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US4835117A Expired / Lapsed US ⏱️ 0.0 years remaining

Manufacturing method for semiconductor laser with mesa stripe

Assignee: Toshiba Corp
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Filing: 1988-09-21
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Granted: 1989-05-30
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Expires: 2008-09-21
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Abstract

Abstract There is disclosed a semiconductor layer which can emit a continuous laser beam in a visible wavelength range. The laser has an n-GaAs substrate. On this substrate, an n-InGaAlP cladding layer, an active layer, and p-InGaAlP cladding layers are sequentially formed, thus forming a double hetero-structure. A mesa-shaped, upper cladding layer is provided, defining a laser beam-guiding channel. A thin p-InGaAlP contact layer and a mesa-shaped, p-GaAs contact layer are formed on the top surface of the upper cladding layer. Two n-type semiconductive, current-blocking layers cover the slanted sides of the upper, mesa-shaped cladding layer and also the contact layer. They are made of the same n-GaAs compound semiconductor material as the substrate.

Inventors

  • 👤 Yasuo Ohba
  • 👤 Masayuki Ishikawa
  • 👤 Motoyuki Yamamoto
  • 👤 Yukio Watanabe
  • 👤 Hideto Sugawara

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 17:14
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/20; H01S5/22; H01S5/223; H01S5/2231; H01S5/04; H01S5/042; H01S5/0421; H01S5/30; H01S5/305; H01S5/3054; H01S5/32; H01S5/323; H01S5/32308; H01S5/32325; Y; Y10; Y10S; Y10S148/00; Y10S148/095

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 266 words
A method of manufacturing a semiconductor laser for emitting a continuous laser beam of visible wavelength range, said method comprising the steps of: (a) forming a double hetero-structure on a semiconductor substrate of a first conductivity type made of a III-V compound semiconductor material by means of metal organic chemical vapor deposition, said double hetero-structure comprising: a first semiconductive cladding layer of the first conductivity type, an active layer of semiconductor material formed on said first cladding layer, a second semiconductive cladding layer of a second conductivity type formed on said active layer, and a third semiconductive cladding layer of the second conductivity type formed on said second cladding layer and made of compound semiconductor material comprising a plurality of III-elements and one V-element; (b) forming a first semiconductive contact layer of the second conductivity type on said double hetero-structure; (c) forming an insulative layer on said first contact layer; (d) applying selective etching to said first contact layer by using said insulative layer as a mask, thereby forming a mesa-shaped layer having a flat top surface and slanted sides; (e) applying selective etching to said third cladding layer by using said mesa-shaped layer as a mask, thereby forming a waveguide channel and also a mesa-shaped layer having a flat top surface and slanted sides; and (f) forming a semiconductive, current-blocking layer of the first conductivity type on the resultant structure, said current-blocking layer covering the slanted sides of said third cladding layer and also the slanted sides of said first contact layer and being made of substantially the same III-V compound semiconductor as said substrate.
Claim 2
Independent Claim 266 words
A method of manufacturing a semiconductor laser for emitting a continuous laser beam of visible wavelength range, said method comprising the steps of: (a) forming a double hetero-structure on a semiconductor substrate of a first conductivity type made of a III-V compound semiconductor material by means of metal organic chemical vapor deposition, said double hetero-structure comprising: a first semiconductive cladding layer of the first conductivity type, an active layer of semiconductor material formed on said first cladding layer, a second semiconductive cladding layer of a second conductivity type formed on said active layer, and a third semiconductive cladding layer of the second conductivity type formed on said second cladding layer and made of compound semiconductor material comprising a plurality of III-elements and one V-element; (b) forming a first semiconductive contact layer of the second conductivity type on said double hetero-structure; (c) forming an insulative layer on said first contact layer; (d) applying selective etching to said first contact layer by using said insulative layer as a mask, thereby forming a mesa-shaped layer having a flat top surface and slanted sides; (e) applying selective etching to said third cladding layer by using said mesa-shaped layer as a mask, thereby forming a waveguide channel and also a mesa-shaped layer having a flat top surface and slanted sides; and (f) forming a semiconductive, current-blocking layer of the first conductivity type on the resultant structure, said current-blocking layer covering the slanted sides of said third cladding layer and also the slanted sides of said first contact layer and being made of substantially the same III-V compound semiconductor as said substrate.
Claim 3
Dependent Claim 22 words
The method according to claim 1, wherein said mesa-shaped first contact layer is subjected to selective etching to have a reduced width.
Claim 4
Dependent Claim 52 words
The method according to claim 2, wherein a second semiconductive contact layer of the second conductivity type is formed on said current-blocking layer, said second contact layer covering the top surface of said first contact layer and also covering said curent-blocking layer, and being thick enough to have a flat top surface.
Claim 5
Dependent Claim 19 words
The method according to claim 3, wherein said insulative layer is removed after said current-blocking layer has been formed.
Claim 6
Dependent Claim 33 words
The method according to claim 2, wherein said insulative layer is removed before said current-blocking layer is formed, and said current-blocking layer completely covers said third cladding layer and said first contact layer.
Claim 7
Dependent Claim 35 words
The method according to claim 5, wherein a diffusion layer of the second conductivity type is formed in said current-blocking layer in such a manner that said diffusion layer partially overlaps said first contact layer.
Claim 8
Dependent Claim 22 words
The method according to claim 2, wherein said metal organic chemical vapor deposition is performed in an atmosphere of a reduced pressure.

References Cited (Backward Citations)

US3865646A Cited
US4213805A Cited
US4184170A Cited
JPS59119884A Cited
US4602371A Cited
JPS6045086A Cited
JPS6064489A Cited
US4644551A Cited
JPS60127777A Cited
JPH115281A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-05-29 1992-11-28 1993-05-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-05-29 1996-11-28 1997-05-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-05-29 2000-11-28 2001-05-30 $7700.00 Window Closed / Lapsed

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