Patent US2818226A successfully refreshed from Google Patents.
Patent US4632806A successfully refreshed from Google Patents.
US4632806A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Copper alloy having high resistance to oxidation for use in leads on semiconductor devices
Assignee: Fujitsu Ltd
•
Filing: 1984-12-17
•
Granted: 1986-12-30
•
Expires: 2004-12-17
Abstract
Abstract A Cu alloy having high resistance to oxidation for use in leads on semiconductor devices is disclosed. The alloy consists essentially of 7-15 wt % Mn, 10-30 wt % Zn, 0.2-10 wt % Ni, 0.1-3 wt % Al, with the balance being Cu and incidental impurities. Also disclosed is a Cu alloy clad material wherein the substrate is made of Cu or Cu alloy having high electrical conductivity and good heat dissipation, and the cladding or partial cladding is composed of the Cu alloy having the composition specified above.
Inventors
- 👤 Masaki Morikawa
- 👤 Hideaki Yoshida
- 👤 Kunio Kishida
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 22:04
CPC Classifications
C; C22; C22C; C22C9/00; C22C9/04; B; B32; B32B; B32B15/00; B32B15/01; C22C9/05; Y; Y10; Y10S; Y10S428/00; Y10S428/922; Y10S428/9265; Y10S428/929; Y10T; Y10T428/00; Y10T428/12; Y10T428/12493; Y10T428/12771; Y10T428/12861; Y10T428/12903
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
43 words
A Cu alloy having high resistance to oxidation for use in leads on semiconductor devices, which consists essentially of 7-15% Mn, 10-25.5% Zn, 0.2-10% Ni, 0.1-3% Al, 0.2-3% of Sn, the percentage being by weight, with the balance being Cu and incidental impurities.
Claim 2
Dependent Claim
43 words
A Cu alloy having high resistance to oxidation for use in leads on semiconductor devices, which consists essentially of 7-15% Mn, 10-25.5% Zn, 0.2-10% Ni, 0.1-3% Al, 0.2-3% of Sn, the percentage being by weight, with the balance being Cu and incidental impurities.
Claim 3
Dependent Claim
41 words
The copper alloy having high resistance to oxidation for use in leads on semiconductor devices of claim 1 which also contains at least one of Fe and Co, the total of said Sn, fe and Co being from 0.2 to 3%.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-12-29 | 1990-06-30 | 1990-12-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-12-29 | 1994-06-30 | 1994-12-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-12-29 | 1998-06-30 | 1998-12-30 | $7700.00 | Window Closed / Lapsed |