EPROM fabrication process

Claim 2

An EPROM fabrication process comprising, forming N-channel and P-channel MOS devices in a wafer substrate, said MOS devices having gates, sources and drains associated therewith, forming at least one memory cell device in said wafer substrate, said memory cell device having a floating gate and a second gate above said floating gate, depositing a covering of boron and phosphorus doped silica glass over said MOS and memory cell devices, forming contact holes in said covering leading to selected sources, drains and gates of said MOS and memory cell devices, heating said glass covering to a flow temperature to reflow said glass and to round the corners of said contact holes, depositing a first layer of conductive material over said covering, said material filling said contact holes, selectively etching said first layer to form first conductive lines, forming a first layer of electrically insulative material over said first conductive lines, said insulative layer being formed with a substantially planar surface, forming via holes in said insulative layer to selected first conductive lines, depositing a second layer of conductive material over said insulative layer, said material filling said via holes, and selectively etching said second layer to form second conductive lines.

Claim 3

The process of claim 1 wherein forming said insulative layer with a substantially planar surface comprises, depositing a layer of insulative material on said first conductive lines, etching back 60% to 90% of said insulative material, and redepositing said insulative material to a thickness in a range from 6000 Å to 14000 Å.

Claim 4

The process of claim 1 wherein said covering of boron- and phosphorus-doped glass has a concentration of from 2 to 4 wt. % boron and from 4 to 6 wt. % phosphorus and has flow temperature of approximately 900°-1000° C.

Claim 5

The process of claim 1 wherein said insulative material is selected from the group consisting of oxynitride, phosphorus-doped silica glass, and a combination of both oxynitride and phosphorus-doped silica glass.

Claim 6

The process of claim 1 wherein forming said at least one memory cell device comprises, thermally growing a first gate oxide layer over said wafer substrate, depositing a first polysilicon layer over said first gate oxide layer, said first polysilicon layer having a thickness in the range from 2000 to 2600 Å, thermally growing a second oxide layer over said first polysilicon layer, depositing a second polysilicon layer over said second oxide layer, selectively removing said second polysilicon layer and said second oxide layer so as to define a memory cell gate, and selectively removing said first polysilicon layer and said first oxide layer using said memory cell gate as a self-aligning mask so as to define a floating gate.

Claim 7

The process of claim 1 wherein forming via holes in said insulative layer comprises selectively etching said via holes using a wet and dry plasma reactive ion etch.

Claim 8

An EPROM fabrication process comprising, forming an N-well in a P-type wafer substrate, defining N-channel, P-channel and memory device areas in said substrate, said P-channel device areas being defined in said N-well, forming N-channel stops and field oxide around said device areas, thermally growing a first gate oxide layer over said wafer substrate, depositing a first polycrystalline silicon layer over said first gate oxide layer, said first polycrystalline silicon layer having a thickness in the range from 2000 to 2600 Å, removing said first gate oxide layer and said first polycrystalline silicon layer from all areas of said wafer substrate except said memory device areas, thermally growing a second oxide layer over said first polycrystalline silicon layer and said wafer substrate, said second oxide layer being formed at a temperature in the range from 1100° to 1200 ° C. to a thickness in a range from 400 Å to 600 Å over said first polycrystalline silicon layer and in a range from 310 Å to 360 Å over said wafer substrate, introducing a threshold adjusting dopant into selected N-channel and P-channel device areas, depositing a second gate layer over said second oxide layer, selectively removing said second gate layer and said second oxide layer for defining N-channel device, P-channel device and memory device control gates, selectively removing said first polycrystalline silicon layer and said first gate oxide layer from all areas of said memory device area except under said memory device gate so as to define a floating gate, forming sources and drains for said device, depositing a covering of boron and phosphorus doped silica glass on said wafer forming contact holes therein and heating said glass to a flow temperature, said contact holes in said glass being formed with rounded corners, forming first conductive lines on said glass, said lines connecting to selected sources, drains and gates via said contact holes, and forming a second layer of conductive lines connecting to selected sources, drains, gates and first conductive lines, said first conductive lines on said glass and said second layer of conductive lines being separated by an intermetal layer with a substantially planar surface and with via holes therein, said via holes having rounded corners.

Claim 9

An EPROM fabrication process comprising, forming an N-well in a P-type wafer substrate, defining N-channel, P-channel and memory device areas in said substrate, said P-channel device areas being defined in said N-well, forming N-channel stops and field oxide around said device areas, thermally growing a first gate oxide layer over said wafer substrate, depositing a first polycrystalline silicon layer over said first gate oxide layer, said first polycrystalline silicon layer having a thickness in the range from 2000 to 2600 Å, removing said first gate oxide layer and said first polycrystalline silicon layer from all areas of said wafer substrate except said memory device areas, thermally growing a second oxide layer over said first polycrystalline silicon layer and said wafer substrate, said second oxide layer being formed at a temperature in the range from 1100° to 1200 ° C. to a thickness in a range from 400 Å to 600 Å over said first polycrystalline silicon layer and in a range from 310 Å to 360 Å over said wafer substrate, introducing a threshold adjusting dopant into selected N-channel and P-channel device areas, depositing a second gate layer over said second oxide layer, selectively removing said second gate layer and said second oxide layer for defining N-channel device, P-channel device and memory device control gates, selectively removing said first polycrystalline silicon layer and said first gate oxide layer from all areas of said memory device area except under said memory device gate so as to define a floating gate, forming sources and drains for said device, depositing a covering of boron and phosphorus doped silica glass on said wafer forming contact holes therein and heating said glass to a flow temperature, said contact holes in said glass being formed with rounded corners, forming first conductive lines on said glass, said lines connecting to selected sources, drains and gates via said contact holes, and forming a second layer of conductive lines connecting to selected sources, drains, gates and first conductive lines, said first conductive lines on said glass and said second layer of conductive lines being separated by an intermetal layer with a substantially planar surface and with via holes therein, said via holes having rounded corners.

Claim 10

The process of claim 7 wherein said second gate layer is formed of polycrystalline silicon.

Claim 11

The process of claim 7 wherein said second gate layer is formed of polycrystalline silicon and silicide sandwich for high speed operation.

Claim 12

The process of claim 7 wherein forming said N-channel stops and field oxide comprises, thermally growing thin silicon dioxide layer with a thickness in the range from 250 to 1000 Å on said substrate, depositing a silicon nitride layer with thickness in the range from 1000 to 2500 A on said silicon dioxide layer, the thickness ratio of silicon nitride to silicon dioxide being in the range from 1:1 to 7:1, removing said silicon nitride from all areas of said wafer except said device areas, implanting boron ions into said substrate around N-channel device areas and around said N-well, the implantation energy being the range from 25 to 50 keV, and driving in said boron ions and thermally growing oxide in all areas except said device areas covered by said nitride, and removing said nitride layer and said thin silicon dioxide layer.

Claim 13

The process of claim 7 wherein said first gate oxide layer has a thickness in a range from 300 to 350 Å.

Claim 14

The process of claim 7 wherein said boron and phosphorus doped silicon glass has a concentration of from 2 to 4 wt % boron and from 4 to 6 wt % phosphorus, said glass having a flow temperature of approximately 900°-1000 ° C.

Claim 15

The process of claim 7 wherein said intermetal layer is formed by depositing a layer of insulative material on said first conductive lines, etching back 60% to 90% of said insulative material, and redepositing said insulative material to a thickness in a range from 6000 Å to 14000 Å.

Claim 16

The process of claim 7 wherein said via holes in said intermetal layer are formed by selective etching using a wet and dry plasma reactive etch.