US4808259A
Expired / Lapsed
US
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Plasma etching process for MOS circuit pregate etching utiliizing a multi-step power reduction recipe
Assignee: Intel Corp
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Filing: 1988-01-25
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Granted: 1989-02-28
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Expires: 2008-01-25
Abstract
Abstract A method for etching of metal-oxide-semiconductor (MOS) devices utilizing a multi-step power reduction plasma etching recipe to reduce ion bombardment damage on the resulting surface. The multi-step power reduction recipe allows for reasonable throughput of wafers due to a relatively high etch rate at the upper layers of the surface followed by progressively lower power corresponding lower etch rates at the lower levels of the surface. The etching process is followed by a cleaning process to remove metallic contamination resulting from the plasma etching process to yield an excellent surface for growing low defect density MOS gate oxides with high dielectric integrity.
Inventors
- 👤 Don W. Jillie, Jr.
- 👤 Gerald Yin
- 👤 Glen Wada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 20:13
CPC Classifications
H; H10; H10B; H10B41/00; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; Y; Y10; Y10S; Y10S438/00; Y10S438/963
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
46 words
A method for pregate etching of a metal-oxide-semiconductor (MOS) thin film comprising the steps of: plasma etching said thin film at a first power level; plasma etching said thin film at a second power level, said second power level being lower than said first power level.
Claim 2
Independent Claim
46 words
A method for pregate etching of a metal-oxide-semiconductor (MOS) thin film comprising the steps of: plasma etching said thin film at a first power level; plasma etching said thin film at a second power level, said second power level being lower than said first power level.
Claim 3
Dependent Claim
19 words
The method, as recited by claim 1, further comprising the step of cleaning a surface exposed by said etching.
Claim 4
Dependent Claim
42 words
The method, as recited by claim 2, wherein said cleaning comprises the steps of: oxidation and dissolution of impurities on said surface in a first solution at a first temperature; dissolution of remaining impurities in a second solution at a second temperature.
Claim 5
Dependent Claim
29 words
The method, as recited by claim 3, wherein said first solution comprises water (H 2 O), ammonium hydroxide (NH 4 OH) and hydrogen peroxide (H 2 O 2 ).
Claim 6
Dependent Claim
25 words
The method, as recited by claim 4, wherein said first temperature is approximately 20°-40° C. and said clean is carried out in a megasonic bath.
Claim 7
Dependent Claim
27 words
The method, as recited by claim 5, wherein said second solution comprises water (H 2 O), hydrochloric acid (HCl) and hydrogen peroxide (H 2 O 2 ).
Claim 8
Dependent Claim
16 words
The method, as recited by claim 1, wherein said first power level is approximately 275 watts.
Claim 9
Dependent Claim
16 words
The method, as recited by claim 7, wherein said second power level is approximately 150 watts.
Claim 10
Dependent Claim
42 words
The method, as recited by claim 1, further comprising the steps of: etching said thin film at a third power level lower than said second power level; etching said thin film at a fourth power level lower than said third power level.
Claim 11
Dependent Claim
16 words
The method, as recited by claim 9, wherein said third power level is approximately 100 watts.
Claim 12
Dependent Claim
16 words
The method, as recited by claim 10, wherein said fourth power level is approximately 75 watts.
Claim 13
Dependent Claim
18 words
The method, as recited by claim 1, wherein said etching steps are done in a single wafer etcher.
Claim 14
Dependent Claim
17 words
The method, as recited by claim 1, wherein said etching steps are done in a batch etcher.
Claim 15
Dependent Claim
40 words
The method, as recited by claim 1, wherein said thin film is etched at a pressure of approximately 600 mT with an electrode spacing of approximately 0.8 cm and a flow of approximately 125 SCCM C 2 F 6 .
Claim 16
Dependent Claim
32 words
In a method for pregate etching thin film layers on a metal-oxide-semiconductor (MOS) device, said method utilizing a plasma etch, an improvement comprising etching at a series of progressively lower power levels.
Claim 17
Dependent Claim
32 words
In a method for pregate etching thin film layers on a metal-oxide-semiconductor (MOS) device, said method utilizing a plasma etch, an improvement comprising etching at a series of progressively lower power levels.
Claim 18
Dependent Claim
32 words
The improvement, as recited by claim 15, wherein said etch occurs at a first power level of approximately 275 watts, followed by etching at a second power level of approximately 150 watts.
Claim 19
Dependent Claim
16 words
The improvement, as recited by claim 15, wherein said etching is followed by a clean process.
Claim 20
Dependent Claim
82 words
The improvement, as recited by claim 17, wherein said clean process comprises the steps of oxidation and dissolution of organic impurities on said surface in first solution of water (H 2 O), ammonium hydroxide (NH 4 OH) and 20° C. to 40° C. in a megasonic bath; dissolution of remaining metallic impurities in a second solution comprising water (H 2 O), hydrochloric acid (HCl) and hydrogen peroxide (H 2 O 2 ) at a temperature of approximately 20° C. to 40° C.
Claim 21
Dependent Claim
168 words
In a method for pregate etching of thin film surfaces on a metal-oxide-semiconductor (MOS) device, said method comprising etching said device with a plasma etch, an improvement comprising the steps of: etching said device at a first power level of approximately 275 watts, a pressure of approximately 600 mT, with a gap of approximately 0.8 cm and a flow of approximately 125 SCCM C 2 F 6 ; etching said device at a second power level of approximately 150 watts, a pressure of approximately 600 mT, with a gap of approximately 0.8 cm, and a flow of approximately 125 SCCM C 2 F 6 ; cleaning a resulting surface of said substrate in a first solution of water (H 2 O), ammonium hydroxide (NH 4 OH) and hydrogen peroxide (H 2 O 2 ) at a temperature of approximately 20° C. to 40° C.; further cleaning said substrate surface in a solution of water (H 2 O), hydrochloric acid (HCl) and hydrogen peroxide (H 2 O 2 ).
Claim 22
Dependent Claim
168 words
In a method for pregate etching of thin film surfaces on a metal-oxide-semiconductor (MOS) device, said method comprising etching said device with a plasma etch, an improvement comprising the steps of: etching said device at a first power level of approximately 275 watts, a pressure of approximately 600 mT, with a gap of approximately 0.8 cm and a flow of approximately 125 SCCM C 2 F 6 ; etching said device at a second power level of approximately 150 watts, a pressure of approximately 600 mT, with a gap of approximately 0.8 cm, and a flow of approximately 125 SCCM C 2 F 6 ; cleaning a resulting surface of said substrate in a first solution of water (H 2 O), ammonium hydroxide (NH 4 OH) and hydrogen peroxide (H 2 O 2 ) at a temperature of approximately 20° C. to 40° C.; further cleaning said substrate surface in a solution of water (H 2 O), hydrochloric acid (HCl) and hydrogen peroxide (H 2 O 2 ).
Claim 23
Independent Claim
76 words
A method for plasma etching a thin film in a metal-oxide semiconductor (MOS) device comprising the steps of: etching said device to remove said thin film; cleaning the resulting surface, said cleaning comprising the steps of: (a) oxidation and dissolution of a first set of impurities in a first solution, said oxidation taking place at ambient temperatures; (b) dissolution of a second set of impurities at a second temperature, said oxidation taking place at ambient temperatures.
Claim 24
Independent Claim
76 words
A method for plasma etching a thin film in a metal-oxide semiconductor (MOS) device comprising the steps of: etching said device to remove said thin film; cleaning the resulting surface, said cleaning comprising the steps of: (a) oxidation and dissolution of a first set of impurities in a first solution, said oxidation taking place at ambient temperatures; (b) dissolution of a second set of impurities at a second temperature, said oxidation taking place at ambient temperatures.
Claim 25
Dependent Claim
18 words
The method, as recited by claim 20, wherein said cleaning steps are done in a megasonic cleaning system.
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| 7.5 Years (Year 8) | 1996-02-28 | 1996-08-29 | 1997-02-28 | $3760.00 | Window Closed / Lapsed |
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