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US4745445A Expired / Lapsed US ⏱️ 0.0 years remaining

Interdigitated Schottky diode

Assignee: ITT Gallium Arsenide Technology Center
•
Filing: 1986-12-22
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Granted: 1988-05-17
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Expires: 2006-12-22
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Abstract

Abstract A high frequency, e.g. millimeter wave, semiconductor diode structure includes a buried layer of n + -type material and a surface layer of lightly doped n-type material on which a Schottky barrier contact is disposed. The n + -type layer provides a low series resistance thus permitting high frequency operation. The structure is compatible with MESFET processing techniques and may thus be incorporated in an integrated circuit.

Inventors

  • 👤 Joseph Mun
  • 👤 Graeme K. Barker
  • 👤 Mohamed H. Badawi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 14:39
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/21; H10D; H10D8/00; H10D8/60; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0158; H10P30/202; H10P30/206; H10P30/22; H10P30/28

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 162 words
A millimeter wave frequency integrated circuit comprising a Schottky field effect transistor (MESFET) and a Schottky diode structure including a plurality of diodes formed in a compound semiconductor substrate, the MESFET of said circuit including first and second deep layers of n + type material separated by a first surface layer of lightly doped n-type material, a Schottky gate contact disposed on said first surface layer, and first and second ohmic contacts connected directly to said first and second deep layers respectively to form the source and the drain contacts of the MESFET, and each said diode including a third deep layer of n + -type material overload by a second surface layer of lightly doped n-type material, a Schottky diode contact disposed on said second surface layer, and a third ohmic contact connected directly to said third deep layer, said Schottky diode contacts and said third ohmic contacts being arranged in an interdigited finger structure for connecting said diodes in parallel.
Claim 2
Dependent Claim 162 words
A millimeter wave frequency integrated circuit comprising a Schottky field effect transistor (MESFET) and a Schottky diode structure including a plurality of diodes formed in a compound semiconductor substrate, the MESFET of said circuit including first and second deep layers of n + type material separated by a first surface layer of lightly doped n-type material, a Schottky gate contact disposed on said first surface layer, and first and second ohmic contacts connected directly to said first and second deep layers respectively to form the source and the drain contacts of the MESFET, and each said diode including a third deep layer of n + -type material overload by a second surface layer of lightly doped n-type material, a Schottky diode contact disposed on said second surface layer, and a third ohmic contact connected directly to said third deep layer, said Schottky diode contacts and said third ohmic contacts being arranged in an interdigited finger structure for connecting said diodes in parallel.
Claim 3
Dependent Claim 74 words
A Schottky diode structure including a plurality of diodes formed in a compound semiconductor substrate, each diode including a deep layer of n + -type material overlaid by a surface layer of lightly doped n-type material, a Schottky contact disposed on said surface layer, and an ohmic contact connected directly to said deep layer, said Schottky contacts and said ohmic contacts being arranged in an interdigited finger structure for connecting said diodes in parallel.
Claim 4
Dependent Claim 74 words
A Schottky diode structure including a plurality of diodes formed in a compound semiconductor substrate, each diode including a deep layer of n + -type material overlaid by a surface layer of lightly doped n-type material, a Schottky contact disposed on said surface layer, and an ohmic contact connected directly to said deep layer, said Schottky contacts and said ohmic contacts being arranged in an interdigited finger structure for connecting said diodes in parallel.
Claim 5
Dependent Claim 19 words
A diode structure as claimed in claim 2, wherein said deep layer of each said diode comprises silicon ions.
Claim 6
Dependent Claim 27 words
A diode structure as claimed in claim 3, wherein said deep layer of each said diode has a doping level of 10 18 to 2×10 18 atoms/cc.
Claim 7
Dependent Claim 22 words
A Schottky diode structure as defined in claim 2 wherein said Schottky contacts and said ohmic contacts lie in a common plane.

References Cited (Backward Citations)

GB1180186A Cited
US4212022A Cited
US3896473A Cited
JPS5318974A Cited
US4238763A Cited
US4400713A Cited
US4338616A Cited
JPS56140667A Cited
US4463322A Cited
EP0078679A2 Cited
US4641174A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-05-17 1991-11-16 1992-05-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-05-17 1995-11-16 1996-05-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-05-17 1999-11-16 2000-05-17 $7700.00 Window Closed / Lapsed

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