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US4764674A Expired / Lapsed US ⏱️ 0.0 years remaining

High time resolution electron microscope

Assignee: Hamamatsu Photonics KK
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Filing: 1986-12-15
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Granted: 1988-08-16
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Expires: 2006-12-15
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Abstract

Abstract A high time resolution electron microscope unit comprising a beam source for generating an exciting beam; a microscope for exposing the surface of a specimen to be observed to the exciting beam for emitting electrons from the surface; an image formation device for receiving the emitted electrons and for displaying an image representative of variations in the surface of the specimen; a gate mechanism for controlling the flow of emitted electrons from the specimen toward the image formation device; deflecting plates for deflecting the emitted electrons from the gate mechanism onto the image formation device; and a drive circuit for synchronizing the operation of the gate mechanism, the deflecting coil and the beam source.

Inventors

  • 👤 Katsuyuki Kinoshita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 22:55
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/285

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 136 words
A high time resolution electron microscope unit comprising: beam source means for generating an exciting beam; microscope means for exposing the surface of a specimen to be observed to the exciting beam for emitting electrons from the surface; image formation means for receiving the emitted electrons and for displaying an image representative of variations in the surface of the specimen; gate means for controlling the flow of emitted electrons from the specimen toward the image formation means; deflecting means including a deflecting plate for deflecting the emitted electrons from the gate means successively onto the image formation means to detect high speed variations; and drive means for synchronizing the operation of the gate means, the deflecting means and the beam source means to obtain a plurality of images on the image formation means in frame form.
Claim 2
Dependent Claim 136 words
A high time resolution electron microscope unit comprising: beam source means for generating an exciting beam; microscope means for exposing the surface of a specimen to be observed to the exciting beam for emitting electrons from the surface; image formation means for receiving the emitted electrons and for displaying an image representative of variations in the surface of the specimen; gate means for controlling the flow of emitted electrons from the specimen toward the image formation means; deflecting means including a deflecting plate for deflecting the emitted electrons from the gate means successively onto the image formation means to detect high speed variations; and drive means for synchronizing the operation of the gate means, the deflecting means and the beam source means to obtain a plurality of images on the image formation means in frame form.
Claim 3
Dependent Claim 28 words
The microscope unit of claim 1 wherein the beam source means includes a laser generator, and the microscope beams includes a vacuum tube having a sealable opening therein.
Claim 4
Dependent Claim 17 words
The microscope unit of claim 2 wherein the image formation means includes at least one phosphor screen.
Claim 5
Dependent Claim 20 words
The microscope unit of claim 3 wherein the gate means includes a first deflecting electrode and a beam blocking electrode.
Claim 6
Dependent Claim 24 words
The microscope unit of claim 4 wherein the microscope means includes accelerating means for accelerating electrons emitted from the specimen toward the phosphor screen.
Claim 7
Dependent Claim 22 words
The microscope unit of claim 5 also including lens means for focusing the electrons emitted by the surface into an enlarged image.
Claim 8
Dependent Claim 30 words
The microscope unit of claim 5 wherein the accelerating means includes an anode having an aperture disposed adjacent to the specimen for reflecting the exciting beam and irradiating the specimen.
Claim 9
Dependent Claim 23 words
The microscope unit of claim 1 wherein the microscope means includes a vacuum container, and means for supporting the specimen in the container.
Claim 10
Dependent Claim 14 words
The microscope unit of claim 8 wherein to support means includes a bar-shaped cathode.
Claim 11
Dependent Claim 157 words
A high time resolution electron microscope unit comprising: beam source means for generating an exciting beam; microscope means for exposing the surface of a specimen to be observed to the exciting beam for emitting electrons from the surface, wherein the microscope means includes a vacuum container, and means for supporting the specimen in the container; image formation means for receiving the emitted electrons and for displaying an image representative of variations in the surface of the specimen; gate means for controlling the flow of emitted electrons from the specimen toward the image formation means; deflecting means for deflecting the emitted electrons from the gate means onto the image formation means; and drive means for synchronizing the operation of the gate means, the deflecting means and the beam source means; wherein the container includes a plurality of cylinders each having an inner surface, and the image formation means includes a plurality of phosphor screens on the inner surfaces.
Claim 12
Dependent Claim 157 words
A high time resolution electron microscope unit comprising: beam source means for generating an exciting beam; microscope means for exposing the surface of a specimen to be observed to the exciting beam for emitting electrons from the surface, wherein the microscope means includes a vacuum container, and means for supporting the specimen in the container; image formation means for receiving the emitted electrons and for displaying an image representative of variations in the surface of the specimen; gate means for controlling the flow of emitted electrons from the specimen toward the image formation means; deflecting means for deflecting the emitted electrons from the gate means onto the image formation means; and drive means for synchronizing the operation of the gate means, the deflecting means and the beam source means; wherein the container includes a plurality of cylinders each having an inner surface, and the image formation means includes a plurality of phosphor screens on the inner surfaces.
Claim 13
Dependent Claim 35 words
The microscope unit of claim 10 wherein the drive means includes a sloped voltage generating circuit for applying a sloped voltage to the deflecting means in synchronization with the exciting beam from the beam source.

References Cited (Backward Citations)

US2267137A Cited
US4096386A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-08-16 1992-02-15 1992-08-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-08-16 1996-02-15 1996-08-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-08-16 2000-02-15 2000-08-16 $7700.00 Window Closed / Lapsed

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