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US4870923A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus for treating the surfaces of wafers

Assignee: Dainippon Screen Manufacturing Co Ltd
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Filing: 1988-06-27
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Granted: 1989-10-03
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Expires: 2008-06-27
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Abstract

Abstract An apparatus for treating the surface of wafers with a vaporous agent. The apparatus includes an arrangement in which, prior to being discharged, excess vapor stays for a while outside a treating chamber so as to keep the treating vapor and the discharging excess vapor at the same vaporous level. Thus, treating vapor evenly contacts the entire surface of a wafer.

Inventors

  • 👤 Kenji Sugimoto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 07:01
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/04; H10P72/0402; C; C23; C23C; C23C16/00; C23C16/44; C23C16/455; C23C16/45563; C23C16/45565; C23C16/45517; H10P72/70; H10P72/76; H10P72/7604

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 161 words
An apparatus for treating a wafer with treating vapor, said apparatus comprising: a plate member adapted to receive a wafer; a cover member for covering the wafer and for forming a treating chamber between said cover member and said plate member; means for placing said cover member over said plate member with a gap interposed therebetween so as to allow excess vapor to escape from said treating chamber; means for introducing treating vapor into said treating chamber; a discharge chamber comprising slits and means for introducing said excess vapor into said discharge chamber through said slits; and an outer wall provided about said cover member, said outer wall and said cover member defining a space therebetween, said outer wall having a lower rim and an upper rim, said lower rim contacting said plate member and said upper rim being higher than said gap such that the flow of vapor from said treating chamber to said discharge chamber follows a tortious path.
Claim 2
Independent Claim 161 words
An apparatus for treating a wafer with treating vapor, said apparatus comprising: a plate member adapted to receive a wafer; a cover member for covering the wafer and for forming a treating chamber between said cover member and said plate member; means for placing said cover member over said plate member with a gap interposed therebetween so as to allow excess vapor to escape from said treating chamber; means for introducing treating vapor into said treating chamber; a discharge chamber comprising slits and means for introducing said excess vapor into said discharge chamber through said slits; and an outer wall provided about said cover member, said outer wall and said cover member defining a space therebetween, said outer wall having a lower rim and an upper rim, said lower rim contacting said plate member and said upper rim being higher than said gap such that the flow of vapor from said treating chamber to said discharge chamber follows a tortious path.
Claim 3
Dependent Claim 48 words
An apparatus as recited in claim 1, further comprising a porous partition located in said treating chamber so as to divide said treating chamber into an upper section and a lower section, said partition being adapted to spread the treating vapor evenly over the surface of the wafer.
Claim 4
Dependent Claim 21 words
An apparatus as recited in claim 1, wherein said outer wall is fixed to said cover member by means of joints.
Claim 5
Independent Claim 103 words
An apparatus for treating a wafer with treating vapor, said apparatus comprising: a chamber; means for supporting a wafer within said chamber; means for moving the wafer to said supporting means; means for moving the wafer from said supporting means; means for flowing treating vapor through said chamber; and means for discharging excess vapor from said chamber, said discharging means including a movable wall, said wall being outside of said chamber, and said discharging means being adapted to minimize turbulence of the vapor flow through said chamber, whereby said apparatus can evenly cover the entire surface of the wafer with the treating vapor.
Claim 6
Independent Claim 103 words
An apparatus for treating a wafer with treating vapor, said apparatus comprising: a chamber; means for supporting a wafer within said chamber; means for moving the wafer to said supporting means; means for moving the wafer from said supporting means; means for flowing treating vapor through said chamber; and means for discharging excess vapor from said chamber, said discharging means including a movable wall, said wall being outside of said chamber, and said discharging means being adapted to minimize turbulence of the vapor flow through said chamber, whereby said apparatus can evenly cover the entire surface of the wafer with the treating vapor.
Claim 7
Independent Claim 77 words
An apparatus for treating a wafer with treating vapor, said apparatus comprising: a chamber; means for supporting a wafer within said chamber; means for flowing treating vapor through said chamber; and means for discharging excess vapor from said chamber, said discharging means including a tortuous path, said tortuous path being adapted to minimize disturbances of the vapor flow through said chamber, whereby said apparatus can evenly cover the entire surface of the wafer with the treating vapor.
Claim 8
Independent Claim 77 words
An apparatus for treating a wafer with treating vapor, said apparatus comprising: a chamber; means for supporting a wafer within said chamber; means for flowing treating vapor through said chamber; and means for discharging excess vapor from said chamber, said discharging means including a tortuous path, said tortuous path being adapted to minimize disturbances of the vapor flow through said chamber, whereby said apparatus can evenly cover the entire surface of the wafer with the treating vapor.
Claim 9
Dependent Claim 48 words
The apparatus of claim 5, said chamber and said supporting means defining a gap, said discharging means including said gap, said tortuous path being formed by a wall, said wall being located outside of said chamber, said wall having an upper rim which is higher than said gap.

References Cited (Backward Citations)

US4340462A Cited
US4695700A Cited
US4693211A Cited
US4767641A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-10-02 1993-04-03 1993-10-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-10-02 1997-04-03 1997-10-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-10-02 2001-04-03 2001-10-03 $7700.00 Window Closed / Lapsed

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