US4818934A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for measuring characteristics of electronic devices
Assignee: Tektronix Japan Corp
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Filing: 1988-01-05
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Granted: 1989-04-04
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Expires: 2008-01-05
Abstract
Abstract An electronic device measurement apparatus measures a characteristic of an electronic device under test (DUT) by applying a smoothly changing voltage from one terminal of a voltage supply to an ungrounded terminal of the DUT and detecting a current flowing through the DUT. The current flowing through the DUT does not include a looping error component. A current detection resistor is connected between another terminal of the voltage supply and a grounded terminal of the DUT. Since the voltage applied to the DUT is a sine squared wave voltage, the pure current flowing through the DUT is detected by detcting cosine-wave and sine-wave components from the ungrounded terminal of the DUT and obtaining the difference between the voltage across the current detection resistor and the cosine-wave and sine-wave components.
Inventors
- 👤 Hisashi Tamamura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 19:12
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2601; G01R31/2603
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
196 words
An apparatus for measuring characteristics of electronic devices, comprising: voltage generation means having first and second output terminals, for generating a sine-squared voltage at said first output terminal, the voltage being applied to a first terminal of an electronic device under test with a second terminal thereof being grounded, a current detection resistor connected between said second terminal of said electronic device under test and said second output terminal of said voltage generation means, first voltage detection means for detecting a voltage between said first and second terminals of said electronic device under test, second voltage detection means for detecting a voltage across said current detection resistor, first detection means for detecting one of a sine-wave component and a cosine-wave component at a point connected to said first terminal of said electronic device under test, and second detection means for detecting the other of the sine-wave component and the cosine-wave component at a point connected to said first terminal of said electronic devices under test, wherein said second voltage detection means produces the difference between the voltage across said current detection resistor and the sum of the output voltages from said first and second detection means.
Claim 2
Independent Claim
196 words
An apparatus for measuring characteristics of electronic devices, comprising: voltage generation means having first and second output terminals, for generating a sine-squared voltage at said first output terminal, the voltage being applied to a first terminal of an electronic device under test with a second terminal thereof being grounded, a current detection resistor connected between said second terminal of said electronic device under test and said second output terminal of said voltage generation means, first voltage detection means for detecting a voltage between said first and second terminals of said electronic device under test, second voltage detection means for detecting a voltage across said current detection resistor, first detection means for detecting one of a sine-wave component and a cosine-wave component at a point connected to said first terminal of said electronic device under test, and second detection means for detecting the other of the sine-wave component and the cosine-wave component at a point connected to said first terminal of said electronic devices under test, wherein said second voltage detection means produces the difference between the voltage across said current detection resistor and the sum of the output voltages from said first and second detection means.
Claim 3
Dependent Claim
16 words
An apparatus according to claim 1, wherein said first detection means is an AC coupling path.
Claim 4
Dependent Claim
18 words
An apparatus according to claim 2, wherein said AC coupling path is a capacitor having a large capacitance.
Claim 5
Dependent Claim
18 words
An apparatus according to claim 1, wherein said second detection means is a capacitor having a small capacitance.
Claim 6
Independent Claim
160 words
An apparatus for measuring characteristics of electronic devices, comprising: voltage generation means having first and second output terminals, for generating at said first output terminal a sine squared wave voltage for application to a first terminal of an electronic device under test with a second terminal thereof being grounded, a current detection resistor connected between said second terminal of said electronic device under test and said second output terminal of said voltage generation means, first detection means for detecting one of a sine-wave component and a cosine-wave component at a point connected to said first terminal of said electronic device under test, second detection means for detecting the other one of the sine wave component and the cosine-wave component at said point connected to said first terminal of said electronic device under test, and difference detection means for providing the difference between the voltage across said current detection resistor and the output voltages from said first and second detection means.
Claim 7
Independent Claim
160 words
An apparatus for measuring characteristics of electronic devices, comprising: voltage generation means having first and second output terminals, for generating at said first output terminal a sine squared wave voltage for application to a first terminal of an electronic device under test with a second terminal thereof being grounded, a current detection resistor connected between said second terminal of said electronic device under test and said second output terminal of said voltage generation means, first detection means for detecting one of a sine-wave component and a cosine-wave component at a point connected to said first terminal of said electronic device under test, second detection means for detecting the other one of the sine wave component and the cosine-wave component at said point connected to said first terminal of said electronic device under test, and difference detection means for providing the difference between the voltage across said current detection resistor and the output voltages from said first and second detection means.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-04-03 | 1992-10-03 | 1993-04-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-04-03 | 1996-10-03 | 1997-04-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-04-03 | 2000-10-03 | 2001-04-04 | $7700.00 | Window Closed / Lapsed |