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US4694527A Expired / Lapsed US ⏱️ 0.0 years remaining

Mask washing apparatus for production of integrated circuit

Assignee: Fujitsu Ltd
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Filing: 1984-07-03
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Granted: 1987-09-22
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Expires: 2004-07-03
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Abstract

Abstract This invention relates to a mask (reticle) washing apparatus for use in the production of semiconductor integrated circuits (IC), and in particular, to cleaning a mask without the use of a strong oxidizing agent or a strong alkaline agent. The mask washing apparatus comprises an airtight chamber including a washing space and a drying space which are separated by a shutter. A drain and an exhaust duct are located at the bottom of the chamber. The washing is performed at a lower part of the chamber and the drying is performed at an upper part of the chamber. A clean air stream flows from the upper part to the lower part of the chamber, and this flow eliminates contamination in the chamber. Consequently, the mask is cleaned perfectly, and the reliability and yield of the device is improved.

Inventors

  • 👤 Takeshi Yoshizawa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 23:10
CPC Classifications
B; B65; B65D; B65D35/00; G; G03; G03F; G03F1/00; G03F1/68; G03F1/82; B08; B08B; B08B11/00; Y; Y10; Y10S; Y10S134/00; Y10S134/902

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 407 words
A mask washing apparatus for fabricating semiconductor devices comprising: a vertical, airtight chamber comprising a washing space for washing the mask and a drying space for drying said mask, wherein said drying space is positioned at an upper part of said chamber, and said washing space is positioned at a lower part of said chamber; a first shutter means located on the top of said chamber, wherein said first shutter means is closed during the washing process and the drying process and is opened during the loading or unloading of said mask; a second shutter means located between said drying space and said washing space, wherein said second shutter means is closed during said washing process, and is opened during said drying process; a drain and exhaust duct means, positioned at the bottom of said chamber, for exhausting gas and water from said chamber; a gas jet type drying means for drying said mask, said drying means being positioned below said first shutter means, and emitting a flat jet flow of gas downward on both sides of the substrate to be dried, wherein said gas jet type drying means includes at least two flat nozzles positioned on either side of the substrate to be dried, wherein the upper sides of said flat nozzles are provided with cover plates extending downward close to the surface of said substrate, and is inclined to the surface of said substrate at an angle of 50° to 60°, the lower sides of said flat nozzles and said cover plates providing an orifice therebetween to provide the flat gas flow; air flow means positioned underneath said gas jet type drying means for providing clean air flow beneath said drying means and towards the surface of the substrate to be dried, said air flow means including an air inlet means for taking in air into said airtight chamber, filter means for filterining the intake air, and a fan means for forming a stream of clean air, wherein said air flow means prevents dust or water mist from being dragged into said gas jet type dryer means; and washing means, positioned in said washing space for washing the mask, wherein an air stream flowing from the top to the bottom of said chamber is produced during the washing process and the drying process, said air stream flow preventing washed out dust or water mist from the cleaned surface of the washed substrate from being recycled.
Claim 2
Dependent Claim 407 words
A mask washing apparatus for fabricating semiconductor devices comprising: a vertical, airtight chamber comprising a washing space for washing the mask and a drying space for drying said mask, wherein said drying space is positioned at an upper part of said chamber, and said washing space is positioned at a lower part of said chamber; a first shutter means located on the top of said chamber, wherein said first shutter means is closed during the washing process and the drying process and is opened during the loading or unloading of said mask; a second shutter means located between said drying space and said washing space, wherein said second shutter means is closed during said washing process, and is opened during said drying process; a drain and exhaust duct means, positioned at the bottom of said chamber, for exhausting gas and water from said chamber; a gas jet type drying means for drying said mask, said drying means being positioned below said first shutter means, and emitting a flat jet flow of gas downward on both sides of the substrate to be dried, wherein said gas jet type drying means includes at least two flat nozzles positioned on either side of the substrate to be dried, wherein the upper sides of said flat nozzles are provided with cover plates extending downward close to the surface of said substrate, and is inclined to the surface of said substrate at an angle of 50° to 60°, the lower sides of said flat nozzles and said cover plates providing an orifice therebetween to provide the flat gas flow; air flow means positioned underneath said gas jet type drying means for providing clean air flow beneath said drying means and towards the surface of the substrate to be dried, said air flow means including an air inlet means for taking in air into said airtight chamber, filter means for filterining the intake air, and a fan means for forming a stream of clean air, wherein said air flow means prevents dust or water mist from being dragged into said gas jet type dryer means; and washing means, positioned in said washing space for washing the mask, wherein an air stream flowing from the top to the bottom of said chamber is produced during the washing process and the drying process, said air stream flow preventing washed out dust or water mist from the cleaned surface of the washed substrate from being recycled.
Claim 3
Dependent Claim 26 words
A mask washing apparatus according to claim 1, wherein said air intake means further comprises a micro air filter for filtering the air outside said chamber.
Claim 4
Dependent Claim 27 words
A mask washing apparatus according to claim 1, wherein said drain and exhaust duct means comprises an exhaust and drain duct and an exhaust fan connected thereto.
Claim 5
Dependent Claim 53 words
A mask washing apparatus according to claim 1, wherein said washing space further comprises: a jet washing means for emitting a jet stream of distilled water on both sides of the mask; a scrub washing means for scrubbing the surface of the mask; and a cleaning means for washing the mask with cleanser.
Claim 6
Dependent Claim 44 words
A mask washing apparatus according to claim 1, further including: (a) inserting means for inserting the mask into said chamber; and (b) moving means for moving the mask through the chamber, said moving means being movable between the top and bottom of said chamber.
Claim 7
Dependent Claim 68 words
A mask washing apparatus according to claim 1, wherein each of said nozzles comprises: a nozzle body having a cavity connected to a gas supply means, the tip of said nozzle body being oriented diagonally across said nozzle; wherein said cover plate is fixed to the diagonal section of said nozzle body; and wherein said flat gas flow has a width wider than the width of the mask.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-09-21 1991-03-23 1991-09-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-09-21 1995-03-23 1995-09-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-09-21 1999-03-23 1999-09-22 $7700.00 Window Closed / Lapsed

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