US4851359A
Expired / Lapsed
US
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Method of producing an electrical resistor by implanting a semiconductor material with rare gas
Assignee: Bull SAS
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Filing: 1986-12-29
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Granted: 1989-07-25
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Expires: 2006-12-29
Abstract
Abstract The invention enables precise and reliable adjustment of the resistance of a resistor formed in a zone (16) of monocrystalline semiconductor material (11) in spite of the presence of a density gradient of electrically active ions at the periphery of the zone, as a result of the implantation of ions of rare gases (+) in the zone. Furthermore, when the standard method of producing a resistor in a polycrystalline semiconductor material is used, implanting rare gas ions in the resistive zone enables precise and reliable adjustment of the resistance. The invention also maintains the dimensions of the initially resistive zone, despite later annealing, and is suitable for large-scale integration of circuits.
Inventors
- 👤 Alain Boudou
- 👤 Brian Doyle
- 👤 Jean-Claude Marchetaux
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 23:21
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/47; H10D1/01; H10D1/025; H10D1/43
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
97 words
A method of forming a resistor having a predetermined resistance value in a zone of a region of undoped monocrystalline semiconductor material, comprising the steps of defining said zone within the region by doping the zone with electrically active ions of a predetermined conductivity type to provide the zone with a resistance value which is lower than said predetermined resistance value by a controlled resistance deviation, implanting in the zone electrically inactive ions of a rare gas with a controlled magnitude to compensate for said resistance deviation and to afford said predetermined resistance, and annealing the region.
Claim 2
Independent Claim
97 words
A method of forming a resistor having a predetermined resistance value in a zone of a region of undoped monocrystalline semiconductor material, comprising the steps of defining said zone within the region by doping the zone with electrically active ions of a predetermined conductivity type to provide the zone with a resistance value which is lower than said predetermined resistance value by a controlled resistance deviation, implanting in the zone electrically inactive ions of a rare gas with a controlled magnitude to compensate for said resistance deviation and to afford said predetermined resistance, and annealing the region.
Claim 3
Dependent Claim
37 words
A method according to claim 1, wherein said step of implanting electrically inactive ions includes controlling the density and energy of implantation of the inactive ions to afford said controlled magnitude to compensate for said resistance deviation.
Claim 4
Dependent Claim
28 words
A method according to claim 1, wherein the steps of doping and implanting are made prior to the step of annealing, and are temporally independent of each other.
Claim 5
Dependent Claim
14 words
A method according to claim 3, wherein said step of doping comprises a diffusion.
Claim 6
Dependent Claim
14 words
A method according to claim 3, wherein said step of doping comprises an implantation.
Claim 7
Independent Claim
110 words
A method of forming a resistor having a predetermined resistance value in a zone of a region of monocrystalline semiconductor material which is uniformly doped with electrically active ions of a predetermined conductivity type, comprising the steps of defining said zone within the region by doping the zone with additional electrically active ions of said conductivity type to provide the zone with a resistance value which is lower than said predetermined resistance value by a controlled resistance deviation, implanting in the zone electrically inactive ions of a rare gas with a controlled magnitude to compensate for said resistance deviation and to produce said predetermined resistance value, and annealing the material.
Claim 8
Independent Claim
110 words
A method of forming a resistor having a predetermined resistance value in a zone of a region of monocrystalline semiconductor material which is uniformly doped with electrically active ions of a predetermined conductivity type, comprising the steps of defining said zone within the region by doping the zone with additional electrically active ions of said conductivity type to provide the zone with a resistance value which is lower than said predetermined resistance value by a controlled resistance deviation, implanting in the zone electrically inactive ions of a rare gas with a controlled magnitude to compensate for said resistance deviation and to produce said predetermined resistance value, and annealing the material.
Claim 9
Dependent Claim
38 words
A method according to claim 6, wherein said step of implanting electrically inactive ions comprises controlling the density and the energy of implantation of the inactive ions to afford said controlled magnitude to compensate for said resistance deviation.
Claim 10
Dependent Claim
28 words
A method according to claim 6, wherein the steps of doping and implanting are performed prior to the step of annealing, and are temporally independent of each other.
Claim 11
Dependent Claim
14 words
A method according to claim 8, wherein said step of doping comprises a diffusion.
Claim 12
Dependent Claim
14 words
A method according to claim 8, wherein said step of doping comprises an implantation.
Claim 13
Independent Claim
115 words
A method of forming a resistor having a predetermined resistance value in a zone of a region of semiconductor material, comprising the steps of uniformly doping the region with electrically active ions of a predetermined conductivity type to provide the region with a resistance value which is lower than said predetermined resistance value by a controlled resistance deviation, defining said zone within the region by implanting in the zone electrically inactive ions of a rare gas with a controlled magnitude to compensate for said resistance deviation, masking said zone, doping the region with additional electrically active ions of said predetermined conductivity type, and annealing the region to afford said predetermined resistance value in the zone.
Claim 14
Independent Claim
115 words
A method of forming a resistor having a predetermined resistance value in a zone of a region of semiconductor material, comprising the steps of uniformly doping the region with electrically active ions of a predetermined conductivity type to provide the region with a resistance value which is lower than said predetermined resistance value by a controlled resistance deviation, defining said zone within the region by implanting in the zone electrically inactive ions of a rare gas with a controlled magnitude to compensate for said resistance deviation, masking said zone, doping the region with additional electrically active ions of said predetermined conductivity type, and annealing the region to afford said predetermined resistance value in the zone.
Claim 15
Dependent Claim
37 words
A method according to claim 11, wherein said step of implanting electrically inactive ions includes controlling the density and energy of implantation of the inactive ions to afford said controlled magnitude to compensate for said resistance deviation.
Claim 16
Dependent Claim
14 words
A method according to claim 11, wherein said semiconductor material is a monocrystalline material.
Claim 17
Dependent Claim
14 words
A method according to claim 11, wherein said semiconductor material is a polycrystalline material.
Claim 18
Dependent Claim
28 words
A method according to claim 11, wherein said steps of doping and implanting are performed prior to said step of annealing and are temporally independent of each other.
Claim 19
Dependent Claim
12 words
A method according to claim 11, wherein said doping comprises a diffusion.
Claim 20
Dependent Claim
12 words
A method according to claim 11, wherein said doping comprises an implantation.
References Cited (Backward Citations)
FR2117977A1
Cited
US3796929A
Cited
US4035925A
Cited
US3925106A
Cited
JPS5327376A
Cited
US4110776A
Cited
JPS54122973A
Cited
US4432008A
Cited
EP0068154A2
Cited
EP0107556A1
Cited
EP0159408A2
Cited
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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