Patent US4718767A successfully refreshed from Google Patents.
US4718767A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of inspecting the pattern on a photographic mask
Assignee: Nikon Corp
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Filing: 1984-10-02
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Granted: 1988-01-12
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Expires: 2004-10-02
Abstract
Abstract A method whereby the circuit pattern on a photographic mask or a reticle used in the manufacture of semiconductor devices is inspected for defects by an image processing technique. In this inspection method, the pattern of the mask is printed on a photosensitive member prepared by forming an opaque or semitransparent photosensitive layer on a transparent substrate and an image of the printed pattern formed on the photosensitive member is inspected by the image processing technique.
Inventors
- 👤 Junji Hazama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 23:21
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70483; G03F7/70605; G03F7/70616; G03F7/7065; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/308; G06; G06T; G06T7/00; G06T7/0002; G06T7/0004; G06T7/001; G06T2207/00; G06T2207/10; G06T2207/10056; G06T2207/30; G06T2207/30108; G06T2207/30148
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
226 words
A method of inspecting a pattern on a photomask or a reticle disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material having light transmittance lower than said substrate; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask or reticle for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said photosensitive layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) comparing said printed patterns with each other in relation to said defects and discriminating that the defects are caused by said photomask or reticle when said defects have been detected in common within said printed patterns.
Claim 2
Independent Claim
226 words
A method of inspecting a pattern on a photomask or a reticle disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material having light transmittance lower than said substrate; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask or reticle for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said photosensitive layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) comparing said printed patterns with each other in relation to said defects and discriminating that the defects are caused by said photomask or reticle when said defects have been detected in common within said printed patterns.
Claim 3
Dependent Claim
22 words
A method according to claim 1, wherein said exposure apparatus includes a projection optical system disposed between said first and second positions.
Claim 4
Dependent Claim
31 words
A method according to claim 1, wherein said detecting step includes the steps of generating design data corresponding to a design pattern and comparing said image signal with said design data.
Claim 5
Independent Claim
211 words
A method of inspecting a pattern on a photomask disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material having light transmittance lower than said substrate; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said photosensitive layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) copmparing said printed patterns with each other in relation to said defects and determining whether the defects are caused by said photomask or said photosensitive member.
Claim 6
Independent Claim
211 words
A method of inspecting a pattern on a photomask disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material having light transmittance lower than said substrate; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said photosensitive layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) copmparing said printed patterns with each other in relation to said defects and determining whether the defects are caused by said photomask or said photosensitive member.
Claim 7
Dependent Claim
22 words
A method according to claim 4, wherein said exposure apparatus includes a projection optical system disposed between said first and second positions.
Claim 8
Dependent Claim
31 words
A method according to claim 4, wherein said detecting step includes the steps of generating design data corresponding to a design pattern and comparing said image signal with said design data.
Claim 9
Independent Claim
248 words
A method of inspecting a pattern on a photomask or a reticle disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate, a light shielding layer of an opaque material formed on said substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material being formed on said light shielding layer; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask or reticle for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member, etching said light shielding layer of said photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said light shielding layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) comparing said printed patterns with each other in relation to said defects and discriminating that the defects are caused by said photomask or reticle when said defects have been detected in common within said printed patterns.
Claim 10
Independent Claim
248 words
A method of inspecting a pattern on a photomask or a reticle disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate, a light shielding layer of an opaque material formed on said substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material being formed on said light shielding layer; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask or reticle for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member, etching said light shielding layer of said photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said light shielding layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) comparing said printed patterns with each other in relation to said defects and discriminating that the defects are caused by said photomask or reticle when said defects have been detected in common within said printed patterns.
Claim 11
Independent Claim
233 words
A method of inspecting a pattern on a photomask disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate, a light shielding layer of an opaque material formed on said substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material being formed on said light shielding layer; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member, etching said light shielding layer of said photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said light shielding layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) comparing said printed patterns with each other in relation to said defects and determining whether the defects are caused by said photomask or said photosensitive member.
Claim 12
Independent Claim
233 words
A method of inspecting a pattern on a photomask disposed at a first position on an exposure apparatus used in the manufacture of semiconductor devices for printing the pattern onto a wafer disposed at a second position on said exposure apparatus, said method comprising the steps of: (a) providing a photosensitive member at said second position of said exposure apparatus instead of said wafer, said member being formed by a transparent substrate, a light shielding layer of an opaque material formed on said substrate and a photosensitive layer of a photosensitive material provided on said transparent substrate, said photosensitive material being formed on said light shielding layer; (b) successively exposing a plurality of different areas in said photosensitive member by using said exposure apparatus and said photomask for printing a plurality of identical patterns on said areas, respectively; (c) developing said exposed photosensitive member, etching said light shielding layer of said photosensitive member and forming on said photosensitive member printed patterns provided by said transparent substrate and said light shielding layer; (d) inspecting said developed photosensitive member in a transmitted illuminating light and generating an image signal corresponding to said printed patterns and detecting defects in said printed patterns in accordance with said image signal; and (e) comparing said printed patterns with each other in relation to said defects and determining whether the defects are caused by said photomask or said photosensitive member.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-01-11 | 1991-07-13 | 1992-01-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-01-11 | 1995-07-13 | 1996-01-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-01-11 | 1999-07-13 | 2000-01-12 | $7700.00 | Window Closed / Lapsed |