US4816615A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Thick film copper conductor inks
Assignee: Lockheed Martin Corp
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Filing: 1987-08-20
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Granted: 1989-03-28
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Expires: 2007-08-20
Abstract
Abstract Improved copper conductor inks useful in the fabrication of multilevel circuits are disclosed. The inks comprise copper powder, a devitrifying glass frit selected from a zinc-calcium-aluminum-silicate glass frit, a zinc-magnesium-barium-aluminum-silicate glass frit and mixtures thereof, an adhesion promoting oxide, and a suitable organic vehicle. These inks are particularly adapted for applications where superior adhesion between the copper conductor ink and underlying substrate or dielectric film is required.
Inventors
- 👤 Ashok N. Prabhu
- 👤 Kenneth W. Hang
- 👤 Edward J. Conlon
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 16:02
CPC Classifications
C; C09; C09D; C09D11/00; C09D11/52; H; H05; H05K; H05K1/00; H05K1/02; H05K1/09; H05K1/092; C03; C03C; C03C3/00; C03C3/04; C03C3/062; C03C3/076; C03C3/097; H01; H01B; H01B1/00; H01B1/14; H01B1/16; H05K1/14
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
130 words
In a multilayer, copper-based integrated circuit structure comprising a suitable circuit board having thereon at least two patterned layers of a copper conductor, said layers being separated by a dielectric layer having vias therein, said vias being filled with copper to contact said conductor layers, the improvement wherein the copper conductors comprise on a weight basis: (a) from about 75 to about 95 percent of copper powder; (b) from about 2 to about 12 percent of a devitrifying glass frit selected from the group consisting of a zinc-calcium-aluminum-silicate glass frit, a zinc-magnesium-barium-aluminum-silicate glass frit and mixtures thereof; and (c) from about 1 to about 10 percent of an adhesion promoting oxide selected from the group consisting of bismuth oxide, cadmium oxide, cuprous oxide, thallium oxide, lead oxide and mixtures thereof.
Claim 2
Dependent Claim
130 words
In a multilayer, copper-based integrated circuit structure comprising a suitable circuit board having thereon at least two patterned layers of a copper conductor, said layers being separated by a dielectric layer having vias therein, said vias being filled with copper to contact said conductor layers, the improvement wherein the copper conductors comprise on a weight basis: (a) from about 75 to about 95 percent of copper powder; (b) from about 2 to about 12 percent of a devitrifying glass frit selected from the group consisting of a zinc-calcium-aluminum-silicate glass frit, a zinc-magnesium-barium-aluminum-silicate glass frit and mixtures thereof; and (c) from about 1 to about 10 percent of an adhesion promoting oxide selected from the group consisting of bismuth oxide, cadmium oxide, cuprous oxide, thallium oxide, lead oxide and mixtures thereof.
Claim 3
Dependent Claim
64 words
A circuit structure in accordance with claim 1, wherein the copper conductors comprise, on a weight basis: (a) from about 75 to about 95 percent of copper powder; (b) from about 2 to about 12 percent of said devitrifying glass fit; (c) from about 0.5 to about 6 percent of bismuth oxide; and (d) from about 0.5 to about 3.5 percent of cuprous oxide.
Claim 4
Dependent Claim
88 words
A circuit structure in accordance with claim 2, wherein the devitrifying glass frit is a zinc-calcium-aluminum-silicate glass frit comprising, on a weight basis: (a) from about 7 to about 12 percent of zinc oxide; (b) from about 25 to about 45 percent of calcium oxide; (c) from about 10 to about 20 percent of aluminum oxide; (d) from about 35 to about 50 percent of silicon dioxide; (e) from 0 to about 2 percent of phosphorus pentoxide; and (f) from 0 to about 5 percent of zirconium silicate.
Claim 5
Dependent Claim
98 words
A circuit structure in accordance with claim 2, wherein the devitrifying glass frit is a zinc-magnesium-barium-aluminum-silicate glass comprising, on a weight basis: (a) from about 15 to about 25 percent of zinc oxide; (b) from about 10 to about 25 percent of magnesium oxide; (c) from about 3 to about 12 percent of barium oxide; (d) from about 5 to about 20 percent of aluminum oxide; (e) from about 35 to about 50 percent of silicon dioxide; (f) from 0 to about 3 percent of phosphorus pentoxide; and (g) from 0 to about 5 percent of zirconium silicate.
Claim 6
Dependent Claim
100 words
A circuit structure in accordance with claim 4, wherein the devitrifying glass frit is a zinc-magnesium-barium-aluminum-silicate glass comprising, on a weight basis: (a) from about 16 to about 22 percent of zinc oxide; (b) from about 16 to about 22 percent of magnesium oxide; (c) from about 5 to about 10 percent of barium oxide; (d) from about 8 to about 11 percent of aluminum oxide; (e) from about 39 to about 43 percent of silicon dioxide; (f) from about 1 to about 2 percent of phosphorus pentoxide; and (g) from about 2 to about 3 percent of zirconium silicate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-03-27 | 1992-09-26 | 1993-03-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-03-27 | 1996-09-26 | 1997-03-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-03-27 | 2000-09-26 | 2001-03-28 | $7700.00 | Window Closed / Lapsed |