US4902645A
Expired / Lapsed
US
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Method of selectively forming a silicon-containing metal layer
Assignee: Fujitsu Semiconductor Ltd
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Filing: 1988-08-23
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Granted: 1990-02-20
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Expires: 2008-08-23
Abstract
Abstract A method of selectively forming (growing or depositing) a silicon-containing metal layer on an exposed surface of a semiconductor substrate or a conductor by using a metal halide gas and a silicon hydride gas at a ratio of a flow rate of the latter gas to that of the former gas (e.g., Si n H 2n+2 /WF 6 ) of 2 or less, and setting a growth temperature at 200° C. or less. When a Si 3 H 8 gas and a WF 6 gas, in particular, are used at a ratio of the flow rates (Si 3 H 8 /WF 6 ) of 1.0 or less, and the deposition temperature is set at 100° C. to room temperature, a silicon-containing tungsten layer is selectively deposited (formed).
Inventors
- 👤 Takayuki Ohba
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 07:46
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/40; H10P14/42; H10P14/43; H10P14/432; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/057; Y; Y10; Y10S; Y10S148/00; Y10S148/019; Y10S148/147
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
109 words
A method of forming a silicon-containing metal layer on a substrate with a surface of a conductor or a semiconductor and a surface of an insulator by a low pressure chemical vapor deposition using a metal halide gas and a silicon hydride gas as reaction gases, characterized in that a ratio of the flow rate of said silicon hydride gas to that of said metal halide gas is 2 or less and the deposition temperature is 200° C. or less, to selectively deposit said silicon-containing metal layer having a ratio of silicon to metal of 0.6 or less on said surface of the conductor or semiconductor of the substrate.
Claim 2
Independent Claim
109 words
A method of forming a silicon-containing metal layer on a substrate with a surface of a conductor or a semiconductor and a surface of an insulator by a low pressure chemical vapor deposition using a metal halide gas and a silicon hydride gas as reaction gases, characterized in that a ratio of the flow rate of said silicon hydride gas to that of said metal halide gas is 2 or less and the deposition temperature is 200° C. or less, to selectively deposit said silicon-containing metal layer having a ratio of silicon to metal of 0.6 or less on said surface of the conductor or semiconductor of the substrate.
Claim 3
Dependent Claim
39 words
A method according to claim 1 wherein said surface of the conductor or semiconductor is an exposed surface within a contact hole opened in an insulator film or an exposed surface of a conductor layer formed on an insulator.
Claim 4
Dependent Claim
34 words
A method according to claim 1 or 2 wherein the metal of said silicon-containing metal layer contains at least one metal selected from the group consisting of tungsten, molybdenum, titanium, tantalum, platinum and palladium.
Claim 5
Dependent Claim
11 words
A method according to claim 3 wherein said metal is tungsten.
Claim 6
Dependent Claim
16 words
A method according to claim 3 wherein said metal halide gas is a metal fluoride gas.
Claim 7
Dependent Claim
31 words
A method according to claim 5 wherein said metal fluoride gas contains one selected from the group consisting of WF 6 , MoF 6 , TaF 5 and TiF 4 .
Claim 8
Dependent Claim
16 words
A method according to claim 3 wherein said metal halide gas is a metal chloride gas.
Claim 9
Dependent Claim
31 words
A method according to claim 7 wherein said metal chloride gas contains one selected from the group consisting of WCl 6 , MoCl 6 , TaCl 5 and TiCl 4 .
Claim 10
Dependent Claim
28 words
A method according to claim 1 wherein said silicon hydride gas is a gas having a chemical formula: Si n H 2n+2 wherein n is at least 1.
Claim 11
Dependent Claim
62 words
A method according to claim 3 wherein said silicon hydride gas is a silane (SiH 4 ) gas, said metal halide gas is a WF 6 gas, said ratio of flow rate of the SiH 4 gas to that of the WF 6 gas is two or less, and said deposition temperature is in a range of from 200° to 180° C.
Claim 12
Dependent Claim
67 words
A method according to claim 3 wherein said silicon hydride gas is a disilane (Si 2 H 6 ) gas, said metal halide gas is a WF 6 gas, said ratio of a flow rate of the Si 2 H 6 gas to that of the WF 6 gas is 1 or less, and said deposition temperature is in a range of from 200° to 80° C.
Claim 13
Dependent Claim
68 words
A method according to claim 3 wherein said silicon hydride gas is a trisilane (Si 3 H 8 ) gas, said metal halide gas is a WF 6 gas, said ratio of a flow rate of the Si 3 H 8 gas to that of the WF 6 gas is 0.7 or less, and said deposition temperature is in a range of from 100° C. to room temperature.
Claim 14
Dependent Claim
29 words
A method according to claim 1 further comprising the step of cleaning said surface of the conductor or semiconductor by an etching treatment immediately before said vapor phase deposition.
Claim 15
Dependent Claim
42 words
A method according to claim 13 wherein said etching treatment is a dry-etching process using an etching gas selected from the group consisting of NF 3 , carbon halide, SF 6 , BCl 3 , H 2 , and an inert gas.
Claim 16
Dependent Claim
31 words
A method according to claim 14 wherein, in said dry-etching process, said etching gas is activated with energy selected from the group consisting of microwaves, high-frequency waves, and an energy ray.
Claim 17
Dependent Claim
74 words
A method according to claim 3 further comprising, before said vapor phase deposition, the step of selectively forming a buffer layer of metal, or silicon-containing metal, on said surface of the conductor or semiconductor by heating said surface at a high temperature in the range of from 400° to 500° C. for a short period of from 10 to 30 seconds in a gas mixture containing said metal halide gas and a reducing gas.
Claim 18
Dependent Claim
36 words
A method according to claim 16 wherein said buffer layer comprises tungsten which or silicon-containing tungsten is selectively formed by using a WF 6 gas and said reducing gas of H 2 or SiH 4 respectively.
Claim 19
Dependent Claim
72 words
A method according to claim 17 wherein said silicon-containing metal layer is formed to a desired thickness on said buffer layer by using a WF 6 gas and a Si n H 2n+2 where n=2,3, or 4 gas at a ratio of the flow rate of the Si n H 2n+2 gas to that of the WF 6 gas of 1 or less at a deposition temperature of 200° C. or less.
Claim 20
Independent Claim
225 words
A method of fabricating a semiconductor device provided with a multilevel interconnection structure having conductor layers of aluminum or aluminum alloy, comprising steps of: (a) forming a first conductor layer on an insulating film formed on a semiconductor substrate; (b) selectively depositing a first silicon-containing layer on a surface of said first conductor layer without substantial deposit thereof on insulating surfaces; (c) forming an interlaminar insulating film overall; (d) selectively etching said interlaminar insulating film to open a contact hole in which a portion of said first conductor layer is exposed; (e) selectively depositing a second silicon-containing metal layer having a ratio of silicon to metal of 0.6 or less within said contact hole without substantial deposit thereof an insulating surface; (f) forming a second conductor layer over said second silicon-containing metal layer and said interlaminar insulating film; and (g) selectively depositing a third silicon-containing metal having a ratio of silicon to metal of 0.6 or less layer on said second conductor layer without substantial deposit thereof on insulating surfaces, wherein, said steps (b), (e) and (g) are carried out by using a metal halide gas and a silicon hydride gas as reaction gases at ratio of a flow rate of said silicon hydride gas to that of the metal halide gas of 2 or less at a deposition temperature of 200° C. or less.
Claim 21
Independent Claim
225 words
A method of fabricating a semiconductor device provided with a multilevel interconnection structure having conductor layers of aluminum or aluminum alloy, comprising steps of: (a) forming a first conductor layer on an insulating film formed on a semiconductor substrate; (b) selectively depositing a first silicon-containing layer on a surface of said first conductor layer without substantial deposit thereof on insulating surfaces; (c) forming an interlaminar insulating film overall; (d) selectively etching said interlaminar insulating film to open a contact hole in which a portion of said first conductor layer is exposed; (e) selectively depositing a second silicon-containing metal layer having a ratio of silicon to metal of 0.6 or less within said contact hole without substantial deposit thereof an insulating surface; (f) forming a second conductor layer over said second silicon-containing metal layer and said interlaminar insulating film; and (g) selectively depositing a third silicon-containing metal having a ratio of silicon to metal of 0.6 or less layer on said second conductor layer without substantial deposit thereof on insulating surfaces, wherein, said steps (b), (e) and (g) are carried out by using a metal halide gas and a silicon hydride gas as reaction gases at ratio of a flow rate of said silicon hydride gas to that of the metal halide gas of 2 or less at a deposition temperature of 200° C. or less.
Claim 22
Dependent Claim
19 words
A method as claimed in claim 1 wherein the ratio of silicon to metal is about 0.01 to 0.1.
Claim 23
Dependent Claim
19 words
A method as claimed in claim 19 wherein the ratio of silicon to metal is about 0.01 to 0.1.
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| 7.5 Years (Year 8) | 1997-02-19 | 1997-08-21 | 1998-02-20 | $3760.00 | Window Closed / Lapsed |
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