Vapor phase epitaxy using complex premixing system

Claim 1

A method of manufacturing a semiconductor device comprising the steps of introducing vector gases and reacting gases into a reactor chamber by using at least one system of tubes, said system of tubes including a main tube having one end merging into said reactor chamber and having another end merging at an outlet, and three secondary tubes being designated as first, second, and third secondary tubes, said main tube having four restrictions between which said three secondary tubes respectively merge with said main tube, said first secondary tube merging with said main tube nearest to said reactor chamber, wherein said first secondary tube and said third secondary tube transport said vector gases at respective flow rates of D 1 and D 3 , and wherein said second secondary tube transports said reacting gases at a flow rate of D 2 , such that said main tube guides said reacting gases to said reactor chamber when D 3 >D 1 and D 3 >D 2 , and said main tube guides said reacting gases to said outlet when D 1 >D 3 and D 1 >D 2 , and depositing on a substrate in said reactor chamber crystalline layers from vapor phases by said vector gases and said reacting gases.

Claim 2

A method of manufacturing a semiconductor device comprising the steps of introducing vector gases and reacting gases into a reactor chamber by using at least one system of tubes, said system of tubes including a main tube having one end merging into said reactor chamber and having another end merging at an outlet, and three secondary tubes being designated as first, second, and third secondary tubes, said main tube having four restrictions between which said three secondary tubes respectively merge with said main tube, said first secondary tube merging with said main tube nearest to said reactor chamber, wherein said first secondary tube and said third secondary tube transport said vector gases at respective flow rates of D 1 and D 3 , and wherein said second secondary tube transports said reacting gases at a flow rate of D 2 , such that said main tube guides said reacting gases to said reactor chamber when D 3 >D 1 and D 3 >D 2 , and said main tube guides said reacting gases to said outlet when D 1 >D 3 and D 1 >D 2 , and depositing on a substrate in said reactor chamber crystalline layers from vapor phases by said vector gases and said reacting gases.

Claim 3

A method of manufacturing a semiconductor device comprising the steps of introducing vector gases and reacting gases into a reactor chamber by using at least one system of quartz tubes, said system of tubes including a main tube having one end merging into said reactor chamber and having another end merging at an outlet, and three secondary tubes being designated as first, second, and third secondary tubes, said main tube having four restrictions between which said three secondary tubes respectively merge with said main tube, said first secondary tube merging with said main tube nearest to said reactor chamber, wherein said first secondary tube and said third secondary tube transport said vector gases at respective flow rates of D 1 and D 3 , and wherein said second secondary tube transports said reacting gases at a flow rate of D 2 , such that said main tube guides said reacting gases to said reactor chamber when D 3 >D 1 and D 3 >D 2 , and said main tube guides said reacting gases to said outlet when D 1 >D 3 and D 1 >D 2 , and depositing on a substrate in said reactor chamber crystalline layers from vapor phases by said vector gases and said reacting gases.

Claim 4

A method of manufacturing a semiconductor device comprising the steps of introducing vector gases and reacting gases into a reactor chamber by using at least one system of quartz tubes, said system of tubes including a main tube having one end merging into said reactor chamber and having another end merging at an outlet, and three secondary tubes being designated as first, second, and third secondary tubes, said main tube having four restrictions between which said three secondary tubes respectively merge with said main tube, said first secondary tube merging with said main tube nearest to said reactor chamber, wherein said first secondary tube and said third secondary tube transport said vector gases at respective flow rates of D 1 and D 3 , and wherein said second secondary tube transports said reacting gases at a flow rate of D 2 , such that said main tube guides said reacting gases to said reactor chamber when D 3 >D 1 and D 3 >D 2 , and said main tube guides said reacting gases to said outlet when D 1 >D 3 and D 1 >D 2 , and depositing on a substrate in said reactor chamber crystalline layers from vapor phases by said vector gases and said reacting gases.

Claim 5

A method of manufacturing a semiconductor device comprising the steps of introducing vector gases of hydrogen or of a neutral gas and reacting gases into a reactor chamber by using three systems of tubes, each of said systems of tubes including a main tube having one end merging into said reactor chamber and having another end merging at an outlet, and three secondary tubes being designated as first, second, and third secondary tubes, said main tube having four restrictions between which said three secondary tubes respectively merge with said main tube, said first secondary tube merging with said main tube nearest to said reactor chamber, wherein said first secondary tube and said third secondary tube transport said vector gases at respective flow rates of D 1 and D 3 , and wherein said second secondary tube transports said reacting gases at a flow rate of D 2 , such that said main tube guides said reacting gases to said reactor chamber when D 3 >D 1 and D 3 >D 2 , and said main tube guides said reacting gases to said outlet when D 1 >D 3 and D 1 >D 2 , wherein the first system of tubes provides a reacting gas of trimethyl gallium (TMG), the second system of tubes provides a reacting gas of trimethyl aluminum (TMA), and the third system of tubes provides a reacting gas of arsine (AsH3), and depositing on a substrate of gallium arsenide (GaAs) in said reactor chamber epitaxial crystalline layers of gallium aluminum arsenide (GaAlAs) and gallium arsenide (GaAs) from vapor phases by said vector gases and said reacting gases.

Claim 6

A method of manufacturing a semiconductor device comprising the steps of introducing vector gases of hydrogen or of a neutral gas and reacting gases into a reactor chamber by using three systems of tubes, each of said systems of tubes including a main tube having one end merging into said reactor chamber and having another end merging at an outlet, and three secondary tubes being designated as first, second, and third secondary tubes, said main tube having four restrictions between which said three secondary tubes respectively merge with said main tube, said first secondary tube merging with said main tube nearest to said reactor chamber, wherein said first secondary tube and said third secondary tube transport said vector gases at respective flow rates of D 1 and D 3 , and wherein said second secondary tube transports said reacting gases at a flow rate of D 2 , such that said main tube guides said reacting gases to said reactor chamber when D 3 >D 1 and D 3 >D 2 , and said main tube guides said reacting gases to said outlet when D 1 >D 3 and D 1 >D 2 , wherein the first system of tubes provides a reacting gas of trimethyl gallium (TMG), the second system of tubes provides a reacting gas of trimethyl aluminum (TMA), and the third system of tubes provides a reacting gas of arsine (AsH3), and depositing on a substrate of gallium arsenide (GaAs) in said reactor chamber epitaxial crystalline layers of gallium aluminum arsenide (GaAlAs) and gallium arsenide (GaAs) from vapor phases by said vector gases and said reacting gases.