US4648938A
Expired / Lapsed
US
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Composition/bandgap selective dry photochemical etching of semiconductor materials
Assignee: United States Department of Energy
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Filing: 1985-10-11
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Granted: 1987-03-10
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Expires: 2005-10-11
Abstract
Abstract A method of selectively photochemically dry etching a first semiconductor material of a given composition and direct bandgap Eg1 in the presence of a second semiconductor material of a different composition and direct bandgap Eg2, wherein Eg2>Eg1, said second semiconductor material substantially not being etched during said method, comprises subjecting both materials to the same photon flux and to the same gaseous etchant under conditions where said etchant would be ineffective for chemical etching of either material were the photons not present, said photons being of an energy greater than Eg1 but less than Eg2, whereby said first semiconductor material is photochemically etched and said second material is substantially not etched.
Inventors
- 👤 Carol I. H. Ashby
- 👤 James L. Dishman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 06:02
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/246; H10P34/00; H10P34/40; H10P34/42
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
121 words
A method of selectively photochemically dry etching a first semiconductor material of a given composition and direct bandgap Eg 1 in the presence of a second semiconductor material of a different composition and direct bandgap Eg 2 , wherein Eg 2 >Eg 1 , said second semiconductor material substantially not being etched during said method, comprising subjecting both materials to the same photon flux and to the same gaseous etchant under conditions where said etchant would be ineffective for chemical etching of either material were the photons not present, said photons being of an energy greater than Eg 1 but less than Eg 2 , whereby said first semiconductor material is photochemically etched and said second material is substantially not etched.
Claim 2
Independent Claim
121 words
A method of selectively photochemically dry etching a first semiconductor material of a given composition and direct bandgap Eg 1 in the presence of a second semiconductor material of a different composition and direct bandgap Eg 2 , wherein Eg 2 >Eg 1 , said second semiconductor material substantially not being etched during said method, comprising subjecting both materials to the same photon flux and to the same gaseous etchant under conditions where said etchant would be ineffective for chemical etching of either material were the photons not present, said photons being of an energy greater than Eg 1 but less than Eg 2 , whereby said first semiconductor material is photochemically etched and said second material is substantially not etched.
Claim 3
Dependent Claim
15 words
A method of claim 1 wherein said semiconductor materials are binary, ternary or quaternary materials.
Claim 4
Dependent Claim
27 words
A method of claim 2 wherein said semiconductor materials are composed of the same III-V elements but differ in the relative amounts of at least two elements.
Claim 5
Dependent Claim
47 words
A method of claim 3 wherein said semiconductor materials are both in one of the families of Al 1-x Ga x As/GaAs, Al 1-x Ga x As, GaAs 1-x P x /GaAs, GaAs 1-x P x /GaP, GaAs 1-x P x or In 1-x Ga x As.
Claim 6
Dependent Claim
16 words
A method of claim 4 wherein both semiconductors are in the GaAs 1-x P x family.
Claim 7
Dependent Claim
15 words
A method of claim 3 wherein the etchant is a Cl.sup.. /Cl - containing gas.
Claim 8
Dependent Claim
16 words
A method of claim 1 wherein said semiconductor materials are subjected to an applied bias voltage.
Claim 9
Dependent Claim
16 words
A method of claim 1 wherein said semiconductor materials are part of a strained layer superlattice.
Claim 10
Dependent Claim
15 words
A method of claim 1 wherein said photon flux is irradiated in an imaged pattern.
Claim 11
Dependent Claim
16 words
A method of claim 1 wherein said semiconductor substrates are part of the same semiconductor device.
Claim 12
Dependent Claim
14 words
A method of claim 1 wherein the photon flux is provided by a laser.
Claim 13
Dependent Claim
20 words
A method of claim 1 wherein Eg 2 is greater than Eg 1 by a factor of 100 or more.
Claim 14
Dependent Claim
20 words
A method of claim 1 wherein Eg 2 is greater than Eg 1 by a factor of 10 or more.
Claim 15
Dependent Claim
11 words
A method of claim 1 wherein the semiconductor materials are ternary.
Claim 16
Independent Claim
124 words
A method of selectively photochemically dry etching a first semiconductor material of a given composition and direct bandgap Eg 1 in the presence of a second semiconductor material of a different composition and direct bandgap Eg 2 , wherein Eg 2 >Eg 1 , said second semiconductor material substantially not being etched during said method, comprising subjecting both materials to the same photon flux and to the same gaseous etchant under conditions where said etchant would be ineffective for chemical etching were the photons not present, the absorption coefficient of said second material for said photons being sufficiently less than the absorption coefficient of said first material for said photons that said first material is etched and said second material substantially is not etched.
Claim 17
Independent Claim
124 words
A method of selectively photochemically dry etching a first semiconductor material of a given composition and direct bandgap Eg 1 in the presence of a second semiconductor material of a different composition and direct bandgap Eg 2 , wherein Eg 2 >Eg 1 , said second semiconductor material substantially not being etched during said method, comprising subjecting both materials to the same photon flux and to the same gaseous etchant under conditions where said etchant would be ineffective for chemical etching were the photons not present, the absorption coefficient of said second material for said photons being sufficiently less than the absorption coefficient of said first material for said photons that said first material is etched and said second material substantially is not etched.
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