Patent US4721855A successfully refreshed from Google Patents.
US4721855A
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Method and apparatus for rapid measurements of electrical signals at circuit nodes of integrated circuits in which noise signals are also detected
Assignee: Siemens AG
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Filing: 1984-07-19
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Granted: 1988-01-26
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Expires: 2004-07-19
Abstract
Abstract A method for measuring electrical signals according to a sampling principle with the assistance of an electron probe, whereby the signal is respectively repeatedly sampled in succession at different phase points, enables a fast registration of an electrical signal at a circuit node of an integrated circuit and simultaneously permits registration when at least one noise signal appears between two clock edges of a basic pulse rate of the integrated circuit. Between two successive phase points at which the signal is repeatedly sampled in succession for potential measurement, only a check is executed at phase points by sampling as to whether a noise signal exists in this intermediate region.
Inventors
- 👤 Peter Fazekas
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 23:04
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
88 words
A method for measuring electrical signals at a point within an integrated circuit, comprising the steps of: applying a pulse train at a basic pulse rate to the integrated circuit to cause potentials at a selected point within the integrated circuit; sampling the point with a pulse electron beam to cause emission of secondary electrons representing potential at the selected point; converting the secondary electron emission into a measured signal representing the signal at the selected point; and detecting signals appearing between two successive samples as noise signals.
Claim 2
Independent Claim
88 words
A method for measuring electrical signals at a point within an integrated circuit, comprising the steps of: applying a pulse train at a basic pulse rate to the integrated circuit to cause potentials at a selected point within the integrated circuit; sampling the point with a pulse electron beam to cause emission of secondary electrons representing potential at the selected point; converting the secondary electron emission into a measured signal representing the signal at the selected point; and detecting signals appearing between two successive samples as noise signals.
Claim 3
Dependent Claim
33 words
The method of claim 1, wherein the step of sampling is further defined as: pulsing the electron beam in synchronism with the leading and trailing edges of the pulses of the pulse train.
Claim 4
Dependent Claim
145 words
Apparatus for measuring electrical signals at a point within an integrated circuit, comprising: first means for energizing an integrated circuit with a pulse train having a basic pulse rate; second means for repetitively sampling the potentials at a selected point in said integrated, circuit and providing a corresponding first electrical signal containing a noise signal; a first circuit connected to said second means for summing the samples of said first electrical signal to provide a first output signal; and a second circuit connected to said first circuit and including a pair of edge-controlled flip-flops each including an edge-controlled input and respectively operable in response to increasing leading edges and decreasing trailing edges of said noise signal to produce respective output signals, and a logic circuit connected to each of said flip-flops for producing a second output signal representing noise appearing in said first electrical signal.
Claim 5
Dependent Claim
145 words
Apparatus for measuring electrical signals at a point within an integrated circuit, comprising: first means for energizing an integrated circuit with a pulse train having a basic pulse rate; second means for repetitively sampling the potentials at a selected point in said integrated, circuit and providing a corresponding first electrical signal containing a noise signal; a first circuit connected to said second means for summing the samples of said first electrical signal to provide a first output signal; and a second circuit connected to said first circuit and including a pair of edge-controlled flip-flops each including an edge-controlled input and respectively operable in response to increasing leading edges and decreasing trailing edges of said noise signal to produce respective output signals, and a logic circuit connected to each of said flip-flops for producing a second output signal representing noise appearing in said first electrical signal.
Claim 6
Dependent Claim
13 words
The apparatus of claim 3, wherein: said logic circuit comprises an AND gate.
Claim 7
Dependent Claim
22 words
The apparatus of claim 3, wherein: said second circuit comprises an amplifier connected between said second means and said pair of flip-flops.
Claim 8
Independent Claim
130 words
A method for measuring electrical signals at a point within an integrated circuit, comprising the steps of: applying a pulse train at a basic pulse rate to the integrated circuit to cause potentials at a selected point within the integrated circuit; sampling the point with a pulsed electron beam to cause emission of secondary electrons representing potential at the selected point by pulsing the electron beam in synchronism with the leading and trailing edges of the pulses of the pulse train; converting the secondary electron emission into a measured signal representing the signal at the selected point; and detecting signals appearing between two successive samples as noise signals by activating a noise signal indicator in response to at least two signal changes of the measured signal between two successive samplings.
Claim 9
Independent Claim
130 words
A method for measuring electrical signals at a point within an integrated circuit, comprising the steps of: applying a pulse train at a basic pulse rate to the integrated circuit to cause potentials at a selected point within the integrated circuit; sampling the point with a pulsed electron beam to cause emission of secondary electrons representing potential at the selected point by pulsing the electron beam in synchronism with the leading and trailing edges of the pulses of the pulse train; converting the secondary electron emission into a measured signal representing the signal at the selected point; and detecting signals appearing between two successive samples as noise signals by activating a noise signal indicator in response to at least two signal changes of the measured signal between two successive samplings.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-01-25 | 1991-07-27 | 1992-01-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-01-25 | 1995-07-27 | 1996-01-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-01-25 | 1999-07-27 | 2000-01-26 | $7700.00 | Window Closed / Lapsed |