Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
202 words
A semiconductor device having a blocking capbility in only one direction, comprisng: an anode; a cathode; a plurality of differently doped layers stacked along a main axis between said anode and said cathode, said doped layers including, a first highly doped p + layer provided aside said anode, a second highly doped n + layer provided aside said cathode, a third layer with a low-level n - doping provided between said first and second layers, a fourth n-doped stopping layer with a doping concentration lying in between the doping concentrations of said second and third layers provided adjoining said third layer on one side, wherein said stopping layer has a thickness S and a number of donor atoms selected so as to satisfy the equation: ##EQU3## with e=elementary charge ε=dielectric constant of the semiconductor material of said device, N D =donor concentration in said stopping layer (in cm -3 ), x=path coordinate of an integration path parallel to said main axis of said device (in cm), k=numerical constant with 0.8≦K≦1.0, E n =electrical field strength at the junction between said third and fourth layers at the breakdown voltage of said device; and a recess provided at the edge of said stopping layer.
Claim 2
Dependent Claim
202 words
A semiconductor device having a blocking capbility in only one direction, comprisng: an anode; a cathode; a plurality of differently doped layers stacked along a main axis between said anode and said cathode, said doped layers including, a first highly doped p + layer provided aside said anode, a second highly doped n + layer provided aside said cathode, a third layer with a low-level n - doping provided between said first and second layers, a fourth n-doped stopping layer with a doping concentration lying in between the doping concentrations of said second and third layers provided adjoining said third layer on one side, wherein said stopping layer has a thickness S and a number of donor atoms selected so as to satisfy the equation: ##EQU3## with e=elementary charge ε=dielectric constant of the semiconductor material of said device, N D =donor concentration in said stopping layer (in cm -3 ), x=path coordinate of an integration path parallel to said main axis of said device (in cm), k=numerical constant with 0.8≦K≦1.0, E n =electrical field strength at the junction between said third and fourth layers at the breakdown voltage of said device; and a recess provided at the edge of said stopping layer.
Claim 3
Dependent Claim
70 words
The semiconductor device as claimed in claim 1, wherein said recess has the following properties: B≧W and S≦T≦W/2, with B=lateral extension of said recess in a region where said stopping layer has been completely removed, W=thickness of the space charge zone of the pn-junction of said device at the breakdown voltage of said device, T=maximum depth of said recess parallel to said main axis measured from the cathode surface plane.
Claim 4
Dependent Claim
68 words
The semiconductor device as claimed in claim 2, wherein: said stopping layer is located between said third and second layers; said second layer is embedded into said stopping layer; between the edge of said second layer and said recess a distance D remains in which said stopping region is retained; and said distance D is equal to or greater than said thickness W of said space charge zone.
Claim 5
Dependent Claim
86 words
The semiconductor device as claimed in claim 2, comprising: said stopping layer located between said third and first layers; a fifth p-doped layer adjoining said third layer on the other side of said third layer; said first layer embedded into said stopping layer; and the donor concentration of said stopping layer increased in a region near said first layer with respect to a region far from said first layer, whereby the donor concentration in said letter region corresponds to the donor concentration of said integral equation.
Claim 6
Dependent Claim
100 words
The semiconductor device as claimed in claim 2, comprising: said stopping layer located between said third and first layers; a fifth p-doped layer adjoining said third layer on the other side of said third layer; said first layer embedded into said stopping layer; and an additional recess provided in an edge region of said stopping layer, said additional recess reducing said thickness S of said stopping layer in the region of the junction of the stopping layer with said third layer to such an extent that said space charge zone extends to a surface at the side of said anode.