Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips

Claim 1

Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips, said apparatus comprising means forming at least one said channel, through which the components are supplied in a row, a separating arrangement for separating the components which have been supplied from the feed channel, a testing arrangement for testing the separated components, a detecting arrangement positioned between the separating arrangement and the testing arrangement for detection of the separated components which move past, and a sorting arrangement for the components which have been tested, said sorting arrangement being connected to the testing arrangement, characterized in that the said separating arrangement comprises a belt conveyer positioned above a slideway for the components said belt conveyor being arranged to take hold of the components which have been supplied and push them forward on the sideway, and said slideway being inclined in such a way that the separated components, after release by the belt conveyor, automatically move away from the belt conveyer and toward said testing arrangement by gravitational force, and said detecting arrangement being arranged to stop the belt conveyer in response to separation of each component therefrom.