Probe card apparatus and method of providing same with reconfigurable probe card circuitry

Claim 2

A probe card apparatus for allowing connection to miniature test contact pads of an integrated circuit on a surface of a semiconductor substrate, said probe card apparatus comprising: a first probe card member having a plurality of interrupted probe pin circuits, each of said probe pin circuits having associated therewith first contact means for use in providing electrical connection to a probe pin, second contact means, and third contact means for providing electrical connection to test equipment; and a second probe card member having a plurality of adaptor circuits, each of said adaptor circuits having fourth contact means for electrically connecting to said first contact means, fifth contact means for electrically connecting to said second contact means, sixth contact means for electrically connecting to said third contact means, and conductive line means for providing electrical connection between said fourth, fifth and sixth contact means; said second probe card member being placeable in at least one position relative to said first probe card member, such that said fourth, fifth and sixth contact means of at least a portion of said plurality of adaptor circuits are aligned and electrically connected to said first, second and third contact means, respectively, of at least a portion of said plurality of probe pin circuits, said probe card apparatus being configurable to a desired probe card circuitry by removably mounting a preselected second probe card member.

Claim 3

A probe card apparatus as claimed in claim 1, further comprising means for removably attaching said second probe card member to said first probe card member.

Claim 4

A probe card apparatus as claimed in claim 1, further comprising a plurality of spring-loaded pins, each spring-loaded pin being respectively disposed to provide electrical connection between one of said first, second and third contact means and a corresponding one of said fourth, fifth and six contact means, respectively.

Claim 5

A probe card apparatus as claimed in claim 3, wherein one end of each respective spring-loaded pin of said plurality of spring-loaded pins is fixedly mounted to a respective one of said first, second, third, fourth, fifth and sixth contact means.

Claim 6

A probe card apparatus as claimed in claim 3, further comprising a spacer ring placeable between said first and second probe card members to prevent said spring-loaded pins from being excessively compressed.

Claim 7

A probe card apparatus as claimed in claim 1, said conductive line means being severable to interrupt electrical connection between said fourth, fifth and sixth contact means.

Claim 8

A probe card apparatus as clained in claim 1, wherein each of said first, second, third, fourth, fifth and sixth contact means is of a construction which allows connection of discrete electronic components and spring-loaded contact pins.

Claim 9

A probe card apparatus as claimed in claim 9, wherein said second probe card member is placeable, in said at least one position, on a major surface of said first probe card member opposing a major surface upon which said probe pin means are removably attachable such that said second probe card member can be changed to reconfigure circuitry of said probe card apparatus without disturbing said probe pin means.

Claim 10

A probe card apparatus as claimed in claim 1, further comprising probe pin means which are removably attachable to said first probe card member.

Claim 11

A probe card apparatus as claimed in claim 1, wherein said first contact means, said fourth contact means, a portion of said conductive line means providing electrical connection between said fourth and sixth contact means, and said sixth contact means of a probing circuit represents series circuit means for providing a series connection between said first and sixth contact means, and wherein a portion of said conductive line means between said fifth contact means and said fourth or sixth contact means, said fifth contact means and said second contact means represents parallel circuit means for providing a parallel connection between said series circuit means and a ground contact means.

Claim 12

Probe card apparatus for allowing connection to miniature test contact pads of an integrated circuit on a surface of a semiconductor substrate, said probe card apparatus comprising: first probe card plate means having a plurality of interrupted probe pin circuits disposed around and radiating in directions away from viewing aperture means, each of said probe pin circuits having associated therewith first contact means for use in providing electrical connection to a probe pin, second contact means, and third contact means for providing electrical connection to test equipment; and second probe card plate means having a plurality of adaptor circuits, each of said adaptor circuits having fourth contact means for electrically connecting to said first contact means, fifth contact means for electrically connecting to said second contact means, sixth contact means for electrically connecting to said third contact means, and conductive line means for providing electrical connection between said fourth, fifth and sixth contact means; said second probe card plate means being removably placeable in at least one position relative to said first probe card plate means, such that said fourth, fifth and sixth contact means of at least a portion of said plurality of adaptor circuits are aligned and electrically connected to said first, second and third contact means, respectively, of at least a portion of said plurality of probe pin circuits, said conductive line means being severable to interrupt electrical connection between said fourth, fifth and sixth contact means, and said first, second, third, fourth, fifth and sixth contact means being of a construction which allows connection of discrete electronic components, said probe card apparatus being configurable to a desired probe card circuitry by removably mounting a preselected second probe card plate means.

Claim 13

Probe card apparatus for allowing connection to miniature test contact pads of an integrated circuit on a surface of a semiconductor substrate, said probe card apparatus comprising: first probe card plate means having a plurality of interrupted probe pin circuits disposed around and radiating in directions away from viewing aperture means, each of said probe pin circuits having associated therewith first contact means for use in providing electrical connection to a probe pin, second contact means, and third contact means for providing electrical connection to test equipment; and second probe card plate means having a plurality of adaptor circuits, each of said adaptor circuits having fourth contact means for electrically connecting to said first contact means, fifth contact means for electrically connecting to said second contact means, sixth contact means for electrically connecting to said third contact means, and conductive line means for providing electrical connection between said fourth, fifth and sixth contact means; said second probe card plate means being removably placeable in at least one position relative to said first probe card plate means, such that said fourth, fifth and sixth contact means of at least a portion of said plurality of adaptor circuits are aligned and electrically connected to said first, second and third contact means, respectively, of at least a portion of said plurality of probe pin circuits, said conductive line means being severable to interrupt electrical connection between said fourth, fifth and sixth contact means, and said first, second, third, fourth, fifth and sixth contact means being of a construction which allows connection of discrete electronic components, said probe card apparatus being configurable to a desired probe card circuitry by removably mounting a preselected second probe card plate means.

Claim 14

Probe card apparatus as claimed in claim 11 further comprising means for removably connecting said second probe card plate means to said first probe card plate means.

Claim 15

Probe card apparatus as claimed in claim 12 further comprising a plurality of spring-loaded pins, each spring-loaded pin being respectively disposed to provide electrical communication between one of said first, second, third contact means and a corresponding one of said fourth, fifth, sixth contact means, respectively.

Claim 16

Probe card apparatus as claimed in claim 13 wherein each respective pin of said plurality of spring loaded pins is fixedly mounted to one of said first, second and third contact means.

Claim 17

Probe card apparatus as claimed in claim 11 further comprising probe pin means which are removably attachable to said first probe card plate means.

Claim 18

Probe card apparatus as claimed in claim 15 wherein said second probe card plate means is placeable, in said at least one position, on a major surface of said first probe card plate means opposing a major surface upon which said probe pin means are removably attachable such that said second probe card member can be changed to reconfigure circuitry of said probe card apparatus without disturbing said probe pin means.

Claim 21

A method as claimed in claim 17, further comprising the step of providing a plurality of spring-loaded contact pins, each respective spring-loaded pin being disposed to provide electrical connection between one of said first, second and third contact means and a corresponding one of said fourth, fifth and sixth contact means, respectively.

Claim 22

A method as claimed in claim 18, further comprising the step of providing a spacer ring between said first and second probe card members to prevent said spring-loaded pins from being excessively compressed.

Claim 24

A method as claimed in claim 17, wherein said second probe card member is removably mountable on a major surface of said first probe card member opposing a major surface upon which said probe pin means are removably attachable such that said second probe card member can be changed to reconfigure circuitry of said probe card apparatus without disturbing said probe pin means.