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US4680471A Expired / Lapsed US ⏱️ 0.0 years remaining

Integrated circuit packaging

Assignee: Motorola Solutions Inc
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Filing: 1985-03-20
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Granted: 1987-07-14
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Expires: 2005-03-20
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Abstract

Abstract An integrated circuit comprising: a semiconductor die having an integrated circuit formed therein; a package for supporting the die and for providing electrical contact thereto, the radiation properties of the package having been characterized as follows: fabricating a detector using a semiconductor fabrication technique, the detector having substantially the same dimensions as an integrated circuit to be packaged in the packaging materia; packaging the detector using integrated circuit packaging techniques; and measuring the radiation environment of the detector.

Inventors

  • 👤 Steven L. Morris
  • 👤 Gary C. Lewis

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 12:32
CPC Classifications
H; H10; H10F; H10F77/00; H10F77/50; H10F30/00; H10F30/20; H10F30/29; H10W; H10W42/00; H10W42/20; H10W42/25

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 88 words
A method for fabricating an integrated circuit comprising: fabricating a semiconductor die having an integrated circuit formed therein: assembling the die into a package of a packaging material, the radiation properties of which have been characterized as follows: fabricating a means for detecting radiation using a semiconductor fabrication technique; packaging the means for detecting radiation into said package of said packaging material using integrated circuit packaging techniques; and measuring the radiation emitted by said package of the packaging material by said means for detecting radiation within the package.
Claim 2
Independent Claim 88 words
A method for fabricating an integrated circuit comprising: fabricating a semiconductor die having an integrated circuit formed therein: assembling the die into a package of a packaging material, the radiation properties of which have been characterized as follows: fabricating a means for detecting radiation using a semiconductor fabrication technique; packaging the means for detecting radiation into said package of said packaging material using integrated circuit packaging techniques; and measuring the radiation emitted by said package of the packaging material by said means for detecting radiation within the package.
Claim 3
Dependent Claim 33 words
A method as set forth in claim 1 wherein the means for detecting radiation has substantially the same dimensions as an integrated circuit to be packaged in the package of the packaging material.
Claim 4
Dependent Claim 37 words
A method as set forth in claim 1 wherein the means for detecting radiation has substantially the same dimensions as a critical portion of an integrated circuit to be packaged in the package of the packaging material.
Claim 5
Dependent Claim 37 words
A method as set forth in claim 1 wherein the dimensions of the means for detecting radiation are proportional to a critical portion of an integrated circuit to be packaged in the package of the packaging material.
Claim 6
Dependent Claim 85 words
An integrated circuit comprising: a semiconductor die having an integrated circuit formed therein; a package of a packaging material for supporting the die and for providing electrical contact thereto, the radiation properties of the package having been characterized as follows: fabricating a means for detecting radiation using a semiconductor fabrication technique; packaging the means for detecting radiation in said package of said packaging material; and measuring the radiation emitted by said package of the packaging material by said means for detecting radiation within the package.
Claim 7
Dependent Claim 85 words
An integrated circuit comprising: a semiconductor die having an integrated circuit formed therein; a package of a packaging material for supporting the die and for providing electrical contact thereto, the radiation properties of the package having been characterized as follows: fabricating a means for detecting radiation using a semiconductor fabrication technique; packaging the means for detecting radiation in said package of said packaging material; and measuring the radiation emitted by said package of the packaging material by said means for detecting radiation within the package.
Claim 8
Dependent Claim 33 words
A circuit as set forth in claim 5 wherein the means for detecting radiation has substantially the same dimensions as an integrated circuit to be packaged in said package of the packaging material.
Claim 9
Dependent Claim 37 words
A circuit as set forth in claim 5 wherein the means for detecting radiation has substantially the same dimensions as a critical portion of an integrated circuit to be packaged in said package of the packaging material.
Claim 10
Dependent Claim 37 words
A circuit as set forth in claim 5 wherein the dimensions of the means for detecting radiation are proportional to a critical portion of an integrated circuit to be packaged in said package of the packaging material.
Claim 11
Independent Claim 54 words
A method for determining the radiation properties of an integrated circuit package comprising: fabricating a means for detecting radiation using a semiconductor fabrication technique; packaging the means for detecting radiation in said package; and measuring the radiation emitted by said package of the packaging material by said means for detecting radiation within the package.
Claim 12
Independent Claim 54 words
A method for determining the radiation properties of an integrated circuit package comprising: fabricating a means for detecting radiation using a semiconductor fabrication technique; packaging the means for detecting radiation in said package; and measuring the radiation emitted by said package of the packaging material by said means for detecting radiation within the package.

References Cited (Backward Citations)

US3609478A Cited
GB2080026A Cited
US4423548A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-07-13 1991-01-12 1991-07-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-07-13 1995-01-12 1995-07-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-07-13 1999-01-12 1999-07-14 $7700.00 Window Closed / Lapsed

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