Abstract PCT No. PCT/GB87/00575 Sec. 371 Date Jun. 14, 1989 Sec. 102(e) Date Jun. 14, 1989 PCT Filed Aug. 17, 1987 PCT Pub. No. WO89/01702 PCT Pub. Date Feb. 25, 1989.A LOCOS process, a process of the type wherein a capped recessed mesa structure (1,3) is defined in single crystal, semiconductor grade, silicon and thereafter, and in the presence of the capping layers (5,7), local oxide (13) is thermally grown to provide an isolation structure. This process is modified (FIG. 3) by introducing a layer (11) of passive oxide deposit to cover the substrate (3), mesa (1) and upper capping layer (7) prior to the thermal growth of further oxide (13). The resulting oxide (13) is then etched back to remove excess material. This modification results in reduced bird's head height non-planarity and also in reduced bird's beak encroachment into the active area of the silicon device (3). Re-entrancy at the base of the bird's head (13) is also eliminated.
A local oxidation of silicon process, a process wherein a capped single crystal silicon mesa is defined in a silicon substrate and thereafter an isolating structure of local field oxide is grown by thermal oxidation of the silicon; wherein a layer of passive oxide is deposited upon the surfaces of the mesa cap, the mesa sidewall, and the silicon substrate prior to said thermal oxidation; thermal oxidation is performed in the presence of said layer; and, excess oxide removed thereafter by etching.
Claim 2
Dependent Claim
82 words
A local oxidation of silicon process, a process wherein a capped single crystal silicon mesa is defined in a silicon substrate and thereafter an isolating structure of local field oxide is grown by thermal oxidation of the silicon; wherein a layer of passive oxide is deposited upon the surfaces of the mesa cap, the mesa sidewall, and the silicon substrate prior to said thermal oxidation; thermal oxidation is performed in the presence of said layer; and, excess oxide removed thereafter by etching.
Claim 3
Dependent Claim
33 words
A process, as claimed in claim 1, wherein the mesa is capped by a layer of pad oxide and on this a layer of nitride, each layer being of thickness 1000Å or less.
Claim 4
Dependent Claim
25 words
A process, as claimed in claim 2, wherein the pad oxide and nitride layers are of thickness 375Å or less and 500Å or less, respectively.