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US4851255A Expired / Lapsed US ⏱️ 0.0 years remaining

Ion implant using tetrafluoroborate

Assignee: Versum Materials US LLC
•
Filing: 1988-05-06
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Granted: 1989-07-25
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Expires: 2008-05-06
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Abstract

Abstract Metal tetrafluoroborates, alkali and alkaline earth tetrafluoroborates in particular, and preferably lithium tetrafluoroborate are used as ion source materials in ion implantation of semiconductor materials with boron.

Inventors

  • 👤 Andre Lagendijk
  • 👤 Shantia Riahi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 05:42
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/21; H01; H01J; H01J27/00; H01J27/02; H01J27/022; H10P30/202; H10P30/204; H10P30/225

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 51 words
In the method of implanting boron into a substrate which comprises generating a beam of boron ions and directing said beam at the substrate under the influence of electrical and magnetic fields, the improvement wherein the step of generating a beam of boron ions comprises evaporating a charge of metal tetrahaloborate
Claim 2
Dependent Claim 51 words
In the method of implanting boron into a substrate which comprises generating a beam of boron ions and directing said beam at the substrate under the influence of electrical and magnetic fields, the improvement wherein the step of generating a beam of boron ions comprises evaporating a charge of metal tetrahaloborate
Claim 3
Dependent Claim 19 words
The method of claim 1 wherein the charge consists essentially of a Group I or Group II metal tetrahaloborate.
Claim 4
Dependent Claim 18 words
The method of claim 2 wherein the charge consists essentially of an alkali or alkaline earth metal tetrahaloborate.
Claim 5
Dependent Claim 18 words
The method of claim 3 wherein the charge consists essentially of an alkali or alkaline earth metal tetrafluoroborate.
Claim 6
Dependent Claim 20 words
The method of claim 4 wherein the charge consists essentially of lithium tetrafluoroborate, sodium tetrafluoroborate, calcium tetrafluoroborate or potassium tetrafluoroborate.
Claim 7
Dependent Claim 11 words
The method of claim 4 wherein the charge is lithium fluoborate.
Claim 8
Dependent Claim 19 words
The method of claim 6 wherein the tetrahaloborate consists essentially of a Group I or Group II metal tetrahaloborate.
Claim 9
Dependent Claim 18 words
The method of claim 7 wherein the tetrahaloborate consists essentially of an alkali or alkaline earth metal tetrafluoroborate.
Claim 10
Dependent Claim 20 words
The method of claim 8 wherein the tetrahaloborate consists essentially of lithium tetrafluoroborate, sodium tetrafluoroborate, calcium tetrafluoroborate or potassium tetrafluoroborate.
Claim 11
Dependent Claim 11 words
The method of claim 9 wherein the tetrahaloborate is lithium fluoborate.
Claim 12
Dependent Claim 133 words
In a method for implanting an element, in the form of ions thereof, into a target comprising the steps of evaporating a compound of said element, ionizing said compound to form ions of said element, accelerating the said ions, electromagnetically selecting the element ions to be implanted into such target, and accelerating and directing a beam of the selected ions to a predetermined location on such target, the improvement wherein the compound is a metal tetrahaloborate which evaporates under a vacuum of from approximately 10 -3 to 10 -5 torr in a temperature range of from approximately 100° C. to 400° C. at a rate sufficient to form an effective ion implant beam in an ion implant instrument, and wherein the compound ions are boron ions resulting from the ionization of the tetrahaloborate.
Claim 13
Dependent Claim 133 words
In a method for implanting an element, in the form of ions thereof, into a target comprising the steps of evaporating a compound of said element, ionizing said compound to form ions of said element, accelerating the said ions, electromagnetically selecting the element ions to be implanted into such target, and accelerating and directing a beam of the selected ions to a predetermined location on such target, the improvement wherein the compound is a metal tetrahaloborate which evaporates under a vacuum of from approximately 10 -3 to 10 -5 torr in a temperature range of from approximately 100° C. to 400° C. at a rate sufficient to form an effective ion implant beam in an ion implant instrument, and wherein the compound ions are boron ions resulting from the ionization of the tetrahaloborate.

References Cited (Backward Citations)

US4622236A Cited
US4656052A Cited
US4634600A Cited
US4759836A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-07-24 1993-01-23 1993-07-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-07-24 1997-01-23 1997-07-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-07-24 2001-01-23 2001-07-25 $7700.00 Window Closed / Lapsed

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