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US4728998A Expired / Lapsed US ⏱️ 0.0 years remaining

CMOS circuit having a reduced tendency to latch

Assignee: National Semiconductor Corp
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Filing: 1986-07-30
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Granted: 1988-03-01
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Expires: 2006-07-30
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Abstract

Abstract The tendency of a CMOS circuit to latch up is reduced by implanting ions of germanium or tin into the source and drain regions of the circuit. The low energy gap of these ions lowers the band gap of the source and drain regions, which in turn inhibits their ability to inject carriers into the substrate and well.

Inventors

  • 👤 Robert J. Strain

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 12:27
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/202; H10P30/204; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; H10D62/80; H10D62/83; H10D62/834; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D84/854; H10P30/208

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 70 words
A CMOS integrated circuit having a reduced tendency to latch, comprising complementary NMOS and PMOS transistors formed on a substrate to provide a p-n-p-n structure, and being a product of the process of implanting ions into the source region of each of the NMOS an PMOS transistors, said ions being of a material having an energy gap which is lower than the energy gap of the material forming the substrate.
Claim 2
Dependent Claim 70 words
A CMOS integrated circuit having a reduced tendency to latch, comprising complementary NMOS and PMOS transistors formed on a substrate to provide a p-n-p-n structure, and being a product of the process of implanting ions into the source region of each of the NMOS an PMOS transistors, said ions being of a material having an energy gap which is lower than the energy gap of the material forming the substrate.
Claim 3
Dependent Claim 26 words
The product of claim 1 wherein ions of said lower energy gap material are also implanted into the drain regions of said NMOS and PMOS transistors.
Claim 4
Dependent Claim 20 words
The product of claim 1 wherein the substrate is made of silicon and said lower energy gap material is germanium.
Claim 5
Dependent Claim 20 words
The product of claim 1 wherein the substrate is made of silicon and said lower energy gap material is tin.
Claim 6
Dependent Claim 96 words
A CMOS integrated circuit having a reduced tendency to latch up, comprising: a substrate of one conductivity; a source and drain of opposite conductivity formed in said substrate and providing respective p-n junctions with said substrate, at least said source having an energy gap lower than that of said substrate; a well of said opposite conductivity formed in said substrate; and a source and a drain of said one conductivity formed in said well and providing respective p-n junctions with said well, at least said source having an energy gap lower than that of said well.
Claim 7
Dependent Claim 96 words
A CMOS integrated circuit having a reduced tendency to latch up, comprising: a substrate of one conductivity; a source and drain of opposite conductivity formed in said substrate and providing respective p-n junctions with said substrate, at least said source having an energy gap lower than that of said substrate; a well of said opposite conductivity formed in said substrate; and a source and a drain of said one conductivity formed in said well and providing respective p-n junctions with said well, at least said source having an energy gap lower than that of said well.
Claim 8
Dependent Claim 27 words
The integrated circuit of claim 5 wherein both of said source and drain of said opposite conductivity have an energy gap lower than that of said substrate.
Claim 9
Dependent Claim 27 words
The integrated circuit of claim 5 wherein both of said source and drain of said one conductivity have an energy gap lower than that of said well.
Claim 10
Dependent Claim 140 words
A CMOS integrated circuit comprising a substrate of one conductivity, a source and a drain each of a conductivity opposite to said one conductivity formed in said substrate to provide respective p-n junctions with said substrate, a well of said opposite conductivity formed in said substrate and a source and a drain of said one conductivity formed in said well to provide respective p-n junctions with said well, said circuit being a product of the process of modifying the energy gap of one of said substrate and said source of said opposite conductivity so that the energy gap of said source is less than that of said substrate, and modifying the energy gap of one of said well and said source of said one conductivity so that the energy gap of said source is less than that of said well.
Claim 11
Dependent Claim 140 words
A CMOS integrated circuit comprising a substrate of one conductivity, a source and a drain each of a conductivity opposite to said one conductivity formed in said substrate to provide respective p-n junctions with said substrate, a well of said opposite conductivity formed in said substrate and a source and a drain of said one conductivity formed in said well to provide respective p-n junctions with said well, said circuit being a product of the process of modifying the energy gap of one of said substrate and said source of said opposite conductivity so that the energy gap of said source is less than that of said substrate, and modifying the energy gap of one of said well and said source of said one conductivity so that the energy gap of said source is less than that of said well.
Claim 12
Dependent Claim 32 words
The product of claim 8 wherein said modifying steps comprise implanting said sources with ions of a material having a lower energy gap than the material forming said substrate and said well.

References Cited (Backward Citations)

US3242018A Cited
GB1277988A Cited
US3725145A Cited
US4035665A Cited
US4302875A Cited
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GB2083702A Cited
US4485550A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-03-01 1991-08-31 1992-03-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-03-01 1995-08-31 1996-03-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-03-01 1999-08-31 2000-03-01 $7700.00 Window Closed / Lapsed

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