Electron microscope image output method and apparatus

Claim 1

An apparatus for outputting an electron microscope image, which comprises: (i) two-dimensional sensor for storing an electron beam image of a specimen formed by distribution of electron beam energy, said two-dimensional sensor being in the same vacuum system as an image formation plane of said electron microscope, (ii) a stimulation means for exposing said two-dimensional sensor to light or heat, (iii) a detection means for photoelectrically detecting light emitted by said two-dimensional upon exposure to light or heating, thereby to obtain image signals, and (iv) a signal correction means for correcting the image signals detected at a plurality of divisions into which said specimen has been divided and storage of the electron beam image carried out for each of said divisions, so that signal values of the boundary areas of adjacent divisions become approximately equal to each other, wherein said signal correction means comprises: a first memory means for storing image signals of said plurality of divisions; density data calculating means for calculating mean values for picture element strings at the boundaries between adjacent divisions of said plurality of divisions read from said first memory means and calculating correction coefficient values from said mean values; density data memory means for storing said correction coefficient values; density matching data processing means receiving said correction coefficient values for uniformly correcting said image signals of said plurality of divisions; control means for selectively supplying said correction coefficient values to said density matching data processing means when one of said image signals of one of said plurality of divisions is to be uniformly corrected; and second memory means for storing the output of said density matching data processing means.

Claim 2

An apparatus for outputting an electron microscope image, which comprises: (i) two-dimensional sensor for storing an electron beam image of a specimen formed by distribution of electron beam energy, said two-dimensional sensor being in the same vacuum system as an image formation plane of said electron microscope, (ii) a stimulation means for exposing said two-dimensional sensor to light or heat, (iii) a detection means for photoelectrically detecting light emitted by said two-dimensional upon exposure to light or heating, thereby to obtain image signals, and (iv) a signal correction means for correcting the image signals detected at a plurality of divisions into which said specimen has been divided and storage of the electron beam image carried out for each of said divisions, so that signal values of the boundary areas of adjacent divisions become approximately equal to each other, wherein said signal correction means comprises: a first memory means for storing image signals of said plurality of divisions; density data calculating means for calculating mean values for picture element strings at the boundaries between adjacent divisions of said plurality of divisions read from said first memory means and calculating correction coefficient values from said mean values; density data memory means for storing said correction coefficient values; density matching data processing means receiving said correction coefficient values for uniformly correcting said image signals of said plurality of divisions; control means for selectively supplying said correction coefficient values to said density matching data processing means when one of said image signals of one of said plurality of divisions is to be uniformly corrected; and second memory means for storing the output of said density matching data processing means.

Claim 3

A method of outputting an electron microscope image by exposing a two-dimensional sensor for electron beam energy storage to an electron beam passing through a specimen in a vacuum to have the electron beam energy stored on the two-dimensional sensor, then exposing the two-dimensional sensor to light or heat to release the stored energy as light emission, photoelectrically detecting the emitted light to obtain image signals, and outputting an electron beam image of the specimen on the basis of the image signals, wherein the improvement comprises the steps of: (i) dividing said specimen into a plurality of divisions and carrying out said storage of the electron beam energy for each of said divisions, (ii) combining said image signals obtained at said divisions so that composite image signals represent an overall specimen image formed by a group of said divisions, and (iii) correcting said image signals so that signal values of the boundary areas of adjacent divisions become approximately equal to each other, wherein a stimulable phosphor sheet is used as said two-dimensional sensor, said stimulable phosphor sheet is exposed to said electron beam passing through said specimen in said vacuum to have the electron beam energy stored on said stimulable phosphor sheet, said stimulable phosphor sheet is then scanned with stimulating rays and is caused thereby to emit light, and the emitted light is detected photoelectrically, wherein said image signal correcting step comprises the following steps: storing image signals of said plurality of divisions; calculating mean values for picture element strings at the boundaries between adjacent divisions of said plurality of divisions; calculating correction coefficient values from said mean values; storing said correction coefficient values; supplying said correction coefficient values to said density matching data processing means when one of said image signals of one of said plurality of divisions is to be uniformly corrected; uniformly correcting said image signals of said plurality of divisions based on said correction coefficient values; and storing said corrected signals and the uncorrected signals.

Claim 4

A method of outputting an electron microscope image by exposing a two-dimensional sensor for electron beam energy storage to an electron beam passing through a specimen in a vacuum to have the electron beam energy stored on the two-dimensional sensor, then exposing the two-dimensional sensor to light or heat to release the stored energy as light emission, photoelectrically detecting the emitted light to obtain image signals, and outputting an electron beam image of the specimen on the basis of the image signals, wherein the improvement comprises the steps of: (i) dividing said specimen into a plurality of divisions and carrying out said storage of the electron beam energy for each of said divisions, (ii) combining said image signals obtained at said divisions so that composite image signals represent an overall specimen image formed by a group of said divisions, and (iii) correcting said image signals so that signal values of the boundary areas of adjacent divisions become approximately equal to each other, wherein a stimulable phosphor sheet is used as said two-dimensional sensor, said stimulable phosphor sheet is exposed to said electron beam passing through said specimen in said vacuum to have the electron beam energy stored on said stimulable phosphor sheet, said stimulable phosphor sheet is then scanned with stimulating rays and is caused thereby to emit light, and the emitted light is detected photoelectrically, wherein said image signal correcting step comprises the following steps: storing image signals of said plurality of divisions; calculating mean values for picture element strings at the boundaries between adjacent divisions of said plurality of divisions; calculating correction coefficient values from said mean values; storing said correction coefficient values; supplying said correction coefficient values to said density matching data processing means when one of said image signals of one of said plurality of divisions is to be uniformly corrected; uniformly correcting said image signals of said plurality of divisions based on said correction coefficient values; and storing said corrected signals and the uncorrected signals.