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US4746390A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for joining a semiconductor chip to a chip carrier

Assignee: Siemens AG
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Filing: 1982-07-29
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Granted: 1988-05-24
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Expires: 2002-07-29
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Abstract

Abstract Method of joining a semiconductor chip to a chip carrier by cementing or soldering which includes treating an area of the semiconductor chip to be joined to the carrier with a laser beam, adjusting the energy of the laser beam to produce depressions by localizing melting of the semiconductor material of the chip and to at least partially pile melted semiconductor material at the edge of the depression, and applying cement or solder between the treated area of the semiconductor chip and the carrier.

Inventors

  • 👤 Radim Badalec
  • 👤 Werner Baumgartner
  • 👤 David Cutter

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 13:10
CPC Classifications
H; H10; H10P; H10P34/00; H10P34/40; H10P34/42; H10W; H10W72/00; H10W72/30; H10W72/071; H10W72/073; H10W72/07331; H10W72/07336; H10W72/07337; H10W72/351; H10W72/352; Y; Y10; Y10T; Y10T156/00; Y10T156/10; Y10T156/1002

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 102 words
Method of joining a semiconductor chip to a chip carrier by cementing or soldering, which comprises treating an area of the semiconductor chip to be joined to the carrier with a laser beam, adjusting the energy of the laser beam to produce depressions in the semiconductor chip by localized melting of the semiconductor material of the chip and to at least partially pile melted semiconductor material on the surface of the semiconductor chip at the edge of the depression, and applying cement or solder between the treated area of the semiconductor chip containing the depressions and the piled material and the carrier.
Claim 2
Dependent Claim 102 words
Method of joining a semiconductor chip to a chip carrier by cementing or soldering, which comprises treating an area of the semiconductor chip to be joined to the carrier with a laser beam, adjusting the energy of the laser beam to produce depressions in the semiconductor chip by localized melting of the semiconductor material of the chip and to at least partially pile melted semiconductor material on the surface of the semiconductor chip at the edge of the depression, and applying cement or solder between the treated area of the semiconductor chip containing the depressions and the piled material and the carrier.
Claim 3
Dependent Claim 46 words
Method according to claim 1, which comprises forming the depressions with a diameter of between 50 and 200 μm and a depth of between 2 and 10 μm, and piling the semiconductor material ejected from the depressions at a height of between 2 and 10 μm.
Claim 4
Dependent Claim 24 words
Method according to claim 1 or 2, which comprises using a pulsed Nd:YAG laser for treating the area of the chip to be joined.
Claim 5
Dependent Claim 16 words
Method according to claim 1, which comprises performing the melting step in a protective gas atmosphere.
Claim 6
Dependent Claim 16 words
Method according to claim 1, which comprises performing the melting step in a reactive gas atmosphere.
Claim 7
Dependent Claim 21 words
Method according to claim 1, which comprises metallizing the area of the semiconductor chip to be joined after the laser treatment.

References Cited (Backward Citations)

US3945111A Cited
US4028523A Cited
US4050507A Cited
US4200382A Cited
US4360965A Cited
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US4257827A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-05-24 1991-11-23 1992-05-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-05-24 1995-11-23 1996-05-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-05-24 1999-11-23 2000-05-24 $7700.00 Window Closed / Lapsed

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