under test comprising: a first power-supply terminal set at a potential of a first level; a second power-supply terminal set at a potential of a second level; a control terminal section for receiving a control clock signal which is generated at a predetermined frequency, said control clock signal having potentials of third and fourth levels which are alternatively generated, and which are maintained at the potential of the third level when a test is performed; a plurality of register sections each connected between said first and second power-supply terminals to receive an input signal and the control clock signal from said control terminal section, each of said plurality of register sections detects a voltage of the input signal, in response to the control clock, and generates an output signal from a capacitive output node which is charged or discharged in accordance with the detected voltage and is selectively set at one of the potentials of the first and second levels; detection means connected to said control terminal section, for detecting that the control clock signal has been maintained at the potential of the third level and outputting a detection signal upon the detection; and a plurality of switching means each of which is connected between said first power-supply terminal and each of said capacitive output nodes for receiving the detection signal from said detection means, each said switching means turning on upon receipt of the detection signal from said detection means and fixing a potential of said capacitive output node at the first level.

Claim 14

A dynamic latch circuit for preventing short-circuit current from flowing during absences of clock pulses when under test comprising: a first power-supply terminal set at a potential of a first level; a second power-supply terminal set at a potential of a second level; a control terminal section for receiving a control clock signal which is generated at a predetermined frequency, said control clock signal having potentials of third and fourth levels which are alternatively generated, and which are maintained at the potential of the third level when a test is performed; a plurality of register sections each connected between said first and second power-supply terminals to receive an input signal and the control clock signal from said control terminal section, each of said plurality of register sections detects a voltage of the input signal, in response to the control clock, and generates an output signal from a capacitive output node which is charged or discharged in accordance with the detected voltage and is selectively set at one of the potentials of the first and second levels; detection means connected to said control terminal section, for detecting that the control clock signal has been maintained at the potential of the third level and outputting a detection signal upon the detection; and a plurality of switching means each of which is connected between said first power-supply terminal and each of said capacitive output nodes for receiving the detection signal from said detection means, each said switching means turning on upon receipt of the detection signal from said detection means and fixing a potential of said capacitive output node at the first level.

Claim 15

The dynamic latch circuit according to claim 11, further comprising an operation circuit which is connected between said first and second power-supply terminals to receive the output signal generated at least one of said capacitive output nodes and which operates in accordance with the output signal, wherein a short-circuit current is prevented from flowing between said first and second power-supply terminals through said operation circuit by fixing the potential at said capacitive output node at the first level when said switching means is turned on.

Claim 16

The dynamic latch circuit according to claim 12, wherein said register sections are connected in cascade to constitute a shift register, and said operation circuit comprises a CMOS inverter for functioning as an output buffer for said register sections connected to cascade.

Claim 17

The dynamic latch circuit according to claim 13, wherein said detection means includes timer means for detecting when said present pulse interval of said control clock signal exceeds a predetermined reference period equal to an interval determined by said frequency.

Claim 18

The dynamic latch circuit according to claim 14, wherein said timer means includes capacitive means, charging means for charging the capacitive means, discharging means for discharging the capacitive means, in response to each clock pulse, and voltage-detecting means for detecting that the voltage of said capacitive means has reached a predetermined value after said reference period has elapsed.

Claim 19

The dynamic latch circuit according to claim 15, wherein said charging means includes resistor means for limiting current accumulated in said capacitive means.

Claim 20

The dynamic latch circuit according to claim 16, wherein said voltage-detecting means includes a CMOS inverter having a threshold voltage of said predetermined value.