US4882609A
Expired / Lapsed
US
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Semiconductor devices with at least one monoatomic layer of doping atoms
Assignee: Max-Planck-Gesellschaft zur Förderung der Wissenschaften eV
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Filing: 1985-11-14
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Granted: 1989-11-21
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Expires: 2005-11-14
Abstract
Abstract A semiconductor device consisting of epitaxial material is provided with at least one monoatomic layer of doping atoms, i.e. with a layer which is just one atom thick. A particularly preferred device is a field effect transistor in which case the Dirac-delta doped layer 13 extends between the source and drain zones (18, 19) respectively. The field effect transistor can be constructed either with a homogeneous structure or with a hetero structure or with a superlattice structure. The field effect transistors described herein have a high transconductance and are capable of operating at high current densities.
Inventors
- 👤 Erdmann Schubert
- 👤 Klaus Ploog
- 👤 Albrecht Fischer
- 👤 Yoshiji Horikoshi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 22:36
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10H20/811; H10H20/812; B; B82; B82Y; B82Y20/00; H01; H01S; H01S5/00; H01S5/30; H01S5/305; H01S5/34; H10D; H10D10/00; H10D30/00; H10D30/40; H10D30/47; H10D30/471; H10D30/475; H10D30/4755; H10D62/00; H10D62/10; H10D62/17; H10D62/213; H10D62/221; H10D62/228; H10D62/60; H10D62/605; H10D62/80; H10D62/81; H10D62/815; H10D62/8161; H10D62/8162; H10D62/8164; H10D62/8171; H10D8/00; H10D8/40; H10F; H10F30/00; H10F30/20; H10F30/21; H10F77/00; H10F77/10; H10F77/14; H10F77/146; H01S5/3054; H01S5/3059; H01S5/3408
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
221 words
A field effect transistor formed of compositional epitaxial material grown in layers on a planar substrate, comprising: a first layer of a semiconductor material of a first composition, having a first bandgap, said first layer being substantially thickner than a monoatomic layer of the same material and being substantially undoped; a second layer of a semiconductor material of a second composition having a second bandgap smaller than the first bandgap of the semiconductor material of the first composition, said second layer being substantially thicker than a monoatomic layer of the same material and being substantially undoped; spaced apart source and drain regions extending through said second layer into said first layer; a conductive channel extending between said source and drain regions; and a gate region, disposed between said source and drain regions, overlying said conductive channel; wherein said conductive channel is formed by at least one monoatomic layer of dopant material of only one conductivity type disposed in said first layer having the first bandgap, and having a doping atom concentration in the range from 10 11 to 10 14 cm -2 , whereby only some atomic positions of said atomic layer are occupied by doping atoms, and wherein said at least one monoatomic layer interconnects said source and drain regions and lies in a plane parallel to said planar substrate.
Claim 2
Dependent Claim
221 words
A field effect transistor formed of compositional epitaxial material grown in layers on a planar substrate, comprising: a first layer of a semiconductor material of a first composition, having a first bandgap, said first layer being substantially thickner than a monoatomic layer of the same material and being substantially undoped; a second layer of a semiconductor material of a second composition having a second bandgap smaller than the first bandgap of the semiconductor material of the first composition, said second layer being substantially thicker than a monoatomic layer of the same material and being substantially undoped; spaced apart source and drain regions extending through said second layer into said first layer; a conductive channel extending between said source and drain regions; and a gate region, disposed between said source and drain regions, overlying said conductive channel; wherein said conductive channel is formed by at least one monoatomic layer of dopant material of only one conductivity type disposed in said first layer having the first bandgap, and having a doping atom concentration in the range from 10 11 to 10 14 cm -2 , whereby only some atomic positions of said atomic layer are occupied by doping atoms, and wherein said at least one monoatomic layer interconnects said source and drain regions and lies in a plane parallel to said planar substrate.
Claim 3
Dependent Claim
32 words
A semiconductor device in accordance with claim 1 wherein one of the two distinct semiconductor materials comprises gallium arsenide GaAs and the other comprises aluminium gallium arsenide Al x Ga 1-x As.
Claim 4
Dependent Claim
239 words
A field effect transistor formed of compositional semiconductor material grown in layers on a planar substrate, comprising: a plurality of first layers of a semiconductor material of a first composition and having a first bandgap, each said first layer being substantially thicker than a monoatomic layer of the same material and being substantially undoped; a plurality of second layers of a semiconductor material of a second composition having a second bandgap smaller than the first bandgap of the semiconductor material of the first composition, each said second layer being substantially thicker than a monoatomic layer of the same material and being substantially undoped, said first and second layers being alternatingly disposed to form a superlattice structure; spaced apart source and drain regions extending through said alternatingly disposed first and second layers; a plurality of conductive channels extending between said source and drain regions; and a gate region, disposed between said source and drain regions, overlying said conductive channels; wherein said conductive channels are formed by at least one monoatomic layer of dopant material of only one conductivity type disposed in each of said second layers of material having the second bandgap, and having a doping atom concentration in the range from 10 11 to 10 14 cm -2 , whereby only some atomic positions are occupied by doping atoms, and wherein said monoatomic layers interconnect said source and drain regions and lie in planes parallel to said planar substrate.
Claim 5
Dependent Claim
239 words
A field effect transistor formed of compositional semiconductor material grown in layers on a planar substrate, comprising: a plurality of first layers of a semiconductor material of a first composition and having a first bandgap, each said first layer being substantially thicker than a monoatomic layer of the same material and being substantially undoped; a plurality of second layers of a semiconductor material of a second composition having a second bandgap smaller than the first bandgap of the semiconductor material of the first composition, each said second layer being substantially thicker than a monoatomic layer of the same material and being substantially undoped, said first and second layers being alternatingly disposed to form a superlattice structure; spaced apart source and drain regions extending through said alternatingly disposed first and second layers; a plurality of conductive channels extending between said source and drain regions; and a gate region, disposed between said source and drain regions, overlying said conductive channels; wherein said conductive channels are formed by at least one monoatomic layer of dopant material of only one conductivity type disposed in each of said second layers of material having the second bandgap, and having a doping atom concentration in the range from 10 11 to 10 14 cm -2 , whereby only some atomic positions are occupied by doping atoms, and wherein said monoatomic layers interconnect said source and drain regions and lie in planes parallel to said planar substrate.
Claim 6
Dependent Claim
32 words
A semiconductor device in accordance with claim 3, wherein one of the two distinct semiconductor materials comprises gallium arsenide GaAs and the other comprises aluminium gallium arsenide Al x Ga 1-x As.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-11-20 | 1993-05-22 | 1993-11-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-11-20 | 1997-05-22 | 1997-11-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-11-20 | 2001-05-22 | 2001-11-21 | $7700.00 | Window Closed / Lapsed |