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US4667330A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory device

Assignee: Oki Electric Industry Co Ltd
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Filing: 1986-09-02
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Granted: 1987-05-19
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Expires: 2006-09-02
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Abstract

Abstract A semiconductor memory chip which has not only a memory array together with address decoding means, but also a self diagnosis means which functions to indicate a defective cell of said memory array has been found. Said self diagnosis means is mounted on the same chip as that of the memory array, and has means for storing information to be stored in the memory array, and means for comparing content of said storing means with output information which is read out of the address at which the information is stored. When the two data do not coincide with each other, an error signal indicating a defective cell in the memory array at the selected address is output.

Inventors

  • 👤 Yutaka Kumagai

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 10:40
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/04; G11C29/08; G11C29/12

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 252 words
A semiconductor memory device comprising: a semiconductor memory array having a plurality of memory cells arranged in a matrix for storing data in response to an external write enable signal; a data line coupled with said memory array through switching means which transfers data on said data line to and from said memory array; a data input circuit coupled with said data line for writing information in a selected memory cell in said memory array; a data output circuit coupled with said data line for coupling information read out of a selected memory cell to an output; such that said data line is utilized for both writing information into said array during a memory write cycle, and reading information from said array during a memory read cycle; wherein the improvement comprises; a self-diagnosis means also coupled with said data line and having a storage means for storing during an early portion of said write cycle the data on said data line which is also stored in a selected memory cell of said memory array; and a comparison means for comparing, after the data is no longer applied to said memory cell and during a later portion of said write cycle, data out of said selected memory cell with the data that was stored in said storage means during said early portion of said write cycle; whereby when said data for the selected memory cell does not coincide with the data stored in said storage means, said self-diagnosis means provides an error signal.
Claim 2
Dependent Claim 252 words
A semiconductor memory device comprising: a semiconductor memory array having a plurality of memory cells arranged in a matrix for storing data in response to an external write enable signal; a data line coupled with said memory array through switching means which transfers data on said data line to and from said memory array; a data input circuit coupled with said data line for writing information in a selected memory cell in said memory array; a data output circuit coupled with said data line for coupling information read out of a selected memory cell to an output; such that said data line is utilized for both writing information into said array during a memory write cycle, and reading information from said array during a memory read cycle; wherein the improvement comprises; a self-diagnosis means also coupled with said data line and having a storage means for storing during an early portion of said write cycle the data on said data line which is also stored in a selected memory cell of said memory array; and a comparison means for comparing, after the data is no longer applied to said memory cell and during a later portion of said write cycle, data out of said selected memory cell with the data that was stored in said storage means during said early portion of said write cycle; whereby when said data for the selected memory cell does not coincide with the data stored in said storage means, said self-diagnosis means provides an error signal.
Claim 3
Dependent Claim 17 words
A semiconductor memory device according to claim 1, wherein said self diagnosis means comprises an associative memory.

References Cited (Backward Citations)

US3096511A Cited
US3768071A Cited
US3940601A Cited
US3924181A Cited
US4045779A Cited
US4320509A Cited
US4363125A Cited
US4365332A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-05-18 1990-11-17 1991-05-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-05-18 1994-11-17 1995-05-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-05-18 1998-11-17 1999-05-19 $7700.00 Window Closed / Lapsed

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