US4717449A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Dielectric barrier material
Assignee: Atmel Corp
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Filing: 1986-07-25
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Granted: 1988-01-05
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Expires: 2006-07-25
Abstract
Abstract Disclosed is a method of fabricating an integrated circuit. A substrate comprising a semiconductor material and having a first surface is provided. A first layer of metalization interconnects is formed on the first surface. A first thin film layer comprising a dielectric barrier material is deposited over the first layer of metalization interconnects. A second thin film layer comprising a dielectric passivating material is deposited over the first thin film layer of dielectric barrier material. A via having a width greater than the width of a metalization interconnect is then plasma etched in the dielectric passivating material using a first etch gas. The dielectric barrier material is then plasma etched using a second etch gas to remove the dielectric barrier material in the area of the via. A second layer of metalization interconnects is then formed, a metalization interconnect in each of the first and second layers of metalization interconnects being connected in the via.
Inventors
- 👤 David G. Erie
- 👤 Jon A. Roberts
- 👤 Eddie C. Lee
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 05:52
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/45; H10W20/48; H10W20/41; H10W20/42
Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
213 words
A method of fabricating an integrated circuit comprising: providing a substrate comprising a semiconductor material and having a first surface; forming a first layer of metalization interconnects over the first surface, each interconnect having a width; depositing a first thin film layer comprising a dielectric barrier material directly onto the first layer of metalization interconnects and portions of the first surface which are free of the first layer of metalization interconnects; depositing a second thin film layer comprising a dielectric passivating material directly onto the first thin film layer of dielectric barrier material; plasma etching part of a via through the dielectric passivating material to the dielectric barrier material using a first etch gas to thereby expose a portion of the dielectric barrier material but which portion is free of any substantial etching, the via to have an extent greater than the width of a metalization interconnect; plasma etching the exposed portion of the dielectric barrier material through to the first layer of metalization interconnects using a second etch gas to remove this exposed portion of the dielectric barrier material to thereby complete the via; and forming a second layer of metalization interconnects, a metalization interconnect from each of the first and second layers of metalization interconnects being electrically connected in the via.
Claim 2
Independent Claim
213 words
A method of fabricating an integrated circuit comprising: providing a substrate comprising a semiconductor material and having a first surface; forming a first layer of metalization interconnects over the first surface, each interconnect having a width; depositing a first thin film layer comprising a dielectric barrier material directly onto the first layer of metalization interconnects and portions of the first surface which are free of the first layer of metalization interconnects; depositing a second thin film layer comprising a dielectric passivating material directly onto the first thin film layer of dielectric barrier material; plasma etching part of a via through the dielectric passivating material to the dielectric barrier material using a first etch gas to thereby expose a portion of the dielectric barrier material but which portion is free of any substantial etching, the via to have an extent greater than the width of a metalization interconnect; plasma etching the exposed portion of the dielectric barrier material through to the first layer of metalization interconnects using a second etch gas to remove this exposed portion of the dielectric barrier material to thereby complete the via; and forming a second layer of metalization interconnects, a metalization interconnect from each of the first and second layers of metalization interconnects being electrically connected in the via.
Claim 3
Dependent Claim
33 words
The method of claim 1 wherein the dielectric passivating material has a high etch rate in the first etch gas, the dielectric barrier material not being appreciably affected by the first etch gas.
Claim 4
Dependent Claim
27 words
The method of claim 2 wherein the first thin film layer comprising a dielectric barrier material is formed to a thickness of approximately 500 angstroms or less.
Claim 5
Dependent Claim
30 words
The method of claim 3 wherein the via is etched in the dielectric passivating material so that the area of the via overlies more than one first level metalization interconnect.
Claim 6
Dependent Claim
28 words
The method of claim 4 wherein the dielectric barrier material comprises Ti x O y wherein x and y equal the relative amounts of Ti and O respectively.
Claim 7
Dependent Claim
14 words
The method of claim 5 wherein the dielectric passivating material comprises SiO 2 .
Claim 8
Dependent Claim
23 words
The method of claim 6 wherein a metalization interconnect in the second layer completely overlies a first layer metalization interconnect in the via.
Claim 9
Dependent Claim
24 words
The method of claim 7 wherein the depositing and plasma etching steps are repeated to form at least one additional layer of metalization interconnects.
Claim 10
Dependent Claim
27 words
The method of claim 1 wherein the first thin film layer comprising a dielectric barrier material is formed to a thickness of approximately 500 angstroms or less.
Claim 11
Dependent Claim
30 words
The method of claim 9 wherein the via is etched in the dielectric passivating material so that the area of the via overlies more than one first level metalization interconnect.
Claim 12
Dependent Claim
28 words
The method of claim 10 wherein the dielectric barrier material comprises Ti x O y wherein x and y equal the relative amounts of Ti and O respectively.
Claim 13
Dependent Claim
14 words
The method of claim 11 wherein the dielectric passivating material comprises SiO 2 .
Claim 14
Dependent Claim
23 words
The method of claim 12 wherein a metalization interconnect in the second layer completely overlies a first layer metalization interconnect in the via.
Claim 15
Dependent Claim
24 words
The method of claim 13 wherein the depositing and plasma etching steps are repeated to form at least one additional layer of metalization interconnects.
Claim 16
Dependent Claim
30 words
The method of claim 1 wherein the via is etched in the dielectric passivating material so that the area of the via overlies more than one first level metalization interconnect.
Claim 17
Dependent Claim
28 words
The method of claim 15 wherein the dielectric barrier material comprises Ti x O y wherein x and y equal the relative amounts of Ti and O respectively.
Claim 18
Dependent Claim
14 words
The method of claim 16 wherein the dielectric passivating material comprises SiO 2 .
Claim 19
Dependent Claim
23 words
The method of claim 17 wherein a metalization interconnect in the second layer completely overlies a first layer metalization interconnect in the via.
Claim 20
Dependent Claim
24 words
The method of claim 18 wherein the depositing and plasma etching steps are repeated to form at least one additional layer of metalization interconnects.
Claim 21
Dependent Claim
28 words
The method of claim 1 wherein the dielectric barrier material comprises Ti x O y wherein x and y equal the relative amounts of Ti and O respectively.
Claim 22
Dependent Claim
14 words
The method of claim 20 wherein the dielectric passivating material comprises SiO 2 .
Claim 23
Dependent Claim
23 words
The method of claim 21 wherein a metalization interconnect in the second layer completely overlies a first layer metalization interconnect in the via.
Claim 24
Dependent Claim
24 words
The method of claim 22 wherein the depositing and plasma etching steps are repeated to form at least one additional layer of metalization interconnects.
Claim 25
Dependent Claim
14 words
The method of claim 1 wherein the dielectric passivating material comprises SiO 2 .
Claim 26
Dependent Claim
23 words
The method of claim 24 wherein a metalization interconnect in the second layer completely overlies a first layer metalization interconnect in the via.
Claim 27
Dependent Claim
24 words
The method of claim 25 wherein the depositing and plasma etching steps are repeated to form at least one additional layer of metalization interconnects.
Claim 28
Dependent Claim
23 words
The method of claim 1 wherein a metalization interconnect in the second layer completely overlies a first layer metalization interconnect in the via.
Claim 29
Dependent Claim
24 words
The method of claim 27 wherein the depositing and plasma etching steps are repeated to form at least one additional layer of metalization interconnects.
Claim 30
Dependent Claim
24 words
The method of claim 1 wherein the depositing and plasma etching steps are repeated to form at least one additional layer of metalization interconnects.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-01-04 | 1991-07-06 | 1992-01-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-01-04 | 1995-07-06 | 1996-01-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-01-04 | 1999-07-06 | 2000-01-05 | $7700.00 | Window Closed / Lapsed |