US4920070A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for forming wirings for a semiconductor device by filling very narrow via holes
Assignee: Fujitsu Ltd
•
Filing: 1987-11-27
•
Granted: 1990-04-24
•
Expires: 2007-11-27
Abstract
Abstract A method for fabricating a semiconductor device with via holes, each having a width less than one micrometer and an aspect ratio more than one, assures proper filling of the via rolls with metal from a sputtered metal layer on an insulating layer having the via holes and formed on a semiconductor substrate by using a pulsed laser beam for planarization. The sputtered metal layer must be thick enough to provide the planarized metal layer with 0.5 micrometer thickness in the vicinity of the via holes for avoiding the planarized metal layer being torn around the via holes and thin enough not so as to produce caves when the sputtered metal layer is planarized by the pulsed laser beam.
Inventors
- 👤 Ryoichi Mukai
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 01:39
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/057; H10P; H10P95/00
Claims Analysis
Total Claims: 29
Claim 1
Independent Claim
135 words
A method for fabricating a semiconductor device, comprising the steps of: (a) forming an insulating layer on a semiconductor substrate; (b) forming a recess, having a width of less than 1.0 micrometer and an aspect ratio of more than 1.0, in the insulating layer; (c) depositing metal material by sputtering on the insulating layer and in the recess for forming a layer of the metal material having a first thickness; and (d) irradiating a pulsed energy beam over the layer of the metal material on the insulating layer for melting the metal material to form a planarized metal layer extending from the metal material filled in the recess over the insulating layer, the first thickness being such that the planarized metal layer has a thickness more than 0.5 micrometers in the vicinity of the recess.
Claim 2
Independent Claim
135 words
A method for fabricating a semiconductor device, comprising the steps of: (a) forming an insulating layer on a semiconductor substrate; (b) forming a recess, having a width of less than 1.0 micrometer and an aspect ratio of more than 1.0, in the insulating layer; (c) depositing metal material by sputtering on the insulating layer and in the recess for forming a layer of the metal material having a first thickness; and (d) irradiating a pulsed energy beam over the layer of the metal material on the insulating layer for melting the metal material to form a planarized metal layer extending from the metal material filled in the recess over the insulating layer, the first thickness being such that the planarized metal layer has a thickness more than 0.5 micrometers in the vicinity of the recess.
Claim 3
Dependent Claim
17 words
A method according to claim 1, wherein said recess is a via hole through the insulating layer.
Claim 4
Dependent Claim
16 words
A method according to claim 1, wherein said recess is a groove in the insulating layer.
Claim 5
Dependent Claim
20 words
A method according to claim 1, wherein said recess comprises a groove and a via hole opening in the groove.
Claim 6
Dependent Claim
39 words
A method according to claim 1, wherein the insulating layer comprises a first insulating layer and a second insulating layer formed on the first insulating layer and having a lower heat conductivity than that of the first insulating layer.
Claim 7
Dependent Claim
22 words
A method according to claim 1, wherein the metal material is selected from the group consisting of aluminum and an aluminum alloy.
Claim 8
Dependent Claim
25 words
A method according to claim 1, wherein said pulsed energy beam is a pulsed laser beam with a pulse width of less than 100 nanoseconds.
Claim 9
Dependent Claim
16 words
A method according to claim 7, wherein the pulsed laser beam is an excimer laser beam.
Claim 10
Dependent Claim
28 words
A method according to claim 6, wherein the step (d) is carried out in an atmosphere selected from the group consisting of a vacuum and an inert gas.
Claim 11
Dependent Claim
16 words
A method according to claim 1, wherein the step (d) further comprises heating the semiconductor substrate.
Claim 12
Dependent Claim
17 words
A method according to claim 1, further comprising the step of: (e) patterning the planarized metal layer.
Claim 13
Dependent Claim
26 words
A method according to claim 1, wherein said insulating layer is selected from the group consisting of silicon dioxide, phosphosilicate glass (PSG) and borophosphosilicate glass (PBSG).
Claim 14
Dependent Claim
36 words
A method according to claim 5, wherein said first insulating layer is Si 3 N 4 , and said second insulating layer is selected from the group consisting of silicon dioxide, phosphosilicate glass and borophosphosilicate glass.
Claim 15
Dependent Claim
12 words
A method according to claim 1, wherein said semiconductor substrate is silicon.
Claim 16
Independent Claim
212 words
A method of fabricating a semiconductor device comprising the steps of: (a) forming a first insulating layer and a second insulating layer, the first insulating layer being formed on a surface of the semiconductor substrate, the heat conductivity of the first insulating layer being greater than that of the second insulating layer; (b) forming a groove in the second insulating layer; (c) forming via holes in the groove through the first insulating layer having diameters of less than one μm and aspect ratios of more than 1.0; (d) depositing metal material by sputtering on the second insulating layer and in the groove and the via holes for forming a layer of the metal material having a first thickness; (e) irradiating a pulsed energy beam on the metal material over the second insulating layer for melting the metal material and forming a planarized metal layer extending from the metal material filled in the groove and the via holes, the first thickness being such that the planarized metal layer has a thickness of more than 0.5 micrometers in the vicinity of the groove; and (f) removing the planarized metal layer while leaving the metal material in the groove and in the via holes for forming a buried metal interconnection therein having a flattened surface.
Claim 17
Independent Claim
212 words
A method of fabricating a semiconductor device comprising the steps of: (a) forming a first insulating layer and a second insulating layer, the first insulating layer being formed on a surface of the semiconductor substrate, the heat conductivity of the first insulating layer being greater than that of the second insulating layer; (b) forming a groove in the second insulating layer; (c) forming via holes in the groove through the first insulating layer having diameters of less than one μm and aspect ratios of more than 1.0; (d) depositing metal material by sputtering on the second insulating layer and in the groove and the via holes for forming a layer of the metal material having a first thickness; (e) irradiating a pulsed energy beam on the metal material over the second insulating layer for melting the metal material and forming a planarized metal layer extending from the metal material filled in the groove and the via holes, the first thickness being such that the planarized metal layer has a thickness of more than 0.5 micrometers in the vicinity of the groove; and (f) removing the planarized metal layer while leaving the metal material in the groove and in the via holes for forming a buried metal interconnection therein having a flattened surface.
Claim 18
Dependent Claim
206 words
A method according to claim 15, further comprising the steps of: (g) forming a third insulating layer on said surface of the buried metal interconnection, and forming a fourth insulating layer having a lower heat conductivity than that of the third insulating layer on the third insulating layer; (h) forming a groove in the fourth insulating layer; (i) forming via holes in the groove through the third insulating layer having diameters of less than one μm and aspect ratios of more than 1.0; (j) depositing metal material by sputtering on the fourth insulating layer so as to form a layer of the metal material having a second thickness; (k) irradiating a pulsed energy beam on the metal material over the fourth insulating layer so as to melt the metal material to form a planarized metal layer extending from the metal material filled in the groove and the via holes, the second thickness being such that the planarized metal layer has a thickness more than 0.5 micrometers in the vicinity of the groove; and (l) removing the planarized metal layer while leaving the metal material in the groove and in the via holes so as to provide a multi-level buried metal interconnection therein having a flattened surface.
Claim 19
Dependent Claim
22 words
A method according to claim 15, wherein the metal material is selected from the group consisting of aluminum and an aluminum alloy.
Claim 20
Dependent Claim
24 words
A method according to claim 15, wherein said pulsed energy beam is a pulsed laser beam with a pulse width less than 100 nanoseconds.
Claim 21
Dependent Claim
16 words
A method according to claim 18, wherein the pulsed laser beam is an excimer laser beam.
Claim 22
Dependent Claim
28 words
A method according to claim 17, wherein the step (e) is carried out in an atmosphere selected from the group consisting of a vacuum and an inert gas.
Claim 23
Dependent Claim
16 words
A method according to claim 15, wherein the step (e) further comprises heating the semiconductor substrate.
Claim 24
Dependent Claim
33 words
A method according to claim 15, wherein the first insulating layer is Si 3 N 4 and said second insulating layer is selected from the group consisting of phosphosilicate glass and borophosphosilicate glass.
Claim 25
Dependent Claim
12 words
A method according to claim 15, wherein said semiconductor substrate is silicon.
Claim 26
Independent Claim
103 words
A method of fabricating a semiconductor device comprising the steps of: (a) forming an insulating layer having a thickness of 1 μm on a semiconductor substrate; (b) forming via holes through the insulating layer having widths of less than 1.0 micrometer and aspect ratios of more than 1.0; (c) depositing metal material on the insulating layer to form a metal material layer having a depth of 0.8 μm; (d) heating the semiconductor device to 300° C.-400° C.; and (e) irradiating the metal material layer with a pulsed energy beam for melting the material and forming a planarized metal layer over the insulating layer.
Claim 27
Independent Claim
103 words
A method of fabricating a semiconductor device comprising the steps of: (a) forming an insulating layer having a thickness of 1 μm on a semiconductor substrate; (b) forming via holes through the insulating layer having widths of less than 1.0 micrometer and aspect ratios of more than 1.0; (c) depositing metal material on the insulating layer to form a metal material layer having a depth of 0.8 μm; (d) heating the semiconductor device to 300° C.-400° C.; and (e) irradiating the metal material layer with a pulsed energy beam for melting the material and forming a planarized metal layer over the insulating layer.
Claim 28
Dependent Claim
32 words
A method according to claim 5, wherein the first insulating layer is SiO 2 , and the second insulating layer is selected from the group consisting of phosphosilicate glass and borophosphosilicate glass.
Claim 29
Dependent Claim
32 words
A method according to claim 15, wherein the first insulating layer is SiO 2 , and the second insulating layer is selected from the group consisting of phosphosilicate glass and borophosphosilicate glass.
References Cited (Backward Citations)
JPS55162244A
Cited
US4261764A
Cited
US4327476A
Cited
JPS5996746A
Cited
US4562640A
Cited
US4592802A
Cited
JPS6188543A
Cited
JPS6193650A
Cited
JPS61152040A
Cited
US4800179A
Cited
US4758533A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-04-23 | 1993-10-23 | 1994-04-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-04-23 | 1997-10-23 | 1998-04-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-04-23 | 2001-10-23 | 2002-04-24 | $7700.00 | Window Closed / Lapsed |