US4833098A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Polycrystalline semiconductor deposition in groove for device insolation
Assignee: Seiko Epson Corp
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Filing: 1988-10-13
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Granted: 1989-05-23
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Expires: 2008-10-13
Abstract
Abstract In an improved metal-oxide-semiconductor (MOS) device a polycrystalline semiconductor region is buried in a monocrystalline semiconductor substrate at the isolation region between elements of the device. A deep and narrow groove of about 1 μm is formed by reactive ion etching in which the polycrystalline silicon is deposited by chemical vapor deposition. Surface polycrystalline semiconductor is removed by etching resulting in only the polycrystalline semiconductor buried in the substrate which is implanted with ions. Alternatively, polycrystalline semiconductor is deposited only in the bottom portion of the groove, ion implanted and an insulator film is formed in the remaining portion of the groove for fully isolating the polycrystalline region. Semiconductor devices prepared in accordance with the invention have flattened surfaces, reduced crystal defects and permit further miniaturization of the MOS devices.
Inventors
- 👤 Juri Kato
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 04:20
CPC Classifications
H; H10; H10W; H10W10/00; H10W10/01; H10W10/041; H10W10/40
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
120 words
A method of preparing a metal-oxide-semiconductor device, including the steps of: depositing an insulating film on the surface of a monocrystalline semiconductor substrate; etching a groove through the insulating film and into the substrate; depositing a polycrystalline semiconductor film across the surface of the insulating film and into the groove; removing the polycrystalline semiconductor film on the surface of the substrate by etching while retaining the polycrystalline semiconductor film submerged in the substrate; implanting one of n or p ions into the polycrystalline semiconductor film submerged in the substrate with the insulating film on the surface serving as a mask; activating field ions in the region of the groove by heating the the device; and removing the insulating film mask.
Claim 2
Independent Claim
120 words
A method of preparing a metal-oxide-semiconductor device, including the steps of: depositing an insulating film on the surface of a monocrystalline semiconductor substrate; etching a groove through the insulating film and into the substrate; depositing a polycrystalline semiconductor film across the surface of the insulating film and into the groove; removing the polycrystalline semiconductor film on the surface of the substrate by etching while retaining the polycrystalline semiconductor film submerged in the substrate; implanting one of n or p ions into the polycrystalline semiconductor film submerged in the substrate with the insulating film on the surface serving as a mask; activating field ions in the region of the groove by heating the the device; and removing the insulating film mask.
Claim 3
Dependent Claim
23 words
The method of claim 1, wherein the monocrystalline semiconductor substrate is a monocrystalline silicon, and the polycrystalline semiconductor material is a polycrystalline silicon.
Claim 4
Dependent Claim
15 words
The method of claim 1, wherein the polycrystalline film is deposited by chemical vapor deposition.
Claim 5
Dependent Claim
23 words
The method of claim 1, wherein the groove is formed by ion etching of the surface of the substrate and insulating film thereon.
Claim 6
Dependent Claim
24 words
The method of claim 1, wherein field ions in the region of the groove are instantaneously activated by heating the device with a lamp.
Claim 7
Independent Claim
229 words
A method of preparing an isolation region of a metal-oxide-semiconductor device, including the steps of: depositing a first insulating film on the surface of the semiconductor substrate; etching a groove through the insulating film and into the substrate; depositing a polycrystalline film across the surface of the substrate for forming a polycrystalline film across the insulating film and in the lower portion of the groove beneath the surface of the substrate; implanting one of n or p ions into the region of the groove with the first insulating film serving as a mask to prevent ion implantation into the surface of the substrate; activating field ions in the region of the groove by heating the device; depositing a second insulating film across the surface of the substrate by chemical vapor deposition and into the upper portion of the groove on the polycrystalline region therein; depositing a resist across the surface of the substrate, the resist having an etching speed substantially the same as that of the second insulating film; removing the second insulating film, the polycrystalline film and the first insulating film on the surface of the substrate for providing an isolation region in the substrate wherein an insulating region is formed beneath the surface of the substrate and the polycrystalline region thereunder, the insulating region and polycrystalline region in the groove submerged in the surface of the substrate.
Claim 8
Independent Claim
229 words
A method of preparing an isolation region of a metal-oxide-semiconductor device, including the steps of: depositing a first insulating film on the surface of the semiconductor substrate; etching a groove through the insulating film and into the substrate; depositing a polycrystalline film across the surface of the substrate for forming a polycrystalline film across the insulating film and in the lower portion of the groove beneath the surface of the substrate; implanting one of n or p ions into the region of the groove with the first insulating film serving as a mask to prevent ion implantation into the surface of the substrate; activating field ions in the region of the groove by heating the device; depositing a second insulating film across the surface of the substrate by chemical vapor deposition and into the upper portion of the groove on the polycrystalline region therein; depositing a resist across the surface of the substrate, the resist having an etching speed substantially the same as that of the second insulating film; removing the second insulating film, the polycrystalline film and the first insulating film on the surface of the substrate for providing an isolation region in the substrate wherein an insulating region is formed beneath the surface of the substrate and the polycrystalline region thereunder, the insulating region and polycrystalline region in the groove submerged in the surface of the substrate.
Claim 9
Dependent Claim
25 words
The method of claim 6, wherein the substrate is a monocrystalline silicon semiconductor and the polycrystalline region buried in the groove is a polycrystalline silicon.
Claim 10
Dependent Claim
15 words
The method of claim 6, wherein the polycrystalline film is deposited by chemical vapor deposition.
Claim 11
Dependent Claim
23 words
The method of claim 6, wherein the groove is formed by ion etching of the surface of the substrate and insulating film thereon.
Claim 12
Dependent Claim
24 words
The method of claim 6, wherein field ions in the region of the groove are instantaneously activated by heating the device with a lamp.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-05-22 | 1992-11-21 | 1993-05-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-05-22 | 1996-11-21 | 1997-05-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-05-22 | 2000-11-21 | 2001-05-23 | $7700.00 | Window Closed / Lapsed |