US4849803A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Molded resin semiconductor device
Assignee: Mitsubishi Electric Corp
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Filing: 1984-04-20
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Granted: 1989-07-18
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Expires: 2004-04-20
Abstract
Abstract Diode chips 5, 6 soldered to a terminal plate 4 within a housing 1, 2 are surrounded by a low thermal expansion, high thermal conductivity thermosetting resin 13, 14, in turn covered by a flexible resin 9 having high expansion and low conductivity coefficients, in turn covered by another thermosetting resin 12. Elastic lead wires 7, 8 soldered to the diodes and embedded in the flexible resin are extended through the top resin layer by further terminal plates 10, 11. Such construction enhances heat dissipation and reduces thermal stress concentrations to thereby avoid fatigue failure in the solder connections.
Inventors
- 👤 Takeshi Yamamoto
- 👤 Masanori Nakatsuka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 10:19
CPC Classifications
H; H10; H10W; H10W72/00; H10W74/00; H10W74/10; H10W74/111; H10W74/114; H10W74/131; H10W74/141; H10W76/00; H10W76/40; H10W76/42; H10W76/47; H10W90/00
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
148 words
A molded resin semiconductor device having a plurality of mutually connected semiconductor chips (5, 6) disposed within a unitary housing, comprising: (a) a plurality of lead wires (7, 8) individually soldered to the semiconductor chips, (b) a first thermosetting resin (13, 14) surrounding exposed outer surfaces of said semiconductor chips and the lead wire solder connections, (c) a flexible resin (9) overlying and surrounding said thermosetting resin (13, 14) and the lead wires, and (d) a second thermosetting resin (12) overlying said flexible resin, wherein the thermal expansion coefficient of said first thermosetting resin is smaller than that of said flexible resin, and the thermal conductivity of said first thermosetting resin is greater than that of said flexible resin to reduce thermal stress in the solder connections when the semiconductor chips are subjected to intermittent current flow and to prevent the failure of said connections due to fatigue.
Claim 2
Dependent Claim
148 words
A molded resin semiconductor device having a plurality of mutually connected semiconductor chips (5, 6) disposed within a unitary housing, comprising: (a) a plurality of lead wires (7, 8) individually soldered to the semiconductor chips, (b) a first thermosetting resin (13, 14) surrounding exposed outer surfaces of said semiconductor chips and the lead wire solder connections, (c) a flexible resin (9) overlying and surrounding said thermosetting resin (13, 14) and the lead wires, and (d) a second thermosetting resin (12) overlying said flexible resin, wherein the thermal expansion coefficient of said first thermosetting resin is smaller than that of said flexible resin, and the thermal conductivity of said first thermosetting resin is greater than that of said flexible resin to reduce thermal stress in the solder connections when the semiconductor chips are subjected to intermittent current flow and to prevent the failure of said connections due to fatigue.
Claim 3
Dependent Claim
13 words
A semiconductor device according to claim 1, wherein said semiconductor chips are diodes.
Claim 4
Dependent Claim
22 words
A semiconductor device according to claim 1, wherein said flexible resin is gelled silicone and said first thermosetting resin is epoxy resin.
Claim 5
Dependent Claim
19 words
A semiconductor device according to claim 3, wherein said first and second thermosetting resins are of the same material.
Claim 6
Dependent Claim
274 words
A molded resin semiconductor device, comprising: (a) a radiation base plate (1), (b) a case (2) fixed at one end to an upper surface of said base plate, (c) an insulating plate (3) fixed to the upper surface of said base plate within said case, (d) a first terminal plate (4) fixed to an upper surface of said radiation plate within said case, (e) first and second semiconductor diodes (5, 6) each having first and second electrodes, each first electrode being connected to the first terminal plate (4), (f) first and second elastic lead wires (7, 8) individually connected at one end to the second electrode of said first and second diodes by soldering, (g) a first thermosetting resin (13, 14) covering the circumference and upper surface of said first and second diodes and surrounding the solder connections, (h) a flexible resin (9) injected into said case and covering said insulating plate, a part of said first terminal plate, said first thermosetting resin, and a part of said first and second lead wires, (i) second and third terminal plates (10, 11) individually connected at one end to the other end of said first and second lead wires, and (j) a second thermosetting resin (12) overlying said first resin within said case, wherein the thermal expansion coefficient of said first thermosetting resin is smaller than that of said flexible resin, and the thermal conductivity of said first thermosetting resin is greater than that of said flexible resin to reduce thermal stress in the solder connections when the diodes are subjected to intermittent current flow and to prevent the failure of said connections due to fatigue.
Claim 7
Dependent Claim
274 words
A molded resin semiconductor device, comprising: (a) a radiation base plate (1), (b) a case (2) fixed at one end to an upper surface of said base plate, (c) an insulating plate (3) fixed to the upper surface of said base plate within said case, (d) a first terminal plate (4) fixed to an upper surface of said radiation plate within said case, (e) first and second semiconductor diodes (5, 6) each having first and second electrodes, each first electrode being connected to the first terminal plate (4), (f) first and second elastic lead wires (7, 8) individually connected at one end to the second electrode of said first and second diodes by soldering, (g) a first thermosetting resin (13, 14) covering the circumference and upper surface of said first and second diodes and surrounding the solder connections, (h) a flexible resin (9) injected into said case and covering said insulating plate, a part of said first terminal plate, said first thermosetting resin, and a part of said first and second lead wires, (i) second and third terminal plates (10, 11) individually connected at one end to the other end of said first and second lead wires, and (j) a second thermosetting resin (12) overlying said first resin within said case, wherein the thermal expansion coefficient of said first thermosetting resin is smaller than that of said flexible resin, and the thermal conductivity of said first thermosetting resin is greater than that of said flexible resin to reduce thermal stress in the solder connections when the diodes are subjected to intermittent current flow and to prevent the failure of said connections due to fatigue.
Claim 8
Dependent Claim
22 words
A semiconductor device according to claim 5, wherein said flexible resin is gelled silicone and said first thermosetting resin is epoxy resin.
Claim 9
Dependent Claim
19 words
A semiconductor device according to claim 6, wherein said first and second thermosetting resins are of the same material.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-07-17 | 1993-01-16 | 1993-07-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-07-17 | 1997-01-16 | 1997-07-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-07-17 | 2001-01-16 | 2001-07-18 | $7700.00 | Window Closed / Lapsed |