Patent US3229503A successfully refreshed from Google Patents.
Patent US4897598A successfully refreshed from Google Patents.
US4897598A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards
Assignee: Siemens AG
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Filing: 1988-03-07
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Granted: 1990-01-30
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Expires: 2008-03-07
Abstract
Abstract Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards. In the electrical function testing of wiring matrices, particularly of printed circuit boards, the number of required leads and switch elements can be drastically reduced. In the present apparatus, every measuring locations of the printed circuit board can be selected by an associated busbar and by an intermediate mask that prevents the contacting of non-selected measuring locations. The busbars preferably are orientated transversely relative to the principal direction of the wiring of the printed circuit board.
Inventors
- 👤 Guenter Doemens
- 👤 Thomas Rose
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 11:48
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07364; G01R1/07371
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
137 words
An apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards, having a carrier plate that is placed over the wiring matrices and in which a plurality of contact elements are arranged, whereby at least two selected measuring locations of a wiring matrix are respectively contactable via the allocated contact elements, comprising a cover plate having a plurality of parallel spaced busbars, said cover plate located adjacent an opposite side of said carrier plate from an intermediate mask, every measuring location of the wiring matrix selectably contactable by an allocated busbar of said plurality of busbars and by said contact elements, said intermediate mask insertable between the carrier plate and the wiring matrix, that prevents the contacting of non-selected measuring locations, wherein the contact elements are formed by gas discharge channels provided with electrodes.
Claim 2
Independent Claim
137 words
An apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards, having a carrier plate that is placed over the wiring matrices and in which a plurality of contact elements are arranged, whereby at least two selected measuring locations of a wiring matrix are respectively contactable via the allocated contact elements, comprising a cover plate having a plurality of parallel spaced busbars, said cover plate located adjacent an opposite side of said carrier plate from an intermediate mask, every measuring location of the wiring matrix selectably contactable by an allocated busbar of said plurality of busbars and by said contact elements, said intermediate mask insertable between the carrier plate and the wiring matrix, that prevents the contacting of non-selected measuring locations, wherein the contact elements are formed by gas discharge channels provided with electrodes.
Claim 3
Dependent Claim
23 words
The apparatus according to claim 1, wherein the electrodes are formed by those sections of the busbars crossing over the gas discharge channels.
Claim 4
Dependent Claim
23 words
The apparatus according to claim 1, wherein the intermediate mask is arranged between the carrier plate and the wiring matrix to be tested.
Claim 5
Dependent Claim
21 words
The apparatus according to claim 1, wherein holes aligned with the respectively selected measuring locations are present in the intermediate mask.
Claim 6
Dependent Claim
17 words
The apparatus according to claim 1, wherein the measuring locations have associated busbars arranged in parallel rows.
Claim 7
Dependent Claim
27 words
The apparatus according to claim 5, wherein the busbars are orientated transversely relative to the principal directions of the wiring of the wiring matrices to be tested.
Claim 8
Dependent Claim
28 words
The apparatus according to claim 6, wherein the busbars are orientated at an angle of 45° relative to the principal directions of the wiring matrices to be tested.
Claim 9
Independent Claim
164 words
An apparatus for electrical function testing of printed circuit boards having a plurality of measuring locations, the apparatus having a carrier plate in which a plurality of contact elements are arranged for contacting said measuring locations, comprising: an intermediate mask located between the printed circuit board and the carrier plate, the intermediate mask having a predetermined pattern of holes in alignment with selected measuring locations of the plurality of measuring locations thereby allowing contacting of the selected measuring locations by corresponding contact elements and preventing contacting of non-selected measuring locations by corresponding contact elements; a cover plate having a plurality of parallel spaced busbars, said cover plate located adjacent an opposite side of said carrier plate from the intermediate mask, an electrical connection established from a selected busbar to a selected measuring location via the corresponding contact element in the carrier plate and via the corresponding hole in the intermediate mask; and the contact elements being formed by gas discharge channels provided with electrodes.
Claim 10
Independent Claim
164 words
An apparatus for electrical function testing of printed circuit boards having a plurality of measuring locations, the apparatus having a carrier plate in which a plurality of contact elements are arranged for contacting said measuring locations, comprising: an intermediate mask located between the printed circuit board and the carrier plate, the intermediate mask having a predetermined pattern of holes in alignment with selected measuring locations of the plurality of measuring locations thereby allowing contacting of the selected measuring locations by corresponding contact elements and preventing contacting of non-selected measuring locations by corresponding contact elements; a cover plate having a plurality of parallel spaced busbars, said cover plate located adjacent an opposite side of said carrier plate from the intermediate mask, an electrical connection established from a selected busbar to a selected measuring location via the corresponding contact element in the carrier plate and via the corresponding hole in the intermediate mask; and the contact elements being formed by gas discharge channels provided with electrodes.
Claim 11
Dependent Claim
23 words
The apparatus according to claim 8, wherein the electrodes are formed by those sections of the busbars crossing over the gas discharge channels.
Claim 12
Dependent Claim
28 words
The apparatus according to claim 8, wherein the busbars are oriented transversely relative to a principal direction of interconnects between the measuring locations on the printed circuit board.
Claim 13
Dependent Claim
25 words
The apparatus according to claim 10, wherein the busbars are oriented at an angle of approximately 45° relative to the principal direction of the interconnects.
References Cited (Backward Citations)
US3806800A
Cited
US3963986A
Cited
US4056773A
Cited
US4179170A
Cited
US4352061A
Cited
GB2085673A
Cited
EP0102565A2
Cited
US4600878A
Cited
US4724377A
Cited
EP0115135A1
Cited
US4685753A
Cited
US4724383A
Cited
EP0216135A1
Cited
EP0218058A1
Cited
US4705329A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-01-29 | 1993-07-31 | 1994-01-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-01-29 | 1997-07-31 | 1998-01-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-01-29 | 2001-07-31 | 2002-01-30 | $7700.00 | Window Closed / Lapsed |