Selective epitaxial growth structure and isolation

Claim 2

An array of integrated circuit devices, comprising: a monocrystalline silicon substrate having an upper and lower portion, said upper portion being doped in accordance with types of devices being formed, said lower portion forming subcollectors for said devices, said substrate having a plurality of trenches formed therein, said trenches extending through said upper portion into said lower portion; an oxide layer formed in each of said trenches, each said oxide layer having an opening to said lower portion of said substrate; epitaxial silicon filling each of said trenches; a first plurality of active device elements formed in said epitaxial silicon, said first plurality of active device elements being appropriately doped so as to form a plurality of P-N junctions between adjacent ones of said first plurality of active device elements, said P-N junctions between said active device elements having equal areas, and being vertically aligned with each said opening, a first plurality of devices thereby being formed; and a second plurality of active device elements formed in said upper portion of said substrate between consecutive ones of said trenches, said second plurality of active device elements forming a second plurality of devices complementary in type to said first plurality of devices.

Claim 3

An array as claimed in claim 1, wherein said trenches are trapezoidally-shaped.

Claim 4

An array as claimed in claim 2, wherein said first plurality of devices are bipolar transistors.

Claim 5

An array as claimed in claim 3, wherein each of said bipolar transistors comprises a collector formed by out-diffusing a corresponding one of said subcollectors, a base having a width substantially equal to that of a corresponding one of said trenches, and an emitter formed in an opening of a masking layer grown over said upper portion of said substrate and being narrower in width than said base, each of said bipolar transistors further comprising a base contact formed in a surface of said array, whereby contact with said base is established on a surface of said array.

Claim 6

An array as claimed in claim 4, wherein said upper portion of said substrate has an appropriately-doped portion formed in an upper region thereof adjacent said oxide layer, whereby contact with said base is established by connecting said appropriately-doped portion with said base contact.

Claim 7

An array as claimed in claim 2, wherein said first and second pluralities of devices constitute a complementary NPN-PNP device configuration.

Claim 8

An array as claimed in claim 2, wherein a first edge of said trapezoidally-shaped regions nearer said lower portion of said substrate is shorter than an edge of said trapezoidally-shaped regions opposite said first edge.

Claim 9

An array as claimed in claim 1, wherein said first plurality of devices are bipolar transistors.

Claim 10

An array as claimed in claim 8, wherein each of said bipolar transistors comprises a collector formed by out-diffusing a corresponding one of said subcollectors, a base having a width substantially equal to that of a corresponding one of said trenches, and an emitter formed in an opening of a masking layer grown over said upper portion of said substrate and being narrower in width than said base, each of said bipolar transistors further comprising a base contact formed in a surface of said array, whereby contact with said base is established on a surface of said array.

Claim 11

An array as claimed in claim 9, wherein said upper portion of said substrate has an appropriately-doped portion formed in an upper region thereof adjacent said oxide layer, whereby contact with said base is established by connecting said appropriately-doped portion with said base contact.

Claim 12

An array of bipolar metal oxide semiconductor (MOS) integrated circuit devices, comprising: a monocrystalline silicon substrate having an upper and lower portion, said upper portion being doped in accordance with types of devices being formed, said lower portion forming subcollectors for said devices, said substrate having a plurality of trenches formed therein, said trenches extending through said upper portion into said lower portion; an oxide layer formed in each of said trenches, each said oxide layer having an opening to said lower portion of said substrate; epitaxial silicon filling each of said trenches; a first plurality of active device elements formed in said epitaxial silicon, said first plurality of active device elements being appropriately doped so as to form a plurality of P-N junctions between adjacent ones of said first plurality of active device elements, said P-N junctions between said active device elements having equal areas, and being vertically aligned with each said opening, a first plurality of bipolar MOS transistors thereby being formed; and a second plurality of active device elements formed in said upper portion of said substrate between consecutive ones of said trenches, said second plurality of active device elements forming a second plurality of devices complementary in type to said first plurality of devices.

Claim 13

An array of bipolar metal oxide semiconductor (MOS) integrated circuit devices, comprising: a monocrystalline silicon substrate having an upper and lower portion, said upper portion being doped in accordance with types of devices being formed, said lower portion forming subcollectors for said devices, said substrate having a plurality of trenches formed therein, said trenches extending through said upper portion into said lower portion; an oxide layer formed in each of said trenches, each said oxide layer having an opening to said lower portion of said substrate; epitaxial silicon filling each of said trenches; a first plurality of active device elements formed in said epitaxial silicon, said first plurality of active device elements being appropriately doped so as to form a plurality of P-N junctions between adjacent ones of said first plurality of active device elements, said P-N junctions between said active device elements having equal areas, and being vertically aligned with each said opening, a first plurality of bipolar MOS transistors thereby being formed; and a second plurality of active device elements formed in said upper portion of said substrate between consecutive ones of said trenches, said second plurality of active device elements forming a second plurality of devices complementary in type to said first plurality of devices.

Claim 14

An array of integrated circuit devices, comprising: a gallium arsenide substrate having an upper and lower portion, said upper portion being doped in accordance with types of devices being formed, said lower portion forming subcollectors for said devices, said substrate having a plurality of trenches formed therein, said trenches extending through said upper portion into said lower portion; an oxide layer formed in each of said trenches, each said oxide layer having an opening to said lower portion of said substrate; epitaxial gallium arsenide filling each of said trenches; a first plurality of active device elements formed in said epitaxial gallium arsenide, said first plurality of active device elements being appropriately doped so as to form a plurality of P-N junctions between adjacent ones of said first plurality of active device elements, said P-N junctions between said active device elements having equal areas, and being vertically aligned with each said opening, a first plurality of devices thereby being formed; and a second plurality of active device elements formed in said upper portion of said substrate between consecutive ones of said trenches, said second plurality of active device elements forming a second plurality of devices complementary in type to said first plurality of devices.

Claim 15

An array of integrated circuit devices, comprising: a gallium arsenide substrate having an upper and lower portion, said upper portion being doped in accordance with types of devices being formed, said lower portion forming subcollectors for said devices, said substrate having a plurality of trenches formed therein, said trenches extending through said upper portion into said lower portion; an oxide layer formed in each of said trenches, each said oxide layer having an opening to said lower portion of said substrate; epitaxial gallium arsenide filling each of said trenches; a first plurality of active device elements formed in said epitaxial gallium arsenide, said first plurality of active device elements being appropriately doped so as to form a plurality of P-N junctions between adjacent ones of said first plurality of active device elements, said P-N junctions between said active device elements having equal areas, and being vertically aligned with each said opening, a first plurality of devices thereby being formed; and a second plurality of active device elements formed in said upper portion of said substrate between consecutive ones of said trenches, said second plurality of active device elements forming a second plurality of devices complementary in type to said first plurality of devices.

Claim 16

An array as claimed in claim 12, wherein said first plurality of devices are bipolar transistors.

Claim 17

An array as claimed in claim 13, wherein each of said bipolar transistors comprises a collector formed by out-diffusing a corresponding one of said subcollectors, a base having a width substantially equal to that of a corresponding one of said trenches, and an emitter formed in an opening of a masking layer grown over said upper portion of said substrate and being narrower in width than said base, each of said bipolar transistors further comprising a base contact formed in a surface of said array, whereby contact with said base is established on a surface of said array.

Claim 18

An array as claimed in claim 14, wherein said upper portion of said substrate has an appropriately-doped portion formed in an upper region thereof adjacent said oxide layer, whereby contact with said base is established by connecting said appropriately-doped portion with said base contact.