Patent US4708766A successfully refreshed from Google Patents.
US4708766A
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Hydrogen iodide etch of tin oxide
Assignee: Texas Instruments Inc
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Filing: 1986-11-07
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Granted: 1987-11-24
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Expires: 2006-11-07
Abstract
Abstract Disclosed is a method for etching a tin oxide layer (18). The tin oxide layer (18) is masked by selectively forming an etchant-resistant material (20) on it. This material is itself patterned and etched, and then the exposed tin oxide (26) is isotropically etched such that substantially all of the exposed tin oxide (26) is removed. The preferred etchant of the invention comprises a major portion of inert nitrogen gas with a minor portion of hydrogen iodide. A vertical wall reactor (48) is provided for use with the invention in order to achieve a uniform flow and etch rate. In an alternate embodiment, a plasma reactor can be used to perform the etching.
Inventors
- 👤 Jaroslav Hynecek
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 14:01
CPC Classifications
C; C04; C04B; C04B41/00; C04B41/53; C04B41/5338; C04B41/5346; C04B41/80; C04B41/91; H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/15; H10F39/154; H10F71/00; H10F71/138; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; Y; Y02; Y02E; Y02E10/00; Y02E10/50
Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
50 words
A method for etching a tin oxide layer deposited on a surface, comprising the steps of: masking the tin oxide layer by selectively forming an etchant-resistant material thereon; and isotropically etching the tin oxide layer with a gas etchant, such that substantially all of the exposed tin oxide is removed.
Claim 2
Independent Claim
50 words
A method for etching a tin oxide layer deposited on a surface, comprising the steps of: masking the tin oxide layer by selectively forming an etchant-resistant material thereon; and isotropically etching the tin oxide layer with a gas etchant, such that substantially all of the exposed tin oxide is removed.
Claim 3
Dependent Claim
30 words
The method of claim 1, and further including the step of: forming the gas etchant from a major portion of an inert gas and a minor portion of hydrogen iodide.
Claim 4
Dependent Claim
22 words
The method of claim 2, wherein the molar ratio of hydrogen iodide gas to the inert gas is about 6.7×10 -4 .
Claim 5
Dependent Claim
11 words
The method of claim 3, wherein the inert gas is nitrogen.
Claim 6
Dependent Claim
40 words
The method of claim 2, and further comprising the steps of: ionizing the gas etchant to create an etchant plasma; and subjecting the tin oxide layer to the etchant plasma at a preselected pressure ranging between 0.1 and 1 torr.
Claim 7
Dependent Claim
19 words
The method of claim 1, wherein the etchant-resistant material is selected from silicon nitride, polysilicon, alumina, or silicon dioxide.
Claim 8
Dependent Claim
12 words
The method of claim 6, wherein the etchant-resistant material is silicon dioxide.
Claim 9
Dependent Claim
34 words
The method of claim 1, and further including the step of etching the tin oxide with the gas etchant at substantially atmospheric pressure and a temperature ranging from 144.5° C. to about 450° C.
Claim 10
Dependent Claim
17 words
The method of claim 8, wherein the temperature ranges from about 200° C. to about 400° C.
Claim 11
Independent Claim
70 words
A method for forming a tin oxide structure on a surface of a semiconductor chip, comprising the steps of: depositing a tin oxide layer on the surface; depositing a hydrogen iodide-resistant layer on the tin oxide layer; patterning and etching the hydrogen iodide-resistant layer to form a mask for the tin oxide layer; and etching the tin oxide layer with a gas etchant having an active component comprising hydrogen iodide.
Claim 12
Independent Claim
70 words
A method for forming a tin oxide structure on a surface of a semiconductor chip, comprising the steps of: depositing a tin oxide layer on the surface; depositing a hydrogen iodide-resistant layer on the tin oxide layer; patterning and etching the hydrogen iodide-resistant layer to form a mask for the tin oxide layer; and etching the tin oxide layer with a gas etchant having an active component comprising hydrogen iodide.
Claim 13
Dependent Claim
28 words
The method of claim 10, wherein the hydrogen iodide-resistant layer comprises a material selected from the group consisting of silicon nitride, polysilicon, alumina, silicon dioxide, and combinations thereof.
Claim 14
Dependent Claim
13 words
The method of claim 11, wherein the hydrogen iodide-resistant layer comprises silicon dioxide.
Claim 15
Dependent Claim
76 words
The method of claim 10, and further including the steps of: forming a member on the surface with substantially vertical sidewalls prior to depositing the tin oxide layer; depositing the tin oxide layer on the surface such that said layer covers the sidewalls; masking the tin oxide layer to expose unmasked areas thereof; and isotropically etching the tin oxide layer with the gas etchant to remove the tin oxide from the sidewalls in the exposed areas.
Claim 16
Dependent Claim
109 words
The method of claim 10, and further including the steps of: forming a member on the surface prior to depositing the tin oxide layer; undercutting the member to form at least one undercut region adjacent a lower portion of the member disposed between an upper portion thereof and the surface; and depositing the tin oxide layer on the surface and on the member such that the tin oxide at least partly occupies the undercut region; masking the tin oxide layer to expose unmasked areas thereof; and isotropically etching the tin oxide layer with the gas etchant to remove the tin oxide in the undercut region in the unmasked areas.
Claim 17
Dependent Claim
26 words
The method of claim 10, and further including the step of etching the tin oxide layer at a rate of about 2,000 angstroms in three minutes.
Claim 18
Dependent Claim
67 words
The method of claim 10, and further including the steps of: disposing the surface in an etching chamber after the step of patterning and etching the hydrogen iodide-resistant layer; forming the gas etchant from a major portion of inert gas and a minor portion of hydrogen iodide, and flowing the gas etchant through an etching chamber at a rate of about 30 liters per minute per liter.
Claim 19
Dependent Claim
28 words
The method of claim 16, and further including the step of mixing the hydrogen iodide and the inert gas in a molar ratio of about 6.7×10 -4 .
Claim 20
Dependent Claim
23 words
The method of claim 16, and further including the step of flowing the gas etchant into the etching chamber at approximately atmospheric pressure.
Claim 21
Dependent Claim
22 words
A composition for etching tin oxide, comprising: a minor proportion of hydrogen iodide gas; and a major proportion of an inert gas.
Claim 22
Dependent Claim
22 words
A composition for etching tin oxide, comprising: a minor proportion of hydrogen iodide gas; and a major proportion of an inert gas.
Claim 23
Dependent Claim
11 words
The composition of claim 19, wherein said inert gas comprises nitrogen.
Claim 24
Dependent Claim
24 words
The composition of claim 20, wherein said minor proportion and said major proportion are mixed in a molar ratio of about 6.7×10 -4 .
Claim 25
Dependent Claim
98 words
Apparatus for selectively etching a tin oxide layer on a semiconductor wafer, comprising: a vessel having an interior for holding at least one semiconductor wafer to be etched; a source of hydrogen iodide gas; a source of an inert gas; a mixer for mixing said hydrogen iodide gas and said inert gas to form a gas etchant; means for flowing the gas etchant from the mixer into the interior; and a temperature controller for regulating the temperature of the interior to between about 144° C. and about 450° C., such that the tin oxide layer is isotropically etched.
Claim 26
Dependent Claim
98 words
Apparatus for selectively etching a tin oxide layer on a semiconductor wafer, comprising: a vessel having an interior for holding at least one semiconductor wafer to be etched; a source of hydrogen iodide gas; a source of an inert gas; a mixer for mixing said hydrogen iodide gas and said inert gas to form a gas etchant; means for flowing the gas etchant from the mixer into the interior; and a temperature controller for regulating the temperature of the interior to between about 144° C. and about 450° C., such that the tin oxide layer is isotropically etched.
Claim 27
Dependent Claim
30 words
The apparatus of claim 21, wherein said vessel has a top portion, said means for flowing the gas etchant into the interior comprising an inlet disposed in said top portion.
Claim 28
Dependent Claim
37 words
The apparatus of claim 21, wherein said means for flowing the gas etchant into the interior includes an inlet communicating through said vessel into said interior, a disperser for dispersing said gas etchant disposed across said inlet.
Claim 29
Dependent Claim
13 words
The apparatus of claim 23, wherein said disperser comprises a ceramic frit disperser.
Claim 30
Dependent Claim
48 words
The apparatus of claim 21, and further comprising: an ionizer disposed within said vessel for creating an etchant plasma from said gas etchant; and an evacuator coupled to said vessel for maintaining a pressure in said vessel selected from a range of about 0.1 to about 1 torr.
References Cited (Backward Citations)
US3095341A
Cited
US3366520A
Cited
US3757733A
Cited
US4292384A
Cited
US4140814A
Cited
US4280141A
Cited
US4336295A
Cited
US4544444A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1990-11-23 | 1991-05-25 | 1991-11-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-11-23 | 1995-05-25 | 1995-11-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-11-23 | 1999-05-25 | 1999-11-24 | $7700.00 | Window Closed / Lapsed |