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US4829553A Expired / Lapsed US ⏱️ 0.0 years remaining

Chip type component

Assignee: Panasonic Holdings Corp
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Filing: 1988-01-19
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Granted: 1989-05-09
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Expires: 2008-01-19
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Abstract

Abstract The invention is directed to the electrode structure of a chip type component, such as a chip resistor, in which a plated film of low melting point metal is used as an outermost coating electrode film on the electrode portion, the layer underlying said plated film of low melting point metal on the electrode portion is formed of a metal material having a higher melting point than that of the plated film and also having good affinity with said plated film, and the electrode material comprising said plated film of low melting point metal is subjected to heat treatment at a temperature higher than the melting point thereof, so that the outermost surface of the electrode portion is coated with a remolten metal film.

Inventors

  • 👤 Yasuhiro Shindo
  • 👤 Yukio Tsujimoto
  • 👤 Isami Saito

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 08:52
CPC Classifications
H; H01; H01C; H01C17/00; H01C17/006; H01C1/00; H01C1/14; H01C1/144

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 107 words
A chip type component having an electrode structure, said electrode structure comprising: an electrode portion, a plated film made of low melting point metal and used as an outermost coating electrode film on the electrode portion, and a layer underlying said plated film on the electrode portion and made of a metal material having a melting point higher than that of said plated film and also having good affinity with said plated film, said electrode structure being heat treated at a temperature higher than the melting point of said plated film so that the outermost surface of the electrode portion is coated with a remolten metal film.
Claim 2
Dependent Claim 107 words
A chip type component having an electrode structure, said electrode structure comprising: an electrode portion, a plated film made of low melting point metal and used as an outermost coating electrode film on the electrode portion, and a layer underlying said plated film on the electrode portion and made of a metal material having a melting point higher than that of said plated film and also having good affinity with said plated film, said electrode structure being heat treated at a temperature higher than the melting point of said plated film so that the outermost surface of the electrode portion is coated with a remolten metal film.
Claim 3
Dependent Claim 27 words
A chip type component according to claim 1, wherein said plated film of low melting point metal has a melting point of 100 deg.C. to 550 deg.C.
Claim 4
Dependent Claim 26 words
A chip type component according to claim 1, wherein said plated film of low melting point metal has film thickness of not less than 1 μm.
Claim 5
Dependent Claim 107 words
A chip type component having an electrode structure, said electrode structure comprising: an electrode portion, a solder-plated film made of low melting point metal and used as an outermost coating electrode film on the electrode portion, and a layer underlying said solder-plated film on the electrode portion and made of a metal material having a melting point higher than that of said plated film and also having good affinity with said solder-plated film, said electrode structure being heat treated at a temperature higher than the melting point of said solder-plated film so that the outermost surface of the electrode portion is coated with a remolten metal film.
Claim 6
Dependent Claim 107 words
A chip type component having an electrode structure, said electrode structure comprising: an electrode portion, a solder-plated film made of low melting point metal and used as an outermost coating electrode film on the electrode portion, and a layer underlying said solder-plated film on the electrode portion and made of a metal material having a melting point higher than that of said plated film and also having good affinity with said solder-plated film, said electrode structure being heat treated at a temperature higher than the melting point of said solder-plated film so that the outermost surface of the electrode portion is coated with a remolten metal film.
Claim 7
Dependent Claim 129 words
A chip type component having an electrode structure, said electrode structure comprising: an electrode portion, a solder-plated film made of low melting point metal and used as an outermost coating electrode film on the electrode portion, said-plated film having a film thickness of not less than 1 μm and a melting point of 100 deg.C. to 550 deg.C. and a layer underlying said solder-plated film on the electrode portion and made of a metal material having a melting point higher than that of said solder-plated film and also having good affinity with said solder-plated film, said electrode structure being heat treated at a temperature higher than the melting point of said solder-plated film so that the outermost surface of the electrode portion is coated with a remolten metal film.
Claim 8
Dependent Claim 129 words
A chip type component having an electrode structure, said electrode structure comprising: an electrode portion, a solder-plated film made of low melting point metal and used as an outermost coating electrode film on the electrode portion, said-plated film having a film thickness of not less than 1 μm and a melting point of 100 deg.C. to 550 deg.C. and a layer underlying said solder-plated film on the electrode portion and made of a metal material having a melting point higher than that of said solder-plated film and also having good affinity with said solder-plated film, said electrode structure being heat treated at a temperature higher than the melting point of said solder-plated film so that the outermost surface of the electrode portion is coated with a remolten metal film.
Claim 9
Dependent Claim 27 words
A chip type component according to claim 5, wherein said plated film of low melting point metal has a film thickness of 8 μm to 15 μm.

References Cited (Backward Citations)

US4073971A Cited
JPS5426458A Cited
US4358748A Cited
JPS5621283A Cited
JPS5621282A Cited
JPS5810843A Cited
US4458294A Cited
JPS60192401A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-05-08 1992-11-07 1993-05-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-05-08 1996-11-07 1997-05-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-05-08 2000-11-07 2001-05-09 $7700.00 Window Closed / Lapsed

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