Etch process monitors for buried heterostructures

Claim 1

A method for in-process monitoring of etching of hourglass shaped mesas for components such as buried heterostructure laser/amplifiers, the steps comprising: providing a starting wafer of crystalline material which has been correctly oriented and on which it is desired to fabricate active or passive integrated optical components requiring stripe mesas; applying, exposing and developing a photo resist pattern on the surface of said wafer to form a stripe defining mask, to be used in the formation of a stripe mesa, said stripe having [110] direction orientation on a (100) surface, the stripe defining mask being of a predetermined width, said pattern also including a plurality of graduated width short stripe defining masks, to be used in the formation of monitor mesas, parallel to said stripe defining mask, the width of each of said successive short stripes being slightly less than the width of the preceding short stripe, the width of the widest short stripe being equal to or slightly less than said predetermined width; etching the entire pattern to simultaneously form the stripe mesa and the monitor mesas on said wafer, said etching continuing until at least one of the monitor mesas has been etched through and fallen off, said mesas all etching in an hourglass shape.

Claim 2

A method for in-process monitoring of etching of hourglass shaped mesas for components such as buried heterostructure laser/amplifiers, the steps comprising: providing a starting wafer of crystalline material which has been correctly oriented and on which it is desired to fabricate active or passive integrated optical components requiring stripe mesas; applying, exposing and developing a photo resist pattern on the surface of said wafer to form a stripe defining mask, to be used in the formation of a stripe mesa, said stripe having [110] direction orientation on a (100) surface, the stripe defining mask being of a predetermined width, said pattern also including a plurality of graduated width short stripe defining masks, to be used in the formation of monitor mesas, parallel to said stripe defining mask, the width of each of said successive short stripes being slightly less than the width of the preceding short stripe, the width of the widest short stripe being equal to or slightly less than said predetermined width; etching the entire pattern to simultaneously form the stripe mesa and the monitor mesas on said wafer, said etching continuing until at least one of the monitor mesas has been etched through and fallen off, said mesas all etching in an hourglass shape.

Claim 7

A method for in-process detection of etch progression of buried heterostructure laser/amplifier mesas, the method steps comprising: preparing a GaAs-AlGaAs wafer structure of multilayer epitaxial layers grown on a GaAs substrate and in which epitaxial layers are to be fabricated the buried heterostructure laser/amplifier devices; coating photoresist to the surface of the multilayer wafer structure; patterning the photoresist for etching laser stripes, to be used in the formation of stripe mesas, said pattern having [110] direction orientation on a (100) surface, the laser stripe defining pattern being of a predetermined width, said patterning also including a plurality of graduated and diminishing width short stripe defining patterns to be used in the formation of monitor mesas, the width of each of said successive short stripes being slightly narrower than the width of the adjacent short stripe; etching the entire pattern to simultaneously form the stripe mesa and the monitor mesas on said wafer, said etching continuing until at least one of the monitor mesas has been etched through and fallen off, said mesas all etching in an hourglass shape.

Claim 8

A method for in-process detection of etch progression of buried heterostructure laser/amplifier mesas, the method steps comprising: preparing a GaAs-AlGaAs wafer structure of multilayer epitaxial layers grown on a GaAs substrate and in which epitaxial layers are to be fabricated the buried heterostructure laser/amplifier devices; coating photoresist to the surface of the multilayer wafer structure; patterning the photoresist for etching laser stripes, to be used in the formation of stripe mesas, said pattern having [110] direction orientation on a (100) surface, the laser stripe defining pattern being of a predetermined width, said patterning also including a plurality of graduated and diminishing width short stripe defining patterns to be used in the formation of monitor mesas, the width of each of said successive short stripes being slightly narrower than the width of the adjacent short stripe; etching the entire pattern to simultaneously form the stripe mesa and the monitor mesas on said wafer, said etching continuing until at least one of the monitor mesas has been etched through and fallen off, said mesas all etching in an hourglass shape.

Claim 11

A method for end-point monitoring of etching of mesas for buried heterostructure laser/amplifiers, the steps comprising: providing a GaAs-AlGaAs structure of a GaAs substrate having multilayer epitaxial layers formed thereon and on which structure it is desired to fabricate buried heterostructure laser/amplifier devices; applying, exposing and developing a photoresist pattern on the structure of said multilayers to form a laser stripe defining mask, to be used in the formation of a stripe mesa, said pattern having [110] direction orientation on a (100) surface, the stripe defining mask being of a predetermined width, said pattern also including a plurality of graduated width short stripe defining masks parallel to said laser stripe to be used in the formation of monitor mesas, the width of each of said successive short stripes being slightly less than the width of the preceding short stripe, the width of the widest being equal to or slightly less than said predetermined width; etching the entire pattern to simultaneously form the stripe mesa and the monitor mesas in said epitaxial layers, said etching continuing until at least one of the monitor mesas has been etched through and fallen off, said mesas all etching in an hourglass shape.

Claim 12

A method for end-point monitoring of etching of mesas for buried heterostructure laser/amplifiers, the steps comprising: providing a GaAs-AlGaAs structure of a GaAs substrate having multilayer epitaxial layers formed thereon and on which structure it is desired to fabricate buried heterostructure laser/amplifier devices; applying, exposing and developing a photoresist pattern on the structure of said multilayers to form a laser stripe defining mask, to be used in the formation of a stripe mesa, said pattern having [110] direction orientation on a (100) surface, the stripe defining mask being of a predetermined width, said pattern also including a plurality of graduated width short stripe defining masks parallel to said laser stripe to be used in the formation of monitor mesas, the width of each of said successive short stripes being slightly less than the width of the preceding short stripe, the width of the widest being equal to or slightly less than said predetermined width; etching the entire pattern to simultaneously form the stripe mesa and the monitor mesas in said epitaxial layers, said etching continuing until at least one of the monitor mesas has been etched through and fallen off, said mesas all etching in an hourglass shape.