US4368425A
Expired / Lapsed
US
⏱️ 0.0 years remaining
System for and method of testing transistors
Assignee: Shawmut Bank NA
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Filing: 1980-11-24
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Granted: 1983-01-11
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Expires: 2000-11-24
Abstract
Abstract An improved system for and method of testing a transistor for its V be -I c characteristics independent of temperature is disclosed. The system for carrying out the method comprises means for generating a first signal which varies with temperature in accordance with the base-to-emitter voltage of the transistor as a function of temperature and means for generating a second signal which varies with temperature in accordance with the transconductance gain of the transistor as a function of temperature. Means are provided for modifying at least one of the first and second signals so that as modified the two signals vary with temperature in an equal and opposite manner to one another. The system also includes means for adding the two signals as modified so as to provide an output signal representative of the V be -I c characteristics of the transistor independent of temperature.
Inventors
- 👤 Robert W. Adams
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 19:36
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2608; G01R31/2619
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
130 words
A system for testing a transistor for its V be -I c characteristics independent of temperature, said system comprising means for generating a first signal which varies with temperature in accordance with the base-to-emitter voltage of said transistor as a function of temperature; means for generating a second signal which varies with temperature in accordance with the transconductance gain of said transistor as a function of temperature; means for modifying at least one of said signals so that as modified said first and second signals vary with temperature in a substantially equal and opposite manner to one another; and means for adding said first and second signals as modified so as to provide an output signal representative of the V be -I c characteristics of said transistor independent of temperature.
Claim 2
Independent Claim
130 words
A system for testing a transistor for its V be -I c characteristics independent of temperature, said system comprising means for generating a first signal which varies with temperature in accordance with the base-to-emitter voltage of said transistor as a function of temperature; means for generating a second signal which varies with temperature in accordance with the transconductance gain of said transistor as a function of temperature; means for modifying at least one of said signals so that as modified said first and second signals vary with temperature in a substantially equal and opposite manner to one another; and means for adding said first and second signals as modified so as to provide an output signal representative of the V be -I c characteristics of said transistor independent of temperature.
Claim 3
Dependent Claim
28 words
A system according to claim 1 wherein said means for generating said first signal includes means for generating a constant collector current through the collector of said transistor.
Claim 4
Dependent Claim
39 words
A system according to claim 2, wherein said means for generating said first signal further includes means for converting said collector current to a DC voltage and means for integrating said voltage so as to produce said first signal.
Claim 5
Dependent Claim
39 words
A system according to claim 3, wherein said means for integrating said DC voltage includes a DC servo loop integrator having its input connected to receive said DC voltage and its output coupled to the base of said transistor.
Claim 6
Dependent Claim
32 words
A system according to claim 3, wherein means for integrating said DC voltage includes an operational amplifier and an integrating feedback capacitor connected between an input and output of said operational amplifier.
Claim 7
Dependent Claim
91 words
A system according to claim 1, wherein said means for generating said second signal includes means for applying an AC input signal to the base of said transistor so as to generate a second AC signal in the collector of said transistor as a function of the transconductance gain of said means for averaging said second AC signal so as to provide a DC signal as a function of said transconductance gain, and means responsive to said DC signal for inverting said DC signal so as to provide said second signal.
Claim 8
Dependent Claim
61 words
A system according to claim 6, wherein said means for modifying at least one of said signals includes multiplier means for multiplying said second signal by a constant factor to provide a modified second signal, said constant factor being such that said first signal and said modified second signal vary with temperature in an equal and opposite manner to one another.
Claim 9
Independent Claim
199 words
A method of testing the base-to-emitter voltage-collector-current characteristics of a transistor independent of temperature, said method comprising the steps of: providing a constant DC current through the collector of said transistor, generating a first DC signal in response to said constant DC current, said first DC signal varying with temperature in accordance with the base-to-emitter voltage of said transistor as a function of temperature; applying an AC signal to the base of said transistor, generating in response to said applied AC signal a second AC signal in the collector of said transistor, said second AC signal being representative of the transconductance gain of said transistor; converting the second AC signal to a second DC signal which varies with temperature in accordance with the transconductance gain of said transistor as a function of temperature; modifying at least one of said first and second DC signals so that said first and second DC signals vary with temperature in a substantially equal and opposite manner; and adding the first and second DC signals, as modified so as to provide a DC signal equal to the base-emitter voltage of said transistor at a predetermined temperature independent of the operating temperature of said transistor.
Claim 10
Independent Claim
199 words
A method of testing the base-to-emitter voltage-collector-current characteristics of a transistor independent of temperature, said method comprising the steps of: providing a constant DC current through the collector of said transistor, generating a first DC signal in response to said constant DC current, said first DC signal varying with temperature in accordance with the base-to-emitter voltage of said transistor as a function of temperature; applying an AC signal to the base of said transistor, generating in response to said applied AC signal a second AC signal in the collector of said transistor, said second AC signal being representative of the transconductance gain of said transistor; converting the second AC signal to a second DC signal which varies with temperature in accordance with the transconductance gain of said transistor as a function of temperature; modifying at least one of said first and second DC signals so that said first and second DC signals vary with temperature in a substantially equal and opposite manner; and adding the first and second DC signals, as modified so as to provide a DC signal equal to the base-emitter voltage of said transistor at a predetermined temperature independent of the operating temperature of said transistor.
Claim 11
Dependent Claim
35 words
A method according to claim 8, wherein said step of modifying includes inverting said second signal so as to provide a third DC signal which is a function of the inverse of said transconductance gain.
Claim 12
Dependent Claim
24 words
A method according to claim 9, wherein said step of modifying further includes means for multiplying said third DC signal by a constant factor.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-01-10 | 1986-07-12 | 1987-01-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-01-10 | 1990-07-12 | 1991-01-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-01-10 | 1994-07-12 | 1995-01-11 | $7700.00 | Window Closed / Lapsed |