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US4707210A Expired / Lapsed US ⏱️ 0.0 years remaining

Plasma CVD apparatus

Assignee: Canon Inc
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Filing: 1986-04-28
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Granted: 1987-11-17
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Expires: 2006-04-28
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Abstract

Abstract A plasma chemical vapor deposition apparatus comprises internal construction members comprising aluminum having surfaces exposed to a plasma atmosphere.

Inventors

  • 👤 Teruo Misumi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 13:09
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/44; C23C16/50; C23C16/505; C23C16/509; C23C16/5093; C23C16/4401

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 178 words
A plasma CVD apparatus comprising a vacuum chamber for forming and for etching a deposition film containing silicon on a cylindrical substrate to be treated, a gas introducing means for introducing a fluorine compound gas and a gas for forming a deposition film into the vacuum chamber, a gas discharging means for discharging the gases in the vacuum chamber, a leaking means for returning pressure in the vacuum chamber to atmospheric pressure, a high frequency-introducing means for introducing to the vacuum chamber high frequency energy for generating a plasma atmosphere of the fluorine compound gas for etching and for generating a plasma atmosphere of the gas for forming the deposition film, a high frequency power source for supplying the high frequency energy to the high frequency introducing means, a supporting means for supporting the cylindrical substrate to be treated, and a heating means for heating from the inside the cylindrical substrate to be treated, wherein the surface of the walls of the vacuum chamber and the high frequency-introducing means to be exposed to the plasma atmospheres are aluminum.
Claim 2
Dependent Claim 178 words
A plasma CVD apparatus comprising a vacuum chamber for forming and for etching a deposition film containing silicon on a cylindrical substrate to be treated, a gas introducing means for introducing a fluorine compound gas and a gas for forming a deposition film into the vacuum chamber, a gas discharging means for discharging the gases in the vacuum chamber, a leaking means for returning pressure in the vacuum chamber to atmospheric pressure, a high frequency-introducing means for introducing to the vacuum chamber high frequency energy for generating a plasma atmosphere of the fluorine compound gas for etching and for generating a plasma atmosphere of the gas for forming the deposition film, a high frequency power source for supplying the high frequency energy to the high frequency introducing means, a supporting means for supporting the cylindrical substrate to be treated, and a heating means for heating from the inside the cylindrical substrate to be treated, wherein the surface of the walls of the vacuum chamber and the high frequency-introducing means to be exposed to the plasma atmospheres are aluminum.

References Cited (Backward Citations)

US4149923A Cited
US4226208A Cited
US4230515A Cited
US4392452A Cited
US4380489A Cited
US4466380A Cited
US4483737A Cited
US4483737B1 Cited
US4526644A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-11-16 1991-05-18 1991-11-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-11-16 1995-05-18 1995-11-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-11-16 1999-05-18 1999-11-17 $7700.00 Window Closed / Lapsed

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